H03K19/00

Transceiver performing internal loopback test and operation method thereof

Disclosed is a transceiver which includes a logic circuit that generates parallel transmission data in response to a first test mode signal or a second test mode signal, a serializer that converts the parallel transmission data into serial transmission data, a driver that outputs the serial transmission data through transmission pads, an analog circuit that receives serial reception data through reception pads, a deserializer that converts the serial reception data into parallel reception data, a plurality of test switches switched in response to the first test mode signal, and a test circuit that is electrically connected to the analog circuit through the plurality of test switches and outputs serial post data corresponding to the serial transmission data to the analog circuit.

APPARATUS FOR TRANSMITTING AND RECEIVING A SIGNAL, A METHOD OF OPERATING THE SAME, A MEMORY DEVICE, AND A METHOD OF OPERATING THE MEMORY DEVICE

A signal transmitting and receiving apparatus including: a first on-die termination circuit connected to a first pin through which a first signal is transmitted or received and, when enabled, the first on-die termination circuit is configured to provide a first termination resistance to a signal line connected to the first pin; a second on-die termination circuit connected to a second pin through which a second signal is transmitted or received and, when enabled, the second on-die termination circuit is configured to provide a second termination resistance to a signal line connected to the second pin; and an on-die termination control circuit configured to independently control an enable time and a disable time of each of the first on-die termination circuit and the second on-die termination circuit.

Termination calibration scheme using a current mirror

Systems, apparatuses, and methods for conveying and receiving information as electrical signals in a computing system are disclosed. A computing system includes multiple transmitters sending singled-ended data signals to multiple receivers. A termination voltage is generated and sent to the multiple receivers. The termination voltage is coupled to each of signal termination circuitry and signal sampling circuitry within each of the multiple receivers. Any change in the termination voltage affects the termination circuitry and affects comparisons performed by the sampling circuitry. Received signals are reconstructed at the receivers using the received signals, the signal termination circuitry and the signal sampling circuitry.

Switching driver circuitry
11469753 · 2022-10-11 · ·

A switching driver circuit may have an output stage having an output switch connected between a switching voltage node and an output node. A switch network may control a switching voltage at the switching voltage node so that in one mode the switching voltage node is coupled to a positive voltage and in another mode the switching voltage node is coupled to ground voltage via a first switching path of the switch network. The circuit may also include an n-well switching block operable to, when the first switching voltage node is coupled to a positive voltage, connect the n-well of the first output switch to the switching voltage node, and, when the first switching voltage node is coupled to the ground voltage, connect the n-well of the first output switch to a first ground which is separate to the first switching voltage node and independent of the first switching path.

SST driving circuit, chip and driving output method
11626725 · 2023-04-11 · ·

The present disclosure provides an SST driving circuit, a chip, and a driving output method. The SST driving circuit includes: a signal driver for driving and outputting a signal to be driven, the signal driver including termination resistors; a first electrostatic current discharge module, providing first discharge paths for electrostatic currents generated in the signal driver; a second electrostatic current discharge module, connected in series with the termination resistors, providing second discharge paths for the electrostatic currents; and a power clamp, used for conducting the power clamp circuit, the first discharge paths and the second discharge paths when a power supply voltage of the signal driver exceeds a clamping voltage. The present disclosure provides different discharge paths, which effectively reduces voltage borne by a protected device through a voltage division method, and improves the device's ability to protect against electrostatic discharge.

Off chip driver circuit, off chip driver system, and method for operating an off chip driver circuit
11626873 · 2023-04-11 · ·

An off chip driver circuit includes a pull-up circuit and a pull-down circuit. The pull-up circuit includes several first transistors and a first resistance circuit coupled between the first transistors and a input/output pad. The first transistors generate a first voltage to the first resistance circuit. The first resistance circuit transmits, in response to a first control signal, the first voltage to the input/output pad and to have a variable resistance according to the first control signal. The pull-down circuit includes several second transistors and a second resistance circuit coupled between the second transistors and the input/output pad. The second transistors generate a second voltage to the second resistance circuit. The second resistance circuit transmits, in response to a second control signal, the second voltage to the input/output pad and to have a variable resistance according to the second control signal.

Comparator circuit with dynamic biasing

A comparator circuit with dynamic biasing comprises a comparator, first dynamic biasing generator, first extra biasing device, second dynamic biasing generator, and second extra biasing device. The comparator includes a biasing circuit, input stage, active loads, and output terminal. The input stage has a first input terminal, second input terminal, first current path, and second current path. The comparator is configured to output an output signal at the output terminal according to the first input signal and second input signal. The first dynamic biasing generator is coupled between a first detection node and the first extra biasing device coupled to the biasing circuit. The second dynamic biasing generator is coupled between a second detection node and the second extra biasing device coupled to the biasing circuit. The first and second detection nodes are between the input stage and the active loads.

NEGATIVE VOLTAGE LEVEL CONVERSION CONTROL CIRCUIT AND METHOD

A negative voltage level conversion control circuit comprises a negative voltage generation circuit, a bias circuit, and a level shift unit circuit, wherein an output end of the bias circuit is connected to the level shift unit circuit, and the other end of the bias circuit is connected to the negative voltage generation circuit; an output end of the negative voltage generation circuit is connected to the level shift unit circuit; the bias circuit is configured to receive an enable signal and output a bias voltage; the bias voltage is used for controlling a switching process of the level shift unit circuit; the enable signal is used for enabling the bias circuit and the negative voltage generation circuit.

Cell of transmission gate free circuit and integrated circuit layout including the same

A semiconductor standard cell of a flip-flop circuit includes semiconductor fins extending substantially parallel to each other along a first direction, electrically conductive wirings disposed on a first level and extending substantially parallel to each other along the first direction, and gate electrode layers extending substantially parallel to a second direction substantially perpendicular to the first direction and formed on a second level different from the first level. The flip-flop circuit includes transistors made of the semiconductor fins and the gate electrode layers, receives a data input signal, stores the data input signal, and outputs a data output signal indicative of the stored data in response to a clock signal, the clock signal is the only clock signal received by the semiconductor standard cell, and the data input signal, the clock signal, and the data output signal are transmitted among the transistors through at least the electrically conductive wirings.

ZQ RESISTOR CALIBRATION CIRCUIT IN MEMORY DEVICE AND CALIBRATION METHOD THEREOF

In certain aspects, a circuit for ZQ resistor calibration can include a first input configured to receive a first default configuration. The circuit can also include a second input configured to receive a first calibration value based on a first comparison. The circuit can further include a first output configured to provide a first resistor code for a first resistor category. The circuit can additionally include a second output configured to provide a second resistor code for a second resistor category different from the first resistor category. The circuit can also include a first logic circuit configured to receive a signal from the first input and a signal from the second input, and provide a signal to the first output. The signal to the first output can include the first resistor code. The first resistor code can be different from the second resistor code.