Systems and methods of environmental parameter determination are provided. A system can include a data processing system to obtain sensor data, apply a data normalization operation to the sensor data to generate a normalized data set for storage in a database, apply at least one filter to the normalized data set to generate a filtered data set, obtain the filtered data set to generate a plurality of performance indices, generate a digital output that corresponds to the performance indices, and provide the digital output to a client computing device for display by the client computing device.

A system and method are provided for graphically actuating a trigger in a test and measurement device. The method includes displaying a visual representation of signal properties for one or more time-varying signals. A graphical user input is received, in which a portion of the visual representation is designated. The method further includes configuring a trigger of the test and measurement device in response to the graphical user input, by setting a value for a trigger parameter of the trigger. The set value for the trigger parameters varies with and is dependent upon the particular portion of the visual representation that is designated by the graphical user input. The trigger is then employed in connection with subsequent monitoring of signals within the test and measurement device.

An oscillator-based sensor interface circuit includes first and second input nodes arranged to receive first and second electrical signals representative of an electrical quantity, respectively; an analog filter; a first oscillator arranged to receive a first oscillator input signal and a second oscillator different from the first oscillator and arranged to receive a second oscillator input signal; a comparator arranged to compare signals coming from the first and second oscillators; a first feedback element arranged to receive a representation of the digital comparator output signal and to convert the representation into a first feedback signal to be applied to the oscillation means; a digital filter arranged to yield an output signal, being an filtered version of the digital comparator output signal; a second feedback element arranged to receive the output signal and to convert the output signal into a second feedback signal.

The present invention relates to an apparatus for determining and/or monitoring at least one process variable of a medium, comprising a sensor unit for registering a value for the process variable, a time registration unit for registering at least one duration of operation and a calculating unit, which is embodied at least based on the duration of operation registered by the time registration unit and based on at least one influencing variable influencing the duration of operation to make at least one statement with reference to condition of at least one component of the apparatus. Furthermore, the present invention relates to a method for operating an apparatus of the invention.

A learning apparatus (10) according to the present invention includes: a normalization/standardization unit (13) that performs normalization or standardization on data detected by a plurality of types of sensors; and a learning unit (14) that builds a model by performing machine learning, using, as training data, the detected data on which normalization or standardization has been performed by the normalization/standardization unit (13). The normalization/standardization unit (13) performs normalization or standardization for each type of sensor, on the data detected by the sensor.

The invention relates to a preparation system and method for preparing a sample for electron microscopy, the preparation system comprising: a liquid handling system (0) comprising a dispensing head (1), wherein said liquid handling system (0) is configured to aspirate and dispense a volume of a sample via the dispensing head (1), a support structure (2) that is configured to accommodate the sample, a temperature-controlled stage (4) that is configured to keep said support structure (2) at a pre-defined temperature, a first adapter (3) configured to hold said support structure (2), and a transfer mechanism (60) that is configured to be connected to the first adapter (3) holding the support structure (2) and to move said support structure (2) into a container (8) containing a liquid cryogen (80) so that the sample on the support structure (2) contacts the cryogen (80).

A physical quantity measuring apparatus has: a plurality of physical quantity sensors of the same type, each of which detects a physical quantity at intervals of a predetermined length of time; a computing unit that calculates an output value according to physical quantities detected by the plurality of physical quantity sensors at each detection time; and a deciding unit that makes a predetermined decision according to an output value calculated about the immediately preceding detection time and to physical quantities detected by the plurality of physical quantity sensors at the current detection time. The computing unit calculates an output value at each detection time according to a decision result of the deciding unit.

A physical quantity measuring apparatus has: a plurality of physical quantity sensors of the same type, each of which detects a physical quantity at intervals of a predetermined length of time; a computing unit that calculates an output value according to physical quantities detected by the plurality of physical quantity sensors at each detection time; and a deciding unit that makes a predetermined decision according to an output value calculated about the immediately preceding detection time and to physical quantities detected by the plurality of physical quantity sensors at the current detection time. The computing unit calculates an output value at each detection time according to a decision result of the deciding unit.

A sensor device includes a sensor element and a circuit chip. The sensor element detects a temperature of a measurement object to be measured and outputs a temperature signal according to the temperature of the measurement object. The circuit chip receives the temperature signal and performs signal processing. The circuit chip includes a detection element that detects a temperature of the circuit chip.

Disclosed is a specimen analyzer configured to perform analysis on a specimen for a plurality of measurement items, the specimen analyzer including a measurement section configured to perform a specimen measurement for measuring a measurement sample prepared from a specimen and a reagent corresponding to a measurement item, and configured to perform a quality control measurement for measuring a measurement sample prepared from a quality control substance and a reagent corresponding to a measurement item; and a controller programmed to set a quality control for each measurement item, from a quality control group that includes at least two types of quality controls selected from a first quality control in which the quality control measurement is performed at a predetermined time, a second quality control in which the quality control measurement is performed every time the specimen measurement is performed a predetermined number of times of measurement, and a third quality control in which the quality control measurement is performed every predetermined time interval, the controller being programmed to control the measurement section in accordance with the set quality control.