A magnetic memory includes a first spin-orbital-transfer-spin-torque-transfer (SOT-STT) hybrid magnetic device disposed over a substrate, a second SOT-STT hybrid magnetic device disposed over the substrate, and a SOT conductive layer connected to the first and second SOT-STT hybrid magnetic devices. Each of the first and second SOT-STT hybrid magnetic devices includes a first magnetic layer, as a magnetic free layer, a spacer layer disposed under the first magnetic layer, and a second magnetic layer, as a magnetic reference layer, disposed under the spacer layer. The SOT conductive layer is disposed over the first magnetic layer of each of the first and second SOT-STT hybrid magnetic devices.

A decoding method, a memory storage device and a memory control circuit unit are provided. The method includes: reading data from a plurality of first memory cells of a rewritable non-volatile memory module; estimating an error bit occurrence rate of the data before performing a first decoding process on the data; and performing the first decoding process on the data by using a first decoding parameter according to the estimated error bit occurrence rate, wherein the first decoding parameter corresponds to a strict level for locating an error bit in the first decoding process. As a result, a decoding efficiency of the memory storage device can be improved.

A decoding method, a memory storage device and a memory control circuit unit are provided. The method includes: reading data from a plurality of first memory cells of a rewritable non-volatile memory module; estimating an error bit occurrence rate of the data before performing a first decoding process on the data; and performing the first decoding process on the data by using a first decoding parameter according to the estimated error bit occurrence rate, wherein the first decoding parameter corresponds to a strict level for locating an error bit in the first decoding process. As a result, a decoding efficiency of the memory storage device can be improved.

Provided are an accelerator controlling a memory device, a computing system including the accelerator, and an operating method of the accelerator. The accelerator includes: a signal control/monitoring circuit configured to detect an entry to a self-refresh mode of a memory device and an exit from the self-refresh mode based on monitoring a signal provided from a host; an accelerator logic configured to generate a first command/address signal and a first piece of data; and a selector configured to output the first command/address signal and the first piece of data to the memory device based on detection of the entry to the self-refresh mode, and output a second command/address signal and a second piece of data provided from the host, to the memory device, based on detection of the exit from the self-refresh mode.

In one embodiment, an apparatus comprises a storage device comprising a NAND flash memory array, the storage device to program, during a first programming pass, a plurality of cells of a first wordline of the NAND flash memory array to store a first page of data; initiate a read of the first page of data prior to completion of loading of a second page of data to be programmed during a second programming pass; and program, during the second programming pass, the plurality of cells of the first wordline of the NAND flash memory array to store the first page of data and the second page of data.

A memory device may include: a plurality of cell mats arranged in a plurality of rows and columns; a plurality of first drivers, each first driver being disposed on a left side of a corresponding cell mat of the plurality of cell mats and configured to drive a first sub-word line of the corresponding cell mat; and a plurality of second drivers, each second driver being disposed on a right side of the corresponding cell mat of the plurality of cell mats and configured to drive a second sub-word line of the corresponding cell mat, wherein, during an active operation, among the plurality of cell mats, sub-word lines of cell mats disposed in odd-numbered columns or sub-word lines of cell mats disposed in even-numbered columns are selectively activated.

A method for trimming analog temperature sensors. First, raise a temperature of a temperature sensor to a highest temperature of a qualification temperature range. Then, trim the temperature sensor such that a high temperature code generated by the temperature sensor represents an actual temperature reported by the temperature sensor at the highest temperature. Next, lower the temperature of the temperature sensor to a lowest temperature of the qualification temperature range. Determine a slope error between the high temperature code and a low temperature code generated by the temperature sensor at the lowest temperature. Finally, determine a correction function that compensates for the slope error of measured temperature codes generated by the temperature sensor for temperatures across the qualification temperature range.

Arrays of memory cells might include a data line, a source, a plurality of pass gates connected in series between the data line and the source, a plurality of unit column structures each having a respective plurality of series-connected non-volatile memory cells connected in series with a respective plurality of series-connected field-effect transistors, wherein a channel of each non-volatile memory cell of its respective plurality of series-connected non-volatile memory cells and a channel of each field-effect transistor of its respective plurality of series-connected field-effect transistors are selectively connected to one another, and a plurality of backside gate lines each connected to the second control gate of a respective pass gate of the plurality of pass gates, wherein, for each unit column structure of the plurality of unit column structures, the channel of a particular field-effect transistor of its respective plurality of field-effect transistors is capacitively coupled to the first channel of a respective pass gate of the plurality of pass gates.

The present disclosure includes apparatuses and methods related to performing logical operations using sensing circuitry. An example apparatus comprises an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier coupled to a pair of complementary sense lines, and a compute component coupled to the sense amplifier. The compute component includes a dynamic latch. The sensing circuitry is configured to perform a logical operation and initially store the result in the sense amplifier.

The present disclosure includes apparatuses and methods related to performing logical operations using sensing circuitry. An example apparatus comprises an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier coupled to a pair of complementary sense lines, and a compute component coupled to the sense amplifier. The compute component includes a dynamic latch. The sensing circuitry is configured to perform a logical operation and initially store the result in the sense amplifier.