An electronic apparatus includes a storage device having a plurality of memory blocks including a first memory block; and a controller configured to control the storage device to perform a read operation for the first memory block in response to a read request of a host. The controller controls the storage device to perform a refresh operation for the first memory block based on whether there is a difference value between a current pass read voltage and a previous pass read voltage which were applied to the first memory block when performing the read operation, and whether there is a difference between a current erase/write count and a previous erase/write count for the first memory block.

According to certain embodiments, a memory module is operable with a memory controller of a host system. The memory module includes a module controller configurable to receive address and control signals from the memory controller, and dynamic random access memory elements configurable to communicate data signals with the memory controller in accordance with the address and control signals. The module controller has an open-drain output and is configurable to drive the open-drain output with a first signal to indicate a parity error having occurred when the memory module is being accessed for a normal memory read or write operation. The module controller is further configurable to drive the open drain output with a second signal related to one or more training sequences when the memory module performs operations associated with the one or more training sequences and not associated with any normal memory read or write operations.

The subject technology performs the following in a storage system including memory dies, where each memory die includes its own temperature sensor. The subject technology determines a temperature of each of the memory dies based on a temperature reading from each memory die's temperature sensor. The subject technology determines whether data is hot data or cold data, where hot data is more likely to be changed after it is written than cold data. In response to determining that the data is hot data, the subject technology stores the data in a memory die with a relatively higher temperature than another one of the memory dies. Further, in response to determining that the data is cold data, the subject technology stores the data in a memory die with a relatively cooler temperature than another one of the memory dies.

A memory module includes a module board including a first and second data vias configured to transmit first and second data, respectively, through first and second data lines arranged adjacent to each other external to the module board, a plurality of layers including the first and second data vias passing therethrough, and a plurality of semiconductor memory devices arranged on at least one outer surface of the module board. The plurality of layers include first and second layers adjacent to each other. The module board includes a first data via wing extending from the first data via toward the second data via and not connected to the second data via in the first layer, and a seventh data via wing extending from the second data via toward the first data via and not connected to the first data via to overlap the first data via wing in the second layer.

The purposes of the present invention are: to provide a layered semiconductor device capable of improving production yield; and to provide a method for producing said layered semiconductor device. This layered semiconductor device has, layered therein, a plurality of semiconductor chips, a reserve semiconductor chip which is used as a reserve for the semiconductor chips, and a control chip for controlling the operating states of the plurality of semiconductor chips and the operating state of the reserve semiconductor chip. In such a configuration, the semiconductor chips and the reserve semiconductor chip include contactless communication units and operating switches. The semiconductor chips and the reserve semiconductor chip are capable of contactlessly communicating with another of the semiconductor chips via the contactless communication units. The control chip controls the operating states of the semiconductor chips by switching the operating switches of the semiconductor chips, and controls the operating state of the reserve semiconductor chip by switching the operating switch of the reserve semiconductor chip.

The purposes of the present invention are: to provide a layered semiconductor device capable of improving production yield; and to provide a method for producing said layered semiconductor device. This layered semiconductor device has, layered therein, a plurality of semiconductor chips, a reserve semiconductor chip which is used as a reserve for the semiconductor chips, and a control chip for controlling the operating states of the plurality of semiconductor chips and the operating state of the reserve semiconductor chip. In such a configuration, the semiconductor chips and the reserve semiconductor chip include contactless communication units and operating switches. The semiconductor chips and the reserve semiconductor chip are capable of contactlessly communicating with another of the semiconductor chips via the contactless communication units. The control chip controls the operating states of the semiconductor chips by switching the operating switches of the semiconductor chips, and controls the operating state of the reserve semiconductor chip by switching the operating switch of the reserve semiconductor chip.

A memory system includes a memory device including plural memory blocks divided into a system region, a user data region and a reserved region. The system region includes a first block storing original firmware and a second block storing copied firmware, and the reserved region includes a dedicated test block having an operational characteristic that substantially the same as that of the second block. The memory system includes a controller configured to access the dedicated test block for determining a status of the second block based on an operation state of the dedicated test block, and to update both the dedicated test block and the second block based on the status of the second block.

A load control device may include a semiconductor switch, a control circuit, and first and second terminals adapted to be coupled to a remote device. The load control device may include a first switching circuit coupled to the second terminal, and a second switching circuit coupled between the first terminal and the second terminal. The control circuit may be configured to render the first switching circuit conductive to conduct a charging current from an AC power source to a power supply of the remote device during a first time period of a half-cycle of the AC power source, and further configured to render the first and second switching circuits conductive and non-conductive to communicate with the remote device via the second terminal during a second time period of the half-cycle of the AC power source.

A memory array comprising a word line and a bit line is disclosed. Each of a plurality of memory cells of the memory array has a first terminal connected to the bit line and a current path between the first terminal and a respective second terminal. A first memory cell of the plurality of memory cells has the second terminal coupled to receive a first supply voltage when selected by the word line. A second memory cell of the plurality of memory cells has the second terminal coupled to receive a voltage different from the first supply voltage when the first memory cell is selected by the word line.

According to certain aspects, a memory subsystem is coupled to a memory controller of a host computer system via an interface. The memory subsystem comprises dynamic random access memory elements and a memory subsystem controller. During a normal memory read or write operation, the memory subsystem controller is configured to receive address and command signals associated with the memory read or write operations and to control the dynamic random access memory elements in accordance with the address and command signals. The memory subsystem controller is further configured to output via the open drain output a parity error signal in response to a parity error having occurred during the memory read or write operation. During an initialization operation, the memory subsystem controller is configured to output via the open train output a signal related to one or more parts of initialization operation sequences.