A measurement method includes: generating first measurement data based on observation data of an observation point of a structure; generating second measurement data by performing filter processing on the first measurement data; calculating a first deflection amount of the structure; calculating a second deflection amount by performing filter processing on the first deflection amount; approximating the second measurement data with a linear function of the second deflection amount to calculate a first-order coefficient and a zero-order coefficient; calculating a third deflection amount based on the first-order coefficient, the zero-order coefficient, and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; and calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount.

A measurement method includes: generating first measurement data based on observation data of an observation point of a structure; generating second measurement data by performing filter processing on the first measurement data; calculating a first deflection amount of the structure; calculating a second deflection amount by performing filter processing on the first deflection amount; approximating the second measurement data with a linear function of the second deflection amount to calculate a first-order coefficient and a zero-order coefficient; calculating a third deflection amount based on the first-order coefficient, the zero-order coefficient, and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; and calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount.

There are provided a construction repair support apparatus, a construction repair support method, and a construction repair support program with which repair design information for a construction can be automatically generated and the determination basis for the repair design information can be presented to the user. A construction repair support apparatus includes a processor, and the processor is configured to perform an information acquisition process of acquiring construction information concerning a construction, a repair design information generation process of generating repair design information concerning a repair of damage in the construction on the basis of the construction information and damage information concerning the damage in the construction, a determination basis generation process of generating information that contributes to generation of the repair design information, as determination basis information for the repair design information, and a display process of causing a display device to display the repair design information and the determination basis information.

Disclosed in the present invention is an auxiliary marking tape laying vehicle for laser scanning of the morphology of a long-span bridge, the laying vehicle comprising a laying portion, a guiding portion and a power transmission portion, wherein the laying portion is fixed on the top of the laying vehicle, a roller is provided on the top of the laying portion, the guiding portion is provided at the bottom of the laying vehicle, the power transmission portion is fixed outside the laying vehicle, a scroll is provided above the guiding portion, the surface of the marking tape in contact with the bridge is a rubber magnetic layer, and the other surface of the marking tape is provided with bulged reflection angles, which are used as teeth to make one end of the marking tape be connected with the roller through the teeth, and to make the other end of the marking tape be connected with the scroll through the teeth. The marking tape is installed at the bottom of the beam of the long-span bridge, and a plurality of bulges formed by the reflection angles of the marking tape are used to provide more reflection surfaces for the laser, to reduce the reflection angle, to improve the reflection effect, and then to improve the efficiency and accuracy of a three-dimensional laser scanner.

A measurement method includes: generating second measurement data by performing filter processing on first measurement data; calculating a first deflection amount based on an approximate equation of deflection of a structure; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount; calculating a first dynamic response by subtracting the static response from the first measurement data; calculating a second dynamic response by attenuating an unnecessary signal from the first dynamic response; and calculating an attenuation rate of the second dynamic response based on an envelope amplitude of the second dynamic response.

A measurement method includes: generating second measurement data by performing filter processing on first measurement data; calculating a first deflection amount based on an approximate equation of deflection of a structure; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount; calculating a first dynamic response by subtracting the static response from the first measurement data; calculating a second dynamic response by attenuating an unnecessary signal from the first dynamic response; and calculating an attenuation rate of the second dynamic response based on an envelope amplitude of the second dynamic response.

A derivation method includes: an acquisition step of acquiring time-series data including a physical quantity generated at a predetermined observation point in a structure as a response caused by a movement of a formation moving object formed with one or more moving objects on the structure; an environment information acquisition step of acquiring, as environment information, information on a structure length that is a length of the structure, a moving object length that is a length of the moving object, and an installation position of a contact portion of the moving object with the structure; a fundamental frequency derivation step of deriving a fundamental frequency of the time-series data based on the time-series data; a passing period derivation step of deriving a passing period during which the formation moving object passes through the structure based on the time-series data; and a number derivation step of deriving the number of the moving objects included in the formation moving object based on the environment information, the fundamental frequency, and the passing period.

A measurement method includes: generating second measurement data by performing filter processing on observation data-based first measurement data; calculating a first deflection amount of a structure based on an approximate equation of deflection of the structure, observation information, and environment information; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount, and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a first static response by adding the offset and a product of the first-order coefficient and the first deflection amount; and calculating a first dynamic response by subtracting the first static response from the first measurement data.

A measurement method includes: generating second measurement data by performing filter processing on observation data-based first measurement data; calculating a first deflection amount of a structure based on an approximate equation of deflection of the structure, observation information, and environment information; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount, and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a first static response by adding the offset and a product of the first-order coefficient and the first deflection amount; and calculating a first dynamic response by subtracting the first static response from the first measurement data.

Provided are an imaging apparatus, an imaging method, an imaging program, and an imaging system capable of easily making an imaging plan. The imaging apparatus (100) includes an imaging evaluation map acquiring section (101) that acquires an imaging evaluation map, and an imaging point selecting section (102) that selects an imaging point suitable for imaging an object and an imaging condition at the imaging point on the basis of the acquired imaging evaluation map. In the imaging evaluation map, an evaluation value that represents an evaluation of imaging in a case where an object is imaged at a specific position under a specific imaging condition is set at a plurality of imaging candidate positions for each of a plurality of imaging conditions.