H03L1/00

DEVICE, METHOD AND SYSTEM TO DETERMINE CALIBRATION INFORMATION WITH A SHARED RING OSCILLATOR CIRCUIT
20230088853 · 2023-03-23 · ·

Techniques and mechanisms for determining calibration information based on tuning of a ring oscillator circuit formed with two integrated circuit (IC) dies. In an embodiment, an oscillator circuit comprises an in-series arrangement of delay circuits including a first one or more delay circuits of a first die, and a second one or more delay circuits of a second die. Respective circuitry of the first die and the second die performs tuning to match an oscillation frequency of the oscillator circuit with a reference frequency. An operational setting of the tuned oscillator circuit is provided to calibrate transmitter circuitry of the first die and the second die. In another embodiment, tuning of the oscillator circuit is further based on tuning of a local oscillator circuit of one of the first die or the second die.

Wireline transceiver with internal and external clock generation

An integrated circuit device, having functional circuitry driven by a clock signal, includes a first clock path for accepting an external clock signal where the first clock path includes first biasing circuitry configured to controllably pass the external clock signal, a second clock path for accepting an external frequency reference signal where the second clock path includes internal clock generation circuitry configured to generate an internal clock signal from the external frequency reference signal and second biasing circuitry configured to controllably pass the external frequency reference signal to the internal clock generation circuitry, and selector circuitry configured to select, based on user input, a clock output to drive the functional circuitry of the integrated circuit device. The clock output is selected from between (i) an output of the first clock path, and (ii) an output of the second clock path.

Power supply for voltage controlled oscillators with automatic gain control
11606096 · 2023-03-14 · ·

The disclosure relates to technology for power supply for a voltage controller oscillator (VCO). A peak detector circuit determines the amplitude of the output for the VCO, which is compared to a reference value in an automatic gain control loop. An input voltage for the VCO is determined based on a difference between the reference value and the output of the peak detector circuit. The peak detector circuit can be implemented using parasitic bipolar devices in an integrated circuit formed in a CMOS process.

Radiation hardened by design CMOS crystal oscillator for readout telemetry

A clock source includes a comparator having a positive comparator input, a negative comparator input, a proportional to absolute temperature (PTAT) PMOS bias input, a PTAT NMOS bias input, and a comparator output, a resonator element, series and feedback resistors and other passive components coupled between the comparator output and the negative comparator input to generate a signal with approximately constant gain and frequency at the comparator output, and a PTAT bias circuit coupled to the comparator's PTAT PMOS and NMOS bias inputs, and configured to drive the PTAT PMOS bias input and the PTAT NMOS bias input to maintain approximately constant gain and frequency over the operating temperature range of the clock source.

Radiation hardened by design CMOS crystal oscillator for readout telemetry

A clock source includes a comparator having a positive comparator input, a negative comparator input, a proportional to absolute temperature (PTAT) PMOS bias input, a PTAT NMOS bias input, and a comparator output, a resonator element, series and feedback resistors and other passive components coupled between the comparator output and the negative comparator input to generate a signal with approximately constant gain and frequency at the comparator output, and a PTAT bias circuit coupled to the comparator's PTAT PMOS and NMOS bias inputs, and configured to drive the PTAT PMOS bias input and the PTAT NMOS bias input to maintain approximately constant gain and frequency over the operating temperature range of the clock source.

Circuit device and oscillator
11664765 · 2023-05-30 · ·

A circuit device includes an oscillation circuit configured to generate an oscillation signal, a first pre-driver disposed in a posterior stage of the oscillation circuit, a first output driver disposed in a posterior stage of the first pre-driver, a first regulator configured to supply a first regulated voltage to the first pre-driver, and a second regulator configured to supply a second regulated voltage to the first output driver, wherein the second regulator is shorter in transient response time than the first regulator.

Circuit device and oscillator
11664765 · 2023-05-30 · ·

A circuit device includes an oscillation circuit configured to generate an oscillation signal, a first pre-driver disposed in a posterior stage of the oscillation circuit, a first output driver disposed in a posterior stage of the first pre-driver, a first regulator configured to supply a first regulated voltage to the first pre-driver, and a second regulator configured to supply a second regulated voltage to the first output driver, wherein the second regulator is shorter in transient response time than the first regulator.

Slow-clock calibration method and unit, clock circuit, and mobile communication terminal

A slow-clock calibration method, a slow-clock calibration unit, a clock circuit and a mobile communication terminal are provided. The calibration method includes: obtaining a current temperature of the crystal; searching a unique frequency-divide coefficient corresponding to the current temperature from a preset data base; if the coefficient is found in the data base, inputting the unique coefficient into a frequency divider; if the coefficient is not found in the data base, obtaining an actual sleep length of the mobile communication terminal, if the actual sleep length is not equal to a required sleep length, calculating a required frequency-divide coefficient and updating the data base with the required frequency-divide coefficient, and if the actual sleep length of the mobile communication terminal is equal to the required sleep length, updating the data base with a current frequency-divide coefficient. Accordingly, slow-clock calibration is realized with reduced crystal costs.

BIASED IMPEDANCE CIRCUIT, IMPEDANCE ADJUSTMENT CIRCUIT, AND ASSOCIATED SIGNAL GENERATOR
20170346464 · 2017-11-30 ·

A biased impedance circuit, an impedance adjustment circuit, and an associated signal generator are provided. The biased impedance circuit is coupled to a summation node and applies a biased impedance to the summation node. A periodic input signal is received at the summation node. The biased impedance circuit includes a switching circuit for receiving an output window signal, wherein a period of the output window signal is shorter than a period of the periodic input signal. The switching circuit includes a low impedance path and a high impedance path. The low impedance sets the biased impedance to a first impedance when the output window signal is at a first voltage level. The high impedance path sets the biased impedance to a second impedance when the output window signal is at a second voltage level. The first impedance is less than the second impedance.

CIRCUIT DEVICE, OSCILLATOR, ELECTRONIC APPARATUS, AND VEHICLE
20170310326 · 2017-10-26 · ·

A circuit device includes a phase comparator that performs phase comparison between an input signal based on an oscillation signal and a reference signal, a processor that performs a digital signal process on phase comparison result data which is a result of the phase comparison so as to generate frequency control data, and an oscillation signal generation circuit that generates the oscillation signal having an oscillation frequency which is set on the basis of the frequency control data. The processor performs the digital signal process by using data used when a hold-over state is ended in a case where the hold-over state occurs due to the absence or the abnormality of the reference signal, and then the hold-over state is ended.