Patent classifications
C08L49/00
METHODS AND MATERIALS FOR MAKING ELASTOMER RESISTANT TO DEGRADATION BY ULTRAVIOLET RADIATION AND PLASMA
In an additional embodiment, a semiconductor processing tool is provided. In an embodiment, the semiconductor processing tool, comprises a chamber, and a lid sealing the chamber. In an embodiment, with an elastomer seal is between the chamber and the lid. In an embodiment, the elastomer seal comprises a polymer with carbon chains, where an average number of bonds between carbons in the carbon chains is greater than 1.00. In an embodiment a portion of the processing tool is transparent to ultraviolet radiation so that the elastomer seal is exposed to the ultraviolet radiation.
METHODS AND MATERIALS FOR MAKING ELASTOMER RESISTANT TO DEGRADATION BY ULTRAVIOLET RADIATION AND PLASMA
In an additional embodiment, a semiconductor processing tool is provided. In an embodiment, the semiconductor processing tool, comprises a chamber, and a lid sealing the chamber. In an embodiment, with an elastomer seal is between the chamber and the lid. In an embodiment, the elastomer seal comprises a polymer with carbon chains, where an average number of bonds between carbons in the carbon chains is greater than 1.00. In an embodiment a portion of the processing tool is transparent to ultraviolet radiation so that the elastomer seal is exposed to the ultraviolet radiation.
Water-soluble diacetylene, photolithography composition comprising water-soluble diacetylene monomer and conductive polymer, and fine pattern preparation method using same
Provided are a novel water-soluble diacetylene monomer, a composition for photolithography including the novel water-soluble diacetylene monomer and a conductive polymer, and a method of forming micropatterns using the composition. The water-soluble diacetylene monomer may not aggregate even when mixed with a water-soluble conductive polymer. Accordingly, a uniform composition for photolithography can be prepared by mixing a water-soluble conductive polymer with the diacetylene monomer, and micropatterns can be formed using the composition. More particularly, when the composition is formed into a thin film and then is irradiated with light, only light-irradiated portions of the diacetylene monomer are selectively crosslinked due to photopolymerization, thereby resulting in insoluble negative-type micropatterns.
Water-soluble diacetylene, photolithography composition comprising water-soluble diacetylene monomer and conductive polymer, and fine pattern preparation method using same
Provided are a novel water-soluble diacetylene monomer, a composition for photolithography including the novel water-soluble diacetylene monomer and a conductive polymer, and a method of forming micropatterns using the composition. The water-soluble diacetylene monomer may not aggregate even when mixed with a water-soluble conductive polymer. Accordingly, a uniform composition for photolithography can be prepared by mixing a water-soluble conductive polymer with the diacetylene monomer, and micropatterns can be formed using the composition. More particularly, when the composition is formed into a thin film and then is irradiated with light, only light-irradiated portions of the diacetylene monomer are selectively crosslinked due to photopolymerization, thereby resulting in insoluble negative-type micropatterns.
Compound and composition for forming organic film
A compound shown by the following general formula (1-1), ##STR00001##
AR1 and AR2 each independently represent an aromatic ring or an aromatic ring containing at least one nitrogen and/or sulfur atom, two AR1s, AR1 and AR2, or two AR2s are optionally bonded; AR3 represents a benzene, naphthalene, thiophene, pyridine, or diazine ring; A represents an organic group; B represents an anionic leaving group; Y represents a divalent organic group; “p” is 1 or 2; “q” is 1 or 2; “r” is 0 or 1; “s” is 2 to 4; when s=2, Z represents a single bond, divalent atom, or divalent organic group; and when s=3 or 4, Z represents a trivalent or quadrivalent atom or organic group. This compound cures to form an organic film, and also forms an organic under layer film.
Compound and composition for forming organic film
A compound shown by the following general formula (1-1), ##STR00001##
AR1 and AR2 each independently represent an aromatic ring or an aromatic ring containing at least one nitrogen and/or sulfur atom, two AR1s, AR1 and AR2, or two AR2s are optionally bonded; AR3 represents a benzene, naphthalene, thiophene, pyridine, or diazine ring; A represents an organic group; B represents an anionic leaving group; Y represents a divalent organic group; “p” is 1 or 2; “q” is 1 or 2; “r” is 0 or 1; “s” is 2 to 4; when s=2, Z represents a single bond, divalent atom, or divalent organic group; and when s=3 or 4, Z represents a trivalent or quadrivalent atom or organic group. This compound cures to form an organic film, and also forms an organic under layer film.
WETNESS INDICATING COMPOSITIONS INCLUDING AN AMPHIPHILIC POLYDIACETYLENE AND ABSORBENT ARTICLES INCLUDING THE SAME
A wetness indicating composition can include a mixing solvent including water and a water-miscible volatile organic solvent. The wetness indicating composition can also include an amphiphilic polydiacetylene and a hydrophobic binder. In some embodiments, the wetness indicating composition can be applied to a substrate and serve as a wetness indicator for an absorbent article.
ETHYLENE/C5-C10 ALPHA-OLEFIN/ POLYENE INTERPOLYMERS
A composition comprising an ethylene/C5-C10 alpha-olefin/non-conjugated polyene interpolymer, wherein the interpolymer meets the following relationship: Tg ( C.)[0.625( C./wt %)XC55 C.], where Tg is the glass transition temperature of the interpolymer, and XC is the wt % crystallinity of the interpolymer.
ETHYLENE/C5-C10 ALPHA-OLEFIN/ POLYENE INTERPOLYMERS
A composition comprising an ethylene/C5-C10 alpha-olefin/non-conjugated polyene interpolymer, wherein the interpolymer meets the following relationship: Tg ( C.)[0.625( C./wt %)XC55 C.], where Tg is the glass transition temperature of the interpolymer, and XC is the wt % crystallinity of the interpolymer.
Microporous polymeric composition
A microporous polymeric composition including a matrix polymer having a fractional free volume of at least 0.1 and dispersed particles having a hypercrosslinked polymer.