A method for testing an analog-to-digital converter unit, which is equipped to convert an analog input signal into a digital output signal with the aid of delta-sigma modulation. The method includes: generating an analog input signal; applying a predefined interference signal to the analog input signal and storing the resulting digital output signal as test result; determining that a fault is present if a transfer function of the analog-to-digital converter unit, which is ascertained from the test result and the input signal, has a deviation from a predefined target transfer function that is greater than a predefined reference value, a fault signal being output if a fault is determined.

It is described a voltage regulator device (100), comprising: i) a power device (150), configured to receive an input signal (151) and to produce a corresponding output signal (152); ii) a comparator device (110), coupled via a feedback path (140) to the power device (150), and configured to receive the output signal (152) as a feedback signal (141), and to produce a compared feedback signal (112); and iii) a digital modulation device (120), arranged between the comparator device (110) and the power device (150), and configured to digitally modulate the compared feedback signal (112), and to provide the digitally modulated signal (121) to the power device (150), wherein the digital modulation device (120) comprises: iiia) a delta-sigma (122), iiib) a quantizer (124), and iiic) a feedforward path (128), configured to feedforward the compared feedback signal (112) beyond the delta-sigma (122).

A method of applying digital pre-distortion includes: outputting, by a look-up table, a first table value based on an input digital signal; adding the first table value and the input digital signal to generate a first combined signal comprising a first combined value having a first integer coefficient and a first fractional coefficient; separating the first integer coefficient from the first fractional coefficient to generate a first integer signal representing the first integer coefficient and a first fractional signal representing the first fractional coefficient; generating a delta-sigma modulated signal based on the first fractional signal; converting, by a first digital-to-analog, a first digital signal into a first analog signal, wherein the first digital signal is representative of the first integer signal; and converting, by a second DAC, a second digital signal into a second analog signal, wherein the second digital signal is representative of the delta-sigma modulated signal.

A computer-implemented method, according to one embodiment, includes: causing a multi-bit input to be split into two or more chunks, where each of the two or more chunks include at least one individual bit. Each of the two or more chunks are also converted into a respective pulse width modulated signal, and a partial result is generated in digital form for each of the respective pulse width modulated signals. Each of the partial results are scaled by a respective significance factor corresponding to each of the two or more chunks, and the scaled partial results are also accumulated.

A capacitance to digital converter, CDC, has a first and a second reference terminal for receiving first and second reference voltages, a reference block comprising one or more reference charge stores and being coupled to the first and second reference terminals via a first switching block, a scaling block for providing at third and fourth reference terminals downscaled voltages from the first and second reference voltages depending on a scaling factor, first and second measurement terminals for connecting a capacitive sensor element, the first measurement terminal being coupled to the third and fourth reference terminals via a second switching block, and a processing block coupled to the reference block and to the second measurement terminal and being configured to determine a digital output signal based on a charge distribution between the sensor element and the reference block and based on the scaling factor, the output signal representing a capacitance value of the sensor element.

Analog-to-digital converters (ADCs) can be used inside ADC architectures, such as delta-sigma ADCs. The error in such internal ADCs can degrade performance. To calibrate the errors in an internal ADC, comparator offsets of the internal ADC can be estimated by computing a mean of each comparator of the internal ADC. Relative differences in the computed means serves as estimates for comparator offsets. If signal paths in the internal ADC are shuffled, the estimation of comparator offsets can be performed in the background without interrupting normal operation. Shuffling of signal paths may introduce systematic measurement errors, which can be measured and reversed to improve the estimation of comparator offsets.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

Systems and methods provide a fractional signal from a delta sigma modulator to a summer, a combination of an integer value and the fractional signal to a divider, and a divided clock signal from the divider in response to the combination and the input clock signal. The systems and methods also delay the divided clock signal in response to a truncation phase error and gain calibration factor from a calibration unit to provide an output clock signal having equal periods.

An exemplary quantizer includes a multi-bit analog-to-digital converter (ADC) and a first digital-to-analog converter (DAC) feedback circuit. The multi-bit ADC has an internal DAC associated with comparison of each sampled analog input of the multi-bit ADC. The multi-bit ADC converts a currently-sampled analog input into a first digital output. A first noise-shaped truncation output is derived from the first digital output. The first DAC feedback circuit transfers a first truncation residue associated with the first noise-shaped truncation output to the internal DAC. The transferred first truncation residue is reflected in comparison of a later-sampled analog input of the multi-bit ADC via the internal DAC.

A transducer system has 1) a MEMS transducer configured to produce an analog output signal in response to an incident acoustic signal, and 2) a modulator apparatus. The modulator apparatus includes an analog modulator configured to receive the analog output signal and produce a first digital signal as a function of the analog output signal. In addition, the modulator apparatus also has a digital converter configured to receive the first digital signal and produce a second digital signal as a function of the first digital signal. The analog modulator has an analog order while, in a corresponding manner, the digital converter has a digital order. Preferably, the digital order is higher than the analog order.