Apparatuses, systems, and associated methods of manufacturing are described that provide for improved sensor devices. An example sensor device includes a magnet mounting tube and a magnet supported within the magnet mounting tube. The sensor device includes a sensor mounting tube that receives at least a portion of the magnet mounting tube and supported magnet therein. The sensor device includes a magnetic sensor affixed to the sensor mounting tube. The sensor device includes a spring positioned around the magnet mounting tube and the sensor mounting tube such that the magnet and the magnetic sensor are surrounded by the spring. In an instance in which a load is applied to either a first end or second end of the spring, the magnet mounting tube translates relative the sensor mounting tube so as to induce a change in magnetic flux identified by the magnetic sensor indicative of a weight of the load.

A force sensor has a sensing system including a target piece and a sensing element, configured to provide changes of a magnetic field, being generated by motion of the target piece. The sensing element senses these changes and provides a signal representative of the position of the target piece. An integrated circuit with processing means can process signals from the sensing element. A semiconductor package includes at least the integrated circuit. A flexible piece includes the target, and it is attached to the semiconductor package. The attachment area between the flexible piece and the semiconductor package does not extend beyond the top projection, or outline, of the semiconductor package. The flexible piece receives a force stimulus, so that upon exerting a force on the flexible piece, the displacement of the target piece with respect to the surface of the semiconductor package can be sensed by the sensing element.

Apparatuses, systems, and associated methods of manufacturing are described that provide for improved sensor devices. An example sensor device includes a magnet mounting tube and a magnet supported within the magnet mounting tube. The sensor device includes a sensor mounting tube that receives at least a portion of the magnet mounting tube and supported magnet therein. The sensor device includes a magnetic sensor affixed to the sensor mounting tube. The sensor device includes a spring positioned around the magnet mounting tube and the sensor mounting tube such that the magnet and the magnetic sensor are surrounded by the spring. In an instance in which a load is applied to either a first end or second end of the spring, the magnet mounting tube translates relative the sensor mounting tube so as to induce a change in magnetic flux identified by the magnetic sensor indicative of a weight of the load.

A sample is analyzed by temperature-modulated thermogravimetric analysis (TMTGA), using a thermogravimetric analysis (TGA) instrument. The TGA instrument comprises a furnace arranged in a furnace housing and an electronic balance with a load receiver arranged in a balance housing, wherein the load receiver extends into the furnace housing. A measuring position is arranged at one end of the load receiver within the furnace housing. A control unit controls the balance and/or the furnace. The TMTGA method includes at least using the TGA instrument to subject the sample to a temperature program that varies the temperature of the furnace and provides temperature-time setpoints for controlling the sample temperature, measuring the mass change of the sample as a function of time, and determining at least one kinetic parameter of the sample based on mass change. The temperature program may be stochastic and/or event-controlled in nature.

A sample is analyzed by temperature-modulated thermogravimetric analysis (TMTGA), using a thermogravimetric analysis (TGA) instrument. The TGA instrument comprises a furnace arranged in a furnace housing and an electronic balance with a load receiver arranged in a balance housing, wherein the load receiver extends into the furnace housing. A measuring position is arranged at one end of the load receiver within the furnace housing. A control unit controls the balance and/or the furnace. The TMTGA method includes at least using the TGA instrument to subject the sample to a temperature program that varies the temperature of the furnace and provides temperature-time setpoints for controlling the sample temperature, measuring the mass change of the sample as a function of time, and determining at least one kinetic parameter of the sample based on mass change. The temperature program may be stochastic and/or event-controlled in nature.

A thin personal weighing device comprising a bottom plate, extending along a reference plane, a top plate movably mounted with regard to the bottom plate along a direction perpendicular to the reference plane, four resilient elements directly interposed between the top and the bottom plate, four LC circuits positioned at a vicinity of an edge of the bottom plate, and a conductive material coating, arranged on the top plate, the four LC resonators and the at least conductive material coating exhibiting an inductance. Movement of the conductive material coating relative to each of the four LC resonators introduces a variation of the inductance. A computation unit detecting the variations of the inductance is electronically coupled with the LC resonators and configured to correlate the variations of the inductance with an actual weight placed on the weighing device. The thickness of the weighing device is less than 25 mm.

A thin personal weighing device comprising a bottom plate, extending along a reference plane, a top plate movably mounted with regard to the bottom plate along a direction perpendicular to the reference plane, four resilient elements directly interposed between the top and the bottom plate, four LC circuits positioned at a vicinity of an edge of the bottom plate, and a conductive material coating, arranged on the top plate, the four LC resonators and the at least conductive material coating exhibiting an inductance. Movement of the conductive material coating relative to each of the four LC resonators introduces a variation of the inductance. A computation unit detecting the variations of the inductance is electronically coupled with the LC resonators and configured to correlate the variations of the inductance with an actual weight placed on the weighing device. The thickness of the weighing device is less than 25 mm.

An electronic device for detecting the weight of a capsule for a pharmaceutical product is provided with: a plurality of detection electrodes, which face a respective one of a plurality of sectors into which the capsule is divided in a main extension direction thereof, each one of the detection electrodes forming a respective detection capacitor with a common plate defined by a capsule-holding element which holds the capsule; and an electronic circuit having a plurality of detection stages, each operatively coupled to a respective one of the detection electrodes so as to detect, in an independent and exclusive manner, a capacitive variation of the respective detection capacitor and to generate a respective output quantity, which is a function of the capacitive variation and indicative of the weight of the respective sector of the capsule.

An electronic device for detecting the weight of a capsule for a pharmaceutical product is provided with: a plurality of detection electrodes, which face a respective one of a plurality of sectors into which the capsule is divided in a main extension direction thereof, each one of the detection electrodes forming a respective detection capacitor with a common plate defined by a capsule-holding element which holds the capsule; and an electronic circuit having a plurality of detection stages, each operatively coupled to a respective one of the detection electrodes so as to detect, in an independent and exclusive manner, a capacitive variation of the respective detection capacitor and to generate a respective output quantity, which is a function of the capacitive variation and indicative of the weight of the respective sector of the capsule.

A capacitor comprises a first electrode, a second electrode provided on the first electrode, a ferroelectric film provided between the first electrode and the second electrode, and a dielectric film provided between the ferroelectric film and the second electrode, impedance of the ferroelectric film and impedance of the dielectric film are determined such that a control voltage applied between the first electrode and the second electrode is equal to a capacitance boosting operating voltage, and the capacitance boosting operating voltage is determined by the following equation: $V_{\mathrm{MAX}}=\left(1+\frac{.Math.Z_2.Math.}{.Math.Z_1.Math.}\right)t_F{E}_{\mathrm{FM}}$ where V.sub.MAX is a capacitance boosting operating voltage, Z.sub.1 is impedance of the ferroelectric film, Z.sub.2 is impedance of the dielectric film, t.sub.F is a thickness of the ferroelectric film, and E.sub.FM is an electric field applied to the ferroelectric film having a maximum polarization.