The invention relates to an optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The optical assembly according to the invention is characterized in that in addition to a first and a second focusing device, a third focusing device is provided in order to generate a third pupil plane which is optically conjugated to a first pupil plane, a third beam deflecting device is arranged on the third pupil plane in order to deflect the excitation radiation and/or manipulation radiation, a first beam deflecting means is provided between the second focusing device and the second pupil plane and the second pupil plane and the third focusing device in order to deflect the excitation radiation and/or manipulation radiation coming from the third focusing device while bypassing the second beam deflecting device in the direction of the second focusing device, a fourth focusing device is provided for generating a fourth pupil plane which is optically conjugated to the third pupil plane, and a variable second beam deflecting means is arranged on the fourth pupil plane in order to switch an optical beam path between a first beam path and a second beam path. The invention additionally relates to a laser scanning microscope.

An optical system is presented for optically imaging a sample including a nanoscale object. The optical system includes an imaging lens, an illumination source configured to provide an excitation light, a detector and a substrate for supporting the sample. A sample interface, arranged to reflect the excitation light, is formed between the sample and a first side of the substrate facing the sample when the sample is applied on the substrate. The optical imaging system is arranged such that the excitation light is sent into the substrate via the imaging lens and such that the detector receives a reference light and a scattered light. The reference light comprises a part of the excitation light reflected at the sample interface and collected by the imaging lens and the scattered light comprises a part of the excitation light scattered by the nanoscale object and collected by the imaging lens. The optical system is configured such that the nanoscale object is imaged at the detector, in response to the excitation light, by an optical contrast of an interference pattern between the reference light and the scattered light. The substrate comprises an optical coating disposed on the first side of the substrate such that the sample is in contact with the optical coating when the sample is applied on the substrate. A degree of reflection of the excitation light at the sample interface is such that the optical contrast is larger compared to the optical contrast obtained with the sample interface formed without the optical coating.

An optical system for a light-sheet microscope comprises transporting optics configured to project, into a sample, a light sheet for illuminating a sample plane positioned obliquely to an optical axis of the transporting optics and to project the illuminated sample plane into an intermediate image space. The transporting optics comprises an interchanging system that includes a first light-deflection element and a second light-deflection element. The interchanging system is configured to switch an illumination direction along which the light sheet illuminates the sample by alternately introducing the first light-deflection element and the second light-deflection element into a beam path of the transporting optics. The first light-deflection element causes a partial image inversion in only one direction. The second light-deflection element causes a complete image inversion in two directions.

An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.

A confocal scanner (21) according to the present disclosure includes a first pinhole array disk (211a), a second pinhole array disk (211b), a condensing element array disk (212) located between the first pinhole array disk (211a) and the second pinhole array disk (211b), a connecting shaft (213) connecting the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212), and a motor (214) configured, together with the connecting shaft (213), to rotate the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212). The first pinhole array disk (211a) is located at a first focal plane, the second pinhole array disk (211b) is located at a second focal plane, and a diameter of first pinholes and a diameter of second pinholes are different from each other.

A confocal scanner (21) according to the present disclosure includes a first pinhole array disk (211a), a second pinhole array disk (211b), a condensing element array disk (212) located between the first pinhole array disk (211a) and the second pinhole array disk (211b), a connecting shaft (213) connecting the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212), and a motor (214) configured, together with the connecting shaft (213), to rotate the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212). The first pinhole array disk (211a) is located at a first focal plane, the second pinhole array disk (211b) is located at a second focal plane.

Provided herein are systems and methods for imaging using a microscope system comprising removeable or replaceable component parts. Such systems and methods employ semi-kinetic coupling for easy, tool-free attachment of the microscope system to a baseplate. Systems and methods provided herein may comprise simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system.

An automatic focus system for an optical microscope that facilitates faster focusing by using at least two offset focusing cameras. Each offset focusing camera can be positioned on a different side of an image forming conjugate plane so that their sharpness curves intersect at the image forming conjugate plane. Focus of a specimen can be adjusted by using sharpness values determined from images taken by the offset focusing cameras.

Projection of visible, non-treatment light onto an eye to illuminate specific areas of the surgical field is disclosed herein. A surgical system may include a surgical console; a microscope communicatively coupled to the surgical console; a camera communicatively coupled to the surgical console; and a projector operable to project light onto an eye. The projector may be communicatively coupled to the surgical console. A method for light projection may include collecting information from an eye using a camera; determining the light projection based, at least in part, on the collected information; and projecting visible, non-treatment light onto the eye using a projector.

An objective for a microscope includes a displaceable lens group for correcting a spherical aberration. The displaceable lens group is designed in so that an offset of same in the direction perpendicular to the optical axis leads to only a small coma.