Subpixel line scanning. A slide scanning device comprises a plurality of line sensors (112a, 112b, 112c), each comprising a plurality of pixel sensors. Each line sensor is offset from an adjacent line sensor by a fraction of a length of each pixel sensor, and generates a line image of the same field of view at its respective offset. For each of a plurality of positions on a sample, a processor combines the line images of the same field of view, generated by the plurality of line sensors at their respective offsets, to produce a plurality of subpixels for each of at least a subset of pixels within the line images of the same field of view, and generates an up-sampled line image of the position comprising the plurality of subpixels. Then, the processor combines the up-sampled line images of each of the plurality of positions on the sample into an image.

An autofocus device is disclosed, including a focusing lens which is movable. A laser beam passes through the focusing lens toward a focal plane; and a detector collects laser scatter from a nonfocal position outside of the focal plane. The device determines, from the collected laser scatter, the nonfocal position of the scattering source, and moves the focusing lens, based on the determined nonfocal position, such that the scattering source is at an origin of the focal plane.

An object of the present invention is to provide an image processing apparatus, an image processing program, and an image processing method capable of specifying and correcting desired motion. An image processing apparatus includes: global motion estimation means for estimating global motion indicating motion of a specific region containing a specific object in a moving picture from a plurality of frame images contained in the moving picture; local motion estimation means for estimating local motion indicating motion of the specific object in the moving picture from the plurality of frame images; and image correction means for correcting the motion of the specific object or the specific region in the moving picture on the basis of the estimated global motion or the local motion.

Methods and systems for controlling a surgical microscope. Moveable optics of the surgical microscope are controlled using two sets of control parameters, to reduce jitter and image instability. Shifts in the image due to changes in temperature or due to the use of optical filter can also be compensated. Misalignment between the mechanical axis and the optical axis of the surgical microscope can also be corrected.

Light Sheet Theta (LS-0) Microscopy achieves large sample imaging capabilities without affecting the imaging depth or the image quality. An optical layout places a detection objective normal to the sample surface, while placing the illumination objectives that generate light sheets at an angle (theta) significantly smaller than 90 degrees. In this configuration, the light sheets enter from same side of the sample as the detection objective. The intersection of the light-sheet and the detection focal plane results in a line illumination-detection profile that is discriminated by a camera.

A surgical microscope for generating an image of an object region includes an eyepiece and an objective conjointly defining a viewing beam path, an image capturing device and a beam path switching device for out-coupling image information. The switching device is switchable between a first switching state wherein light in the viewing beam path is split into a first component along a first beam path to the eyepiece at an intensity IT1 and a second component along a second beam path to the image capturing device at an intensity IT2 and a second switching state wherein the light in the viewing beam path is deflected into the second beam path to the image capturing device at an intensity IU. The switching device includes a beam splitter movable in and out of the viewing beam path and a deflecting element movable into and out of the viewing beam path.

A confocal scanner mounted on a microscope includes a linear light source configured to emit linear light, a linear detector including a linear detection unit detecting incident light for each line, and a moving mechanism configured to translationally move the linear light source and the linear detector with respect to the microscope. The linear light source and the linear detector are disposed so as to have a positional relationship in which the linear light source and the linear detector correspond to each other within an imaging surface at conjugate positions with respect to a focal plane of the microscope.

Apparatus and methods for measuring infrared absorption of a sample that includes delivering a pulse of infrared radiation to a region of the sample, delivering pulses of radiation of a shorter wavelength than infrared radiation to a sub-region within the region, and using one or more properties of the induced photoacoustic signals to create a signal indicative of infrared absorption of the sub-region of the sample.

A microscope system includes an eyepiece, an objective, a tube lens that is disposed between the eyepiece and the objective, a projection apparatus that projects a projection image onto an image plane on which an optical image is formed by the tube lens, and a processor that performs processes. The processes include performing for digital image data of the sample at least one analysis process selected from a plurality of analysis processes, and generating projection image data representing the projection image on the basis of the analysis result and the at least one analysis process. The projection image data indicates the analysis result in a display format including an image color corresponding to the at least one analysis process. The generating the projection image data includes determining a color for the projection image in accordance with the at least one analysis process selected from the plurality of analysis processes.

Even if a generated wide-field image includes residual local misalignment, this charged particle microscope device can prompt for user input to correct such local misalignment, and can regenerate, on the basis of the user input, a wide-field image that includes little misalignment even in local areas of the overlap regions thereof. A charged particle microscope according to the present invention captures a plurality of images in such a way that each captured image has overlap regions that are to be overlapped with the overlap regions of captured images adjacent to that captured image, wherein an image processing unit: sets a pair of corresponding points in respective overlap regions of each two adjacent captured images; sets predetermined constraint conditions for each captured image; calculates the amounts of misalignment between the plurality of captured images on the basis of the set pairs of corresponding points and the set constraint conditions; connects the plurality of captured images to one another after correcting the misalignment between these captured images on the basis of the calculated amounts of misalignment, thereby generating a single wide-field image; calculates, for each of a plurality of local areas set in the overlap regions of each two adjacent captured images, a degree of reliability for the connection between these captured images; and notifies a user of either each found low reliability local area or the overlap region including that low reliability local area, as well as the set pairs of corresponding points and the set constraint conditions.