A test apparatus includes a motherboard including a first surface. The test apparatus further includes a handler including a second surface facing the first surface of the motherboard. The test apparatus additionally includes an adapter board disposed between the first surface of the motherboard and the second surface of the handler. The test apparatus further includes a first sensor mounted on the adapter board and senses data about temperature of the adapter board. The test apparatus additionally includes a wireless transceiver mounted on the adapter board and transmits, in real time, the sensed data.

A test apparatus includes a motherboard including a first surface. The test apparatus further includes a handler including a second surface facing the first surface of the motherboard. The test apparatus additionally includes an adapter board disposed between the first surface of the motherboard and the second surface of the handler. The test apparatus further includes a first sensor mounted on the adapter board and senses data about temperature of the adapter board. The test apparatus additionally includes a wireless transceiver mounted on the adapter board and transmits, in real time, the sensed data.

A valve position sensor is described. The valve position sensor includes a sensor housing for placement on a moving component of a valve. A print circuit board assembly is disposed within the housing. The print circuit board assembly includes one or more micro sensors that includes a magnetometer and a gyroscope. A processing unit performs a calibration routine that associates magnetometer data received from the magnetometer with valve position data received from the gyroscope. The processing unit receives data from the magnetometer and compares the received magnetometer data with the calibration data to determine valve position data relating to an estimate of the valve position. A transmitter wirelessly transmits event data including valve position data to an external receiver.

Various aspects of the disclosure relate to evaluating the electromagnetic impedance characteristics of a material under test (MUT) over a range of frequencies. In particular aspects, a system includes: an electrically non-conducting container sized to hold the MUT, the electrically non-conducting container having a first opening at a first end thereof and a second opening at a second, opposite end thereof; a transmitting electrode assembly at the first end of the electrically non-conducting container, the transmitting electrode assembly having a transmitting electrode with a transmitting surface; and a receiving electrode assembly at the second end of the electrically non-conducting container, the receiving electrode assembly having a receiving electrode with a receiving surface, wherein the receiving electrode is approximately parallel with the transmitting electrode, and wherein the transmitting surface of the transmitting electrode is larger than the receiving surface of the receiving electrode.

A method and apparatus are for monitoring a secondary power device and for accurately checking a state of the secondary power device, and an electronic system includes the apparatus. The method of monitoring a secondary power device includes setting a first reference parameter by using a voltage of at least one capacitor of the secondary power device, setting a second reference parameter by using the voltage of the at least one capacitor and the first reference parameter, and setting a reference level for checking of the state of the secondary power device by using the second reference parameter, wherein the reference level is used in checking of the state of the secondary power device.

A method and apparatus are for monitoring a secondary power device and for accurately checking a state of the secondary power device, and an electronic system includes the apparatus. The method of monitoring a secondary power device includes setting a first reference parameter by using a voltage of at least one capacitor of the secondary power device, setting a second reference parameter by using the voltage of the at least one capacitor and the first reference parameter, and setting a reference level for checking of the state of the secondary power device by using the second reference parameter, wherein the reference level is used in checking of the state of the secondary power device.

A device may determine an analog gain for an aggregated analog signal. The aggregated analog signal may be associated with a calibration test to be used to determine a set of calibration parameters for a load test of a base station. The device may determine the set of calibration parameters for the load test based on an outcome of performing a calibration test. The set of calibration parameters may result in a set of digital gains approximately centered in a digital dynamic gain range. The device may perform the load test after determining the analog gain for the analog signal and based on the set of calibration parameters for the load test.

According to an example aspect of the present invention, there is provided generating, Low-Field-Magnetic Resonance Imaging, LF-MRI, or Ultra-Low-Field Magnetic Resonance Imaging, ULF-MRI, data with respect to an image frame, determining a sensorwise agreement of the data with determined sensitivity profiles, and determining a mapping between the image frame and a sensor frame, such that the sensorwise agreement has been fulfilled.

According to an example aspect of the present invention, there is provided generating, Low-Field-Magnetic Resonance Imaging, LF-MRI, or Ultra-Low-Field Magnetic Resonance Imaging, ULF-MRI, data with respect to an image frame, determining a sensorwise agreement of the data with determined sensitivity profiles, and determining a mapping between the image frame and a sensor frame, such that the sensorwise agreement has been fulfilled.

Provided are a battery management system (BMS) and a battery system capable of accurately measuring a voltage without using a precise resistance element and reducing an error even when operating in a wide temperature range. Since a correction amount for the resistor included in the voltage measurement module is generated using a diagnostic power source configured independently of the battery system, and a voltage of the circuit included in the battery system is measured by applying the generated correction amount, the voltage may be precisely measured without using a high-precision resistance element. Since a changeover switch operates periodically to generate and apply an updated correction amount according to a changing environment, the voltage may be precisely measured even if it is applied to a system in which the environment continuously changes, such as a driving electric vehicle.