Provided herein is a semiconductor memory device and an operating method thereof. The semiconductor memory device may include a memory cell array, a peripheral circuit, and a control logic. The memory cell array may include a plurality of memory blocks. The peripheral circuit may perform a program operation or read operation on a selected memory block of the memory cell array. The control logic may select between a first program method and a second program method depending on program mode information for the selected memory block, and may control the peripheral circuit to perform the program operation on the selected memory block using the selected program method.

A method of improving an error checking and correction performance of a memory includes replacing a defective column including a defective memory cell of the memory cell array with a spare column of a the spare cell array, wherein the memory cell array includes memory cells in a matrix and the spare cell array includes spare memory cells in a matrix to be replaced for defective memory cells; storing check bits of error correction code in at least one memory cell of the defective column; storing defect information regarding a defect of the defective memory cell; determining whether the at least one memory cell storing the check bits is to be used to perform error checking and correction on a memory, based on the defect information; and performing error checking and correction on the memory using a memory cell selected based on a result of determining whether the at least one memory cell storing the check bits is to be used.

The present invention relates to a semiconductor device capable of providing extensibility in the entry direction and bit direction of a search table. The semiconductor device includes: a block search circuit that searches each of a plurality of block tables into which a search table, which is configured in the entry direction and in the bit direction, is divided in the entry direction and in the bit direction; a circuit that combines the search results of the block search circuits in the bit direction; and a control circuit that inputs a search key as well as the outputs of the combining circuits, and outputs hit information.

In view of the neural network information parallel processing, a digital perceptron device analogous to the build-in neural network hardware systems for parallel processing digital signals directly by the processor's memory content and memory perception in one feed-forward step is disclosed. The digital perceptron device of the invention applies the configurable content and perceptive non-volatile memory arrays as the memory processor hardware. The input digital signals are then broadcasted into the non-volatile content memory array for a match to output the digital signals from the perceptive non-volatile memory array as the content-perceptive digital perceptron device.

In view of the neural network information parallel processing, a digital perceptron device analogous to the build-in neural network hardware systems for parallel processing digital signals directly by the processor's memory content and memory perception in one feed-forward step is disclosed. The digital perceptron device of the invention applies the configurable content and perceptive non-volatile memory arrays as the memory processor hardware. The input digital signals are then broadcasted into the non-volatile content memory array for a match to output the digital signals from the perceptive non-volatile memory array as the content-perceptive digital perceptron device.

A memory device includes a controller circuit, a first stage circuit, and a second stage circuit. The controller circuit outputs a first global pre-charge control signal, a second global pre-charge control signal, and a first local pre-charge control signal. The first stage circuit pre-charges a first global match line according to the first global pre-charge control signal, and to compare search data with first data, in order to determine whether to adjust a first level of the first global match line. The second stage circuit selectively pre-charges a second global match line according to the first level and the second global pre-charge control signal, and determines whether to compare the search data with second data according to a second level of the second global match line and the first local pre-charge control signal, in order to adjust the second level.

A memory device includes a controller circuit, a first stage circuit, and a second stage circuit. The controller circuit outputs a first global pre-charge control signal, a second global pre-charge control signal, and a first local pre-charge control signal. The first stage circuit pre-charges a first global match line according to the first global pre-charge control signal, and to compare search data with first data, in order to determine whether to adjust a first level of the first global match line. The second stage circuit selectively pre-charges a second global match line according to the first level and the second global pre-charge control signal, and determines whether to compare the search data with second data according to a second level of the second global match line and the first local pre-charge control signal, in order to adjust the second level.

An NFA hardware engine includes a pipeline and a controller. The pipeline includes a plurality of stages, where one of the stages includes a transition table. Both a first automaton and a second automaton are encoded in the same transition table. The controller receives NFA engine commands onto the NFA engine and controls the pipeline in response to the NFA engine commands.

An NFA hardware engine includes a pipeline and a controller. The pipeline includes a plurality of stages, where one of the stages includes a transition table. Both a first automaton and a second automaton are encoded in the same transition table. The controller receives NFA engine commands onto the NFA engine and controls the pipeline in response to the NFA engine commands.

A memory device has first and second strings of memory cells coupled to a data line. The first string is for storing a first bit having a first bit significance, and the second string is for storing a second bit having a second bit significance different than the first bit significance. A first resistor is coupled in series with the first string. A second resistor is coupled in series with the second string. The memory device is configured to set the first resistor to a first resistance based on the first bit significance and the second resistor to a second resistance based on the second bit significance so that the second resistance is different than the first resistance. The memory device is configured to compare a first bit of input data to the first bit and to compare a second bit of the input data to the second bit.