An embodiment of the invention relates to a method for carrying out a time-resolved interferometric measurement comprising the steps of generating at least two coherent waves, overlapping said at least two coherent waves and producing an interference pattern, measuring the interference pattern for a given exposure time, thereby forming measured interference values, and analyzing the measured interference values and extracting amplitude and/or phase information from the measured interference values. In at least one time segment, hereinafter referred to as disturbed time segment, of the exposure time, the interference pattern is intentionally disturbed or destroyed such that the corresponding measured interference values describe a disturbed or destroyed interference pattern. In at least one other time segment, hereinafter referred to as undisturbed time segment, of the exposure time, the interference pattern is undisturbed or at least less disturbed compared to the disturbed time segment such that the corresponding measured interference values describe an undisturbed or less disturbed interference pattern. The measured interference values that were measured during the entire given exposure time, are filtered, wherein those interference values that were measured during the at least one disturbed time segment, are reduced, suppressed or discarded. The filtered interference values are analyzed and the amplitude and/or phase information is extracted from the filtered interference values.

Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

Subject positioning systems and methods are provided. A method may include obtaining first information of at least part of a subject when the subject is located at a preset position, and determining, based on the first information, a first position of each of one or more feature points located on the at least part of the subject. The method may include obtaining, using an imaging device, second information of the at least part of the subject when the subject is located at a candidate position. The method may further include determining, based on the second information, a second position of each of the one or more feature points, a first distance between the first position and the second position for each feature point of the one or more feature points, and a target position of the subject based at least in part on the one or more first distances.

A reflection is captured of a subsonic signal reflected by a contact surface. The contact surface is contacting a simulated surface of an object projected from a midair interface (MAI) device. A difference between the subsonic signal and the reflection is converted into a measurement of a flow in the contact surface. When the measurement is in a range of measurements, a change is caused in a temperature of a volume of a medium, the simulated surface being projected in volume of the medium, where the change in the temperature causes a second change in the flow in the contact surface.

An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.

Provided is a radiation phase-contrast imaging device capable of assuredly detecting a self-image and precisely imaging the internal structure of an object. According to the configuration of the present invention, the longitudinal direction of a detection surface of a flat panel detector is inclined with respect to the extending direction of an absorber in a phase grating. This causes variations in the position (phase) of a projected stripe pattern of a self-image at different positions on the detection surface. This is therefore expected to produce the same effects as those obtainable when a plurality of self-images are obtained by performing imaging a plurality of times in such a manner that the position of the projected self-images on the detection surface varies. This alone, however, results in a single self-image phase for a specific region of the object. Therefore, according to the present invention, it is configured such that imaging is performed while changing the relative position of the imaging system and the object.

A method and an x-ray apparatus for interferometric 2D x-ray imaging, use a Talbot-Lau interferometer having at least one phase grating and an analysis grating for producing 2D images of an object to be examined using a phase stepping method. A stepwise readout of a detector is carried out continuously at a multiplicity of the phase positions of an interference pattern. Time sequences of readout interval data records which overlap in time are extracted from the readout data records, and at least one result image data record is calculated from an absorption image and/or a phase-contrast image and/or a dark-field image from each readout interval data record.

An apparatus for producing a hologram of an object includes a light source that emits an incoherent electromagnetic wave toward the object, and a masking device configured to display a mask, receive the incoherent electromagnetic wave emitted toward the object, mask the received incoherent electromagnetic wave according to the displayed mask, and produce a masked electromagnetic wave. The apparatus also includes an image recording device configured to capture an image of the masked electromagnetic wave, and a processing device configured to convert the image of the masked electromagnetic wave into the hologram of the object. A method for producing a hologram of an object is also described.

An apparatus for producing a hologram of an object includes a light source that emits an incoherent electromagnetic wave toward the object, and a masking device configured to display a mask, receive the incoherent electromagnetic wave emitted toward the object, mask the received incoherent electromagnetic wave according to the displayed mask, and produce a masked electromagnetic wave. The apparatus also includes an image recording device configured to capture an image of the masked electromagnetic wave, and a processing device configured to convert the image of the masked electromagnetic wave into the hologram of the object. A method for producing a hologram of an object is also described.