A packaged VCTCXO may include a crystal oscillator configured to output a signal of a particular frequency and a temperature sensor configured to measure an internal temperature of the crystal oscillator. In addition, the packaged VCTCXO may include a microcontroller configured to generate an internal control voltage signal based at least in part on the temperature and an external control voltage received by the packaged VCTCXO. Moreover, the packaged VCTCXO may include a combiner configured to combine an internal control voltage and the external control voltage to generate a control voltage. Further, the control voltage may be supplied to the crystal oscillator to cause the crystal oscillator to generate the signal of the particular frequency.

Embodiments of an integrated circuit (IC) comprising circuitry to determine settings for an injection-locked oscillator (ILO) are described. In some embodiments, an injection signal is generated based on a first clock edge of a reference clock signal, and is injected into an ILO. Next, one or more output signals of the ILO are sampled based on a second clock edge of the reference clock signal, and settings for the ILO are determined based on the samples. In some embodiments, a sequence of two or more time-to-digital (TDC) codes is generated based on a reference clock signal and a free-running ILO. In some embodiments, the TDC circuitry that is already present in a delay-locked loop is reused for determining the sequence of two or more TDC codes. The ILO settings can then be determined based on the sequence of two or more

Embodiments of an integrated circuit (IC) comprising circuitry to determine settings for an injection-locked oscillator (ILO) are described. In some embodiments, an injection signal is generated based on a first clock edge of a reference clock signal, and is injected into an ILO. Next, one or more output signals of the ILO are sampled based on a second clock edge of the reference clock signal, and settings for the ILO are determined based on the samples. In some embodiments, a sequence of two or more time-to-digital (TDC) codes is generated based on a reference clock signal and a free-running ILO. In some embodiments, the TDC circuitry that is already present in a delay-locked loop is reused for determining the sequence of two or more TDC codes. The ILO settings can then be determined based on the sequence of two or more

A tracking system for a digital Phase Locked Loop (PLL), the tracking system including a PLL model configured to emulate an actual internal PLL signal, wherein the emulation is based on another internal PLL signal received from the digital PLL and on an estimated analog PLL parameter of the PLL model; and a tracker configured to compare the emulated internal PLL signal with the actual internal PLL signal, and to update the estimated analog PLL parameter according to a minimization algorithm that minimizes a result of the comparison.

A tracking system for a digital Phase Locked Loop (PLL), the tracking system including a PLL model configured to emulate an actual internal PLL signal, wherein the emulation is based on another internal PLL signal received from the digital PLL and on an estimated analog PLL parameter of the PLL model; and a tracker configured to compare the emulated internal PLL signal with the actual internal PLL signal, and to update the estimated analog PLL parameter according to a minimization algorithm that minimizes a result of the comparison.

An apparatus comprises a first circuit, a second circuit, a first transistor, a second transistor, a third transistor, a first programmable resistance, and a second programmable resistance. The first circuit may be configured to generate a reference signal and a bias signal in response to a supply voltage and a first input signal. The first circuit generally provides supply noise rejection to variations in the supply voltage. The second circuit may be connected to the first circuit and a ring oscillator. The first transistor may be connected to the first circuit and configured to set a first reference current of the first circuit based on the first input signal and the first programmable resistance. The second transistor may be connected in parallel with the first transistor. The second transistor is generally diode-connected. The third transistor may be connected to the first circuit and configured to set a second reference current of the first circuit based on the first input signal and the second programmable resistance. The first circuit generally forms a current mirror with the second circuit. The second circuit may be configured to provide a programmable current ratio for the current mirror based on a value of a second input signal.

An apparatus comprises a first circuit, a second circuit, a first transistor, a second transistor, a third transistor, a first programmable resistance, and a second programmable resistance. The first circuit may be configured to generate a reference signal and a bias signal in response to a supply voltage and a first input signal. The first circuit generally provides supply noise rejection to variations in the supply voltage. The second circuit may be connected to the first circuit and a ring oscillator. The first transistor may be connected to the first circuit and configured to set a first reference current of the first circuit based on the first input signal and the first programmable resistance. The second transistor may be connected in parallel with the first transistor. The second transistor is generally diode-connected. The third transistor may be connected to the first circuit and configured to set a second reference current of the first circuit based on the first input signal and the second programmable resistance. The first circuit generally forms a current mirror with the second circuit. The second circuit may be configured to provide a programmable current ratio for the current mirror based on a value of a second input signal.

Various implementations described herein are directed to multi-stage system. The system may include a first stage having a current bias generator that generates a biasing current. The system may include a second stage that is coupled to the first stage, and the second stage may include a load that utilizes the biasing current generated by the current bias generator.

Various implementations described herein are directed to multi-stage system. The system may include a first stage having a current bias generator that generates a biasing current. The system may include a second stage that is coupled to the first stage, and the second stage may include a load that utilizes the biasing current generated by the current bias generator.

An electrical circuit, having: an oscillating element configured to provide a clock signal; and a clock synchronization unit configured to adapt the clock signal based on a reference signal; wherein the clock synchronization unit is configured to extract from an alternating signal the reference signal.