Patent classifications
H05H3/00
Quantum simulator and quantum simulation method
A quantum simulator includes a pseudo speckle pattern generator, a main vacuum chamber, an atomic gas supply unit, a light beam generator, a photodetector, and an atom number detector. The pseudo speckle pattern generator generates a pseudo speckle pattern in the inside of the main vacuum chamber by light allowed to enter the inside of the main vacuum chamber through the second window. The pseudo speckle pattern generator includes a controller, a light source, a beam expander, a spatial light modulator, and a lens. The controller sets a modulation distribution of the spatial light modulator based on a two-dimensional pseudo random number pattern.
Quantum simulator and quantum simulation method
A quantum simulator includes a pseudo speckle pattern generator, a main vacuum chamber, an atomic gas supply unit, a light beam generator, a photodetector, and an atom number detector. The pseudo speckle pattern generator generates a pseudo speckle pattern in the inside of the main vacuum chamber by light allowed to enter the inside of the main vacuum chamber through the second window. The pseudo speckle pattern generator includes a controller, a light source, a beam expander, a spatial light modulator, and a lens. The controller sets a modulation distribution of the spatial light modulator based on a two-dimensional pseudo random number pattern.
High reliability, long lifetime, negative ion source
A negative ion source includes a plasma chamber, a microwave source, a negative ion converter, a magnetic filter and a beam formation mechanism. The plasma chamber contains gas to be ionized. The microwave source transmits microwaves to the plasma chamber to ionize the gas into atomic species including hyperthermal neutral atoms. The negative ion converter converts the hyperthermal neutral atoms to negative ions. The magnetic filter reduces a temperature of electrons provided between the plasma chamber and the negative ion converter. The beam formation mechanism extracts the negative ions.
METHOD FOR NEUTRAL BEAM PROCESSING BASED ON GAS CLUSTER ION BEAM TECHNOLOGY AND ARTICLES PRODUCED THEREBY
A method of forming a patterned hard mask on a surface of a substrate uses an accelerated neutral beam with carbon atoms.
METHOD FOR NEUTRAL BEAM PROCESSING BASED ON GAS CLUSTER ION BEAM TECHNOLOGY AND ARTICLES PRODUCED THEREBY
A method of forming a patterned hard mask on a surface of a substrate uses an accelerated neutral beam with carbon atoms.
Laser cooling via stimulated photon emissions
An example laser cooling system may include a first laser to induce a transition of a plurality of electrons in a medium to an excited energy state via absorption of photons. The laser cooling system may also include a second laser to stimulate emission from the medium of emitted photons having a higher energy than an energy of the absorbed photons.
Laser cooling via stimulated photon emissions
An example laser cooling system may include a first laser to induce a transition of a plurality of electrons in a medium to an excited energy state via absorption of photons. The laser cooling system may also include a second laser to stimulate emission from the medium of emitted photons having a higher energy than an energy of the absorbed photons.
SYSTEMS, DEVICES, AND METHODS FOR DEFORMATION REDUCTION AND RESISTANCE IN METALLIC BODIES
Metallic bodies are provided having a lithium layer and a metallic substrate. The metallic bodies can exhibit increased resistance to radiation-induced deformations such as blistering. Methods are provided for transitioning the metallic bodies into more blister resistant configurations, as our methods for diminishing or eliminating blisters previously formed. Systems for utilizing the metallic bodies and methods are also disclosed.
DEVICE FOR MEASURING A QUANTITY REPRESENTATIVE OF A POPULATION OF COLD ATOMS AND ASSOCIATED SENSOR
A device for measuring a quantity representative of a population (N) of cold atoms, the cold atoms being located in a cloud of cold atoms to be analyzed, the device includes a microwave source configured to generate an incident signal at a predetermined signal frequency, a microwave guide configured to propagate the incident signal and an antenna configured to emit the incident signal to the cloud of cold atoms and its environment, the antenna and the microwave guide also being able to recover an atomic reflected signal resulting from a reflection of the incident signal by the cloud and its environment, and which propagates in the waveguide in the opposite direction to the incident signal, a splitting device coupled to the microwave guide and configured to extract at least part of the atomic reflected signal, a detector configured to detect the atomic reflected signal extracted by the splitting device, the quantity representative of the population of cold atoms (N) being obtained from a detected value of the atomic reflected signal and from a detected value of a signal reflected by the environment in the absence of the cloud, called reference reflected signal.
DEVICE FOR MEASURING A QUANTITY REPRESENTATIVE OF A POPULATION OF COLD ATOMS AND ASSOCIATED SENSOR
A device for measuring a quantity representative of a population (N) of cold atoms, the cold atoms being located in a cloud of cold atoms to be analyzed, the device includes a microwave source configured to generate an incident signal at a predetermined signal frequency, a microwave guide configured to propagate the incident signal and an antenna configured to emit the incident signal to the cloud of cold atoms and its environment, the antenna and the microwave guide also being able to recover an atomic reflected signal resulting from a reflection of the incident signal by the cloud and its environment, and which propagates in the waveguide in the opposite direction to the incident signal, a splitting device coupled to the microwave guide and configured to extract at least part of the atomic reflected signal, a detector configured to detect the atomic reflected signal extracted by the splitting device, the quantity representative of the population of cold atoms (N) being obtained from a detected value of the atomic reflected signal and from a detected value of a signal reflected by the environment in the absence of the cloud, called reference reflected signal.