Patent classifications
H03L7/00
METHODS AND SYSTEMS FOR CALIBRATING CLOCK SKEW IN A RECEIVER
Methods and systems for calibrating clock skew in a SerDes receiver. A method includes detecting a skew in a clock with respect to an edge of a reference clock, based on a value sampled by the clock and a value sampled by the reference clock at an edge of a data pattern, for a first Phase Interpolator (PI) code; determining a count of the skew from a de-serialized data word including outcome values obtained based on values sampled by the clock and values sampled by the reference clock at a predefined number of edges of the data pattern; obtaining a skew calibration code corresponding to the first PI code, from a binary variable obtained by accumulating an encoded variable to a previously generated binary variable; and calibrating the skew by performing a positive phase shift or a negative phase shift to the clock based on the skew calibration code.
Method for resetting an electronic device having independent device domains
A reset state control circuit adapted to reset independent device domains of an electronic device, said reset state control circuit comprising a capturing unit adapted to capture reset events; and a reset shaping logic adapted to change dynamically a reset control flow to reset device domains of said electronic device depending on a sequence of the reset events captured by said capturing unit.
Systems for and methods of fractional frequency division
Systems and methods provide a fractional signal from a delta sigma modulator to a summer, a combination of an integer value and the fractional signal to a divider, and a divided clock signal from the divider in response to the combination and the input clock signal. The systems and methods also delay the divided clock signal in response to a truncation phase error and gain calibration factor from a calibration unit to provide an output clock signal having equal periods.
METHODS AND APPARATUS FOR GENERATING A HIGH SWING IN AN OSCILLATOR
Methods and apparatus are disclosed to generate an oscillating output signal having a voltage swing greater than a voltage swing across nodes of active devices. An example oscillator includes a tank to generate an oscillating output signal in response receiving an edge of an enable signal; a feedback generator including a first gain stage forming a first feedback loop with the tank, the first feedback loop providing a first charge to maintain the oscillating output signal and a second gain stage forming a second feedback loop with the tank, the second feedback loop providing a second charge to maintain the oscillating output signal, the first and second charges combining with the oscillating output signal to generate a high voltage swing; and an attenuator connected between the tank and the feedback generator to isolate the tank from active components of the feedback generator.
METHODS AND APPARATUS FOR GENERATING A HIGH SWING IN AN OSCILLATOR
Methods and apparatus are disclosed to generate an oscillating output signal having a voltage swing greater than a voltage swing across nodes of active devices. An example oscillator includes a tank to generate an oscillating output signal in response receiving an edge of an enable signal; a feedback generator including a first gain stage forming a first feedback loop with the tank, the first feedback loop providing a first charge to maintain the oscillating output signal and a second gain stage forming a second feedback loop with the tank, the second feedback loop providing a second charge to maintain the oscillating output signal, the first and second charges combining with the oscillating output signal to generate a high voltage swing; and an attenuator connected between the tank and the feedback generator to isolate the tank from active components of the feedback generator.
TEST CIRCUIT TO ISOLATE HCI DEGRADATION
Embodiments are directed to a system for synchronizing switching events. The system includes a controller, a clock generator communicatively coupled to the controller and a delay chain communicatively coupled to the controller. The delay chain is configured to perform a plurality of delay chain switching events in response to an input to the delay chain. The controller is configured to initiate a synchronization phase that includes enabling the clock generator to provide as an input to the delay chain a clock generator output at a synchronization frequency, wherein the clock generator output passing through the delay chain synchronizes the plurality of delay chain switching events to occur at the synchronization frequency resulting in a frequency of an output of the delay chain being synchronized to the synchronization frequency of the clock generator output.
TEST CIRCUIT TO ISOLATE HCI DEGRADATION
Embodiments are directed to a system for synchronizing switching events. The system includes a controller, a clock generator communicatively coupled to the controller and a delay chain communicatively coupled to the controller. The delay chain is configured to perform a plurality of delay chain switching events in response to an input to the delay chain. The controller is configured to initiate a synchronization phase that includes enabling the clock generator to provide as an input to the delay chain a clock generator output at a synchronization frequency, wherein the clock generator output passing through the delay chain synchronizes the plurality of delay chain switching events to occur at the synchronization frequency resulting in a frequency of an output of the delay chain being synchronized to the synchronization frequency of the clock generator output.
Semiconductor Device and Method
A circuit includes a first digital controlled oscillator and a second digital controlled oscillator coupled to the first digital controlled oscillator. A skew detector is connected to determine a skew between outputs of the first digital controlled oscillator and the second digital controlled oscillator, and a decoder is utilized to output a control signal, based on the skew, to modify a frequency of the first digital controlled oscillator using a switched capacitor array to reduce or eliminate the skew. A differential pulse injection oscillator circuit and a pulse injection signal generator circuit are also provided,
Semiconductor Device and Method
A circuit includes a first digital controlled oscillator and a second digital controlled oscillator coupled to the first digital controlled oscillator. A skew detector is connected to determine a skew between outputs of the first digital controlled oscillator and the second digital controlled oscillator, and a decoder is utilized to output a control signal, based on the skew, to modify a frequency of the first digital controlled oscillator using a switched capacitor array to reduce or eliminate the skew. A differential pulse injection oscillator circuit and a pulse injection signal generator circuit are also provided,
RC time based locked voltage controlled oscillator
Circuits and processes for locking a voltage-controlled oscillator (VCO) at a high frequency signal are described. A circuit may include an adjustable current converter (ACC), coupled at an input terminal to a power source, operable to output a control signal (VC) at an output terminal. A first switch may be coupled to the ACC and to the VCO. The VCO, when in an “ON” state, receives the control signal and outputs a high frequency signal (VHF). A digital filter may be coupled to the VCO and operable to receive the VHF. Based on the VHF, the digital filter generates a data signal having a data value. The circuit may also include a digital-to-analog converter (DAC) operable to receive the data signal and, based on the data value, output an adjustment signal to the ACC. The ACC may adjust the control signal based on the adjustment signal received from the DAC.