A method and a calorimeter system for reducing error in a measured sample heat flow rate due to interpan heat exchange are described. The method includes sensing a heat flow rate to or from a sample container placed on a sample calorimeter unit in a single sample differential scanning calorimeter sensor and sensing a reference heat flow rate to or from a reference container placed on a reference calorimeter unit of the single sample differential scanning calorimeter sensor. The temperature of the sample container and the temperature of the reference container are also sensed. An interpan heat exchange between the sample container and the reference container is determined. A sample heat flow rate having reduced error is determined based on the sensed heat flow rate from the sample container and the determined interpan heat exchange rate.

The present invention relates to a method for estimating the thermophysical properties of a material (Ω) that incorporates at least one temperature sensor (1, 2, 3) and one point heat source (4), the distance between the at least one temperature sensor (1, 2, 3) and the point heat source (4) being known. The method includes the steps of: expression of the theoretical temperature as a function of time at the at least one temperature sensor (1, 2, 3) when the point heat source (4) is activated, said expression depending on the thermophysical parameters of the material (Ω); acquisition of a plurality of temperature measurements by the at least one temperature sensor (1, 2, 3) over a time period during which the point heat source (4) is activated; and determining of the values of the thermophysical parameters of the material (Ω), such that the difference between the theoretical temperatures obtained via said expression and the temperatures that are actually measured is minimal. The present invention also relates to a method for measuring a heat flow (φ(t)) across a surface (Γ) of a material (Ω) and a flow meter (10) designed for this purpose.

The present invention relates to a method for estimating the thermophysical properties of a material (Ω) that incorporates at least one temperature sensor (1, 2, 3) and one point heat source (4), the distance between the at least one temperature sensor (1, 2, 3) and the point heat source (4) being known. The method includes the steps of: expression of the theoretical temperature as a function of time at the at least one temperature sensor (1, 2, 3) when the point heat source (4) is activated, said expression depending on the thermophysical parameters of the material (Ω); acquisition of a plurality of temperature measurements by the at least one temperature sensor (1, 2, 3) over a time period during which the point heat source (4) is activated; and determining of the values of the thermophysical parameters of the material (Ω), such that the difference between the theoretical temperatures obtained via said expression and the temperatures that are actually measured is minimal. The present invention also relates to a method for measuring a heat flow (φ(t)) across a surface (Γ) of a material (Ω) and a flow meter (10) designed for this purpose.

A sensor assembly with a sensing element sends a sensor signal from the sensing element to attached process transmitter over sensor connection wires. The sensor assembly has memory circuitry for storing information related to the sensor assembly and interface circuitry that provides for digital communication of the stored information with the attached process transmitter. This digital communication is sent over the sensor connection wires.

A sensor assembly with a sensing element sends a sensor signal from the sensing element to attached process transmitter over sensor connection wires. The sensor assembly has memory circuitry for storing information related to the sensor assembly and interface circuitry that provides for digital communication of the stored information with the attached process transmitter. This digital communication is sent over the sensor connection wires.

Apparatus and methods are provided for providing flexible and repairable testing capabilities for systems that generate or absorb heat such as energy storage systems. One embodiment can include a temperature bath structure adapted to contain and maintain a fluid bath at a predetermined temperature, an outer containment structure adapted to insert into the temperature bath structure, heat sinks, thermal sensor assemblies, and an internal containment structure where the thermal sensor assemblies and heat sinks removeably attach to different sections of the inner containment structure so as to measure heat flow into or out of the inner containment structure's different sections. Embodiments of the invention enable rapid insertion/removal of samples as well as replacement of sections of the system including embodiments or parts of thermal sensor assemblies as well as enabling separate thermal measurements associated with different sections of a sample under test within the inner containment structure.

Apparatus and methods are provided for providing flexible and repairable testing capabilities for systems that generate or absorb heat such as energy storage systems. One embodiment can include a temperature bath structure adapted to contain and maintain a fluid bath at a predetermined temperature, an outer containment structure adapted to insert into the temperature bath structure, heat sinks, thermal sensor assemblies, and an internal containment structure where the thermal sensor assemblies and heat sinks removeably attach to different sections of the inner containment structure so as to measure heat flow into or out of the inner containment structure's different sections. Embodiments of the invention enable rapid insertion/removal of samples as well as replacement of sections of the system including embodiments or parts of thermal sensor assemblies as well as enabling separate thermal measurements associated with different sections of a sample under test within the inner containment structure.

A heat flux sensor equipped measurement wafer includes a substrate, a cover thermally coupled to a portion of the substrate, a sensor cavity formed between the substrate and the cover, a thermal barrier disposed within at least a portion of the sensor cavity, a bottom temperature sensor thermally coupled to the substrate and insulated from the cover by a portion of the thermal barrier and a top temperature sensor thermally coupled to the cover and insulated from the substrate by an additional portion of the thermal barrier, wherein a temperature difference between the bottom temperature sensor and the top temperature sensor is related to a heat flux passing through the substrate and cover proximate to the sensor cavity.

A heat flux sensor equipped measurement wafer includes a substrate, a cover thermally coupled to a portion of the substrate, a sensor cavity formed between the substrate and the cover, a thermal barrier disposed within at least a portion of the sensor cavity, a bottom temperature sensor thermally coupled to the substrate and insulated from the cover by a portion of the thermal barrier and a top temperature sensor thermally coupled to the cover and insulated from the substrate by an additional portion of the thermal barrier, wherein a temperature difference between the bottom temperature sensor and the top temperature sensor is related to a heat flux passing through the substrate and cover proximate to the sensor cavity.

A heat flow rate measurement method for use with a differential scanning calorimeter sensor is provided. The method includes calculating a heat exchange between a plurality of sample containers and a reference container placed on a plurality of sample calorimeter units and a reference calorimeter unit, respectively, and determining a heat flow rate of samples within the sample containers using the calculated heat exchange between the plurality of sample containers and the reference container. A multiple sample differential scanning calorimeter sensor and calorimeter system are also provided.