Patent classifications
G01D3/00
Specimen analyzer and specimen analysis method
Disclosed is a specimen analyzer configured to perform analysis on a specimen for a plurality of measurement items, the specimen analyzer including a measurement section configured to perform a specimen measurement for measuring a measurement sample prepared from a specimen and a reagent corresponding to a measurement item, and configured to perform a quality control measurement for measuring a measurement sample prepared from a quality control substance and a reagent corresponding to a measurement item; and a controller programmed to set a quality control for each measurement item, from a quality control group that includes at least two types of quality controls selected from a first quality control in which the quality control measurement is performed at a predetermined time, a second quality control in which the quality control measurement is performed every time the specimen measurement is performed a predetermined number of times of measurement, and a third quality control in which the quality control measurement is performed every predetermined time interval, the controller being programmed to control the measurement section in accordance with the set quality control.
Specimen analyzer and specimen analysis method
Disclosed is a specimen analyzer configured to perform analysis on a specimen for a plurality of measurement items, the specimen analyzer including a measurement section configured to perform a specimen measurement for measuring a measurement sample prepared from a specimen and a reagent corresponding to a measurement item, and configured to perform a quality control measurement for measuring a measurement sample prepared from a quality control substance and a reagent corresponding to a measurement item; and a controller programmed to set a quality control for each measurement item, from a quality control group that includes at least two types of quality controls selected from a first quality control in which the quality control measurement is performed at a predetermined time, a second quality control in which the quality control measurement is performed every time the specimen measurement is performed a predetermined number of times of measurement, and a third quality control in which the quality control measurement is performed every predetermined time interval, the controller being programmed to control the measurement section in accordance with the set quality control.
Closed-loop oscillator based sensor interface circuit
An oscillator-based sensor interface circuit includes first and second input nodes arranged to receive first and second electrical signals representative of an electrical quantity, respectively; an analog filter; a first oscillator arranged to receive a first oscillator input signal and a second oscillator different from the first oscillator and arranged to receive a second oscillator input signal; a comparator arranged to compare signals coming from the first and second oscillators; a first feedback element arranged to receive a representation of the digital comparator output signal and to convert the representation into a first feedback signal to be applied to the oscillation means; a digital filter arranged to yield an output signal, being an filtered version of the digital comparator output signal; a second feedback element arranged to receive the output signal and to convert the output signal into a second feedback signal.
Closed-loop oscillator based sensor interface circuit
An oscillator-based sensor interface circuit includes first and second input nodes arranged to receive first and second electrical signals representative of an electrical quantity, respectively; an analog filter; a first oscillator arranged to receive a first oscillator input signal and a second oscillator different from the first oscillator and arranged to receive a second oscillator input signal; a comparator arranged to compare signals coming from the first and second oscillators; a first feedback element arranged to receive a representation of the digital comparator output signal and to convert the representation into a first feedback signal to be applied to the oscillation means; a digital filter arranged to yield an output signal, being an filtered version of the digital comparator output signal; a second feedback element arranged to receive the output signal and to convert the output signal into a second feedback signal.
ABNORMALITY DETECTION APPARATUS FOR RESOLVER
To provide an abnormality detection apparatus for resolver which can determine the abnormality of at least the first system, even if the period of the excitation AC voltage of the first system and the period of the excitation AC voltage of the second system are different periods, and the magnetic interference between systems occurs. An abnormality detection apparatus for resolver applies an AC voltage of a first period to a first system excitation winding; applies an AC voltage of a second period different from the first period to a second system excitation winding; calculates DC values of first system two output signals by performing a DC extraction processing; and determines abnormality of first system based on whether or not the DC values of first system two output signals are within a normal range.
MEMS sensor filtering with error feedback
Systems and methods for filtering a micro-electromechanical system sensor rate signal with error feedback are provided. In one example, a micro-electromechanical system sensor rate signal is provided. Next, a feedback signal from a feedback loop is subtracted from the micro-electromechanical system sensor rate signal to produce a first combined signal. The first combined signal is then filtered to produce a filtered rate output. The micro-electromechanical system sensor rate signal is then subtracted from the filtered rate output to produce an error signal, wherein the error signal is used in the feedback loop to generate a feedback signal for a future time step.
MEMS sensor filtering with error feedback
Systems and methods for filtering a micro-electromechanical system sensor rate signal with error feedback are provided. In one example, a micro-electromechanical system sensor rate signal is provided. Next, a feedback signal from a feedback loop is subtracted from the micro-electromechanical system sensor rate signal to produce a first combined signal. The first combined signal is then filtered to produce a filtered rate output. The micro-electromechanical system sensor rate signal is then subtracted from the filtered rate output to produce an error signal, wherein the error signal is used in the feedback loop to generate a feedback signal for a future time step.
COGNITIVE PERFORMANCE DETERMINATION BASED ON INDOOR AIR QUALITY
Systems and methods of environmental parameter determination are provided. A system can include a data processing system to obtain sensor data, apply a data normalization operation to the sensor data to generate a normalized data set for storage in a database, obtain, from the database, the normalized data set to generate at least a first cognitive index and a second cognitive index, each of the first cognitive index and the second cognitive index, compare each of the first cognitive index and the second cognitive index with a threshold, generate, based on the first cognitive index and the second cognitive index, a unified cognitive index for the indoor space, generate, responsive to the unified cognitive index, a digital output that corresponds to the unified cognitive index; and provide, from the data processing system, the digital output to a client computing device for display by the client computing device.
COGNITIVE PERFORMANCE DETERMINATION BASED ON INDOOR AIR QUALITY
Systems and methods of environmental parameter determination are provided. A system can include a data processing system to obtain sensor data, apply a data normalization operation to the sensor data to generate a normalized data set for storage in a database, obtain, from the database, the normalized data set to generate at least a first cognitive index and a second cognitive index, each of the first cognitive index and the second cognitive index, compare each of the first cognitive index and the second cognitive index with a threshold, generate, based on the first cognitive index and the second cognitive index, a unified cognitive index for the indoor space, generate, responsive to the unified cognitive index, a digital output that corresponds to the unified cognitive index; and provide, from the data processing system, the digital output to a client computing device for display by the client computing device.
ENVIROMENTAL PARAMETER DETERMINATION BASED ON INDOOR AIR QUALITY
Systems and methods of environmental parameter determination are provided. A system can include a data processing system to obtain sensor data, apply a data normalization operation to the sensor data to generate a normalized data set for storage in a database, apply at least one filter to the normalized data set to generate a filtered data set, obtain the filtered data set to generate a plurality of performance indices, generate a digital output that corresponds to the performance indices, and provide the digital output to a client computing device for display by the client computing device.