A method for indicating a cycle of operation in a laundry treating appliance having a space that includes at least one electrically conductive element disposed in the space and coupled with a controller, the method includes producing in the at least one electrically conductive element the voltage or the current in reaction to the energized e-field apart from the article. Receiving in the controller a signal from the at least one electrically conductive element indicative of a value of a parameter associated with the voltage or the current of the at least one electrically conductive element. And, generating an indication, by the controller, indicative of a cycle of operation and wherein the indication increases or decreases in intensity proportional to the value of the parameter associated with the voltage or the current.

A method for indicating a cycle of operation in a laundry treating appliance having a space that includes at least one electrically conductive element disposed in the space and coupled with a controller, the method includes producing in the at least one electrically conductive element the voltage or the current in reaction to the energized e-field apart from the article. Receiving in the controller a signal from the at least one electrically conductive element indicative of a value of a parameter associated with the voltage or the current of the at least one electrically conductive element. And, generating an indication, by the controller, indicative of a cycle of operation and wherein the indication increases or decreases in intensity proportional to the value of the parameter associated with the voltage or the current.

Provided herein are systems and methods for simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system. The microscope can comprise in part an imaging light source and a stimulation light source. Light from the imaging light source and the stimulation light source can be spectrally separated to reduce cross talk between the stimulation light and the imaging light.

Provided herein are systems and methods for imaging using a microscope system comprising removeable or replaceable component parts. Such systems and methods employ semi-kinetic coupling for easy, tool-free attachment of the microscope system to a baseplate. Systems and methods provided herein may comprise simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system.

Embodiments described herein are generally directed to a device that monitors for the presence of objects passing through or impinging on a virtual shell near the device, referred to herein as a “light curtain”, which is created by rapidly rotating a line sensor and a line laser in synchrony. The boundaries of the light curtain are defined by a sweeping line defined by the intersection of the sensing and illumination planes.

Embodiments described herein are generally directed to a device that monitors for the presence of objects passing through or impinging on a virtual shell near the device, referred to herein as a “light curtain”, which is created by rapidly rotating a line sensor and a line laser in synchrony. The boundaries of the light curtain are defined by a sweeping line defined by the intersection of the sensing and illumination planes.

The microscope for monitoring objects after nano-cutting and for investigating structures of macro- and micro-carriers under low temperature comprises a punch having a cutting edge, drives driving the punch along two axes, a platform rotatable in a plane, a piezo-scanner for recording a sample image along three axes, a holder with a carrier of the sample, and a probe unit to which a probe is fastened. The piezo-scanner is fastened to the platform, the punch is able to interact with the sample, and the probe unit is mounted on the platform so as to be movable along one of the axes. The assembly includes a module for mechanical action on the cutting edge of the punch to modify the cutting surface, which module is fastened to the same platform to which the piezo-scanner with the object carrier and the probe unit are fastened.

The microscope for monitoring objects after nano-cutting and for investigating structures of macro- and micro-carriers under low temperature comprises a punch having a cutting edge, drives driving the punch along two axes, a platform rotatable in a plane, a piezo-scanner for recording a sample image along three axes, a holder with a carrier of the sample, and a probe unit to which a probe is fastened. The piezo-scanner is fastened to the platform, the punch is able to interact with the sample, and the probe unit is mounted on the platform so as to be movable along one of the axes. The assembly includes a module for mechanical action on the cutting edge of the punch to modify the cutting surface, which module is fastened to the same platform to which the piezo-scanner with the object carrier and the probe unit are fastened.

Areas having different isotopic ratios are artificially introduced into a metal material before sintering, a heat treatment, or Grain boundary diffusion, and atom probe analysis results before and after sintering, a heat treatment, or grain boundary diffusion are compared to evaluate a change in isotopic distribution over time.

A scanning probe microscope that includes a probe, a positioning unit configured to position a probe on a measurement sample, an excitation unit configured to excite the measurement sample at a predetermined frequency, a resonance unit configured to output a frequency modulation signal by converting a change of a capacitance of the measurement sample, a lock-in amplifier configured to output a differential capacitance signal obtained by extracting a predetermined frequency component and a harmonic component of the predetermined frequency of the demodulated signal, a conversion unit configured to output data indicative of a relationship between a voltage applied to the measurement sample and the capacitance, a detecting unit that detects a voltage value corresponding to a feature point of the relationship data, and a main measurement control unit that measures electrical characteristics of the measurement sample subjected to a DC bias voltage substantially equal to the feature point voltage.