An electronic device is provided. The electronic device includes a plurality of conductive elements, a first electronic unit and a protective layer. The first electronic unit is disposed between two adjacent first conductive elements of the plurality of conductive elements. A second conductive element of the plurality of conductive elements is disposed adjacent to one of the two adjacent first conductive elements of the plurality of conductive elements. The protective layer surrounds the plurality of conductive elements and the first electronic unit. Moreover, the one of the two adjacent first conductive elements has a first width, the second conductive element has a second width, and the second width is less than the first width.

A semiconductor device includes a first die pad, a first semiconductor element, a second die pad, a second semiconductor element, a sealing resin, a first lead, a second lead, a third lead, and a fourth lead. The first lead, the second lead, the third lead, and the fourth lead are each spaced apart from the third side and the fourth side of the sealing resin and are exposed externally from either the first side surface or the second side surface of the sealing resin. Viewed in a third direction perpendicular to the first direction and the second directions, an area of the first die pad is larger than an area of the second die pad. Viewed in the third direction, each of the first lead and the third lead is separated away in the first direction from a first virtual line toward a side where the first side surface of the sealing resin is located.

A bonding apparatus and a bonding method are provided. The bonding apparatus includes: a machine base, including a movable pick-up platform; and a grating assembly, configured to determine displacement information of the movable pick-up platform along a first direction and displacement information of the movable pick-up platform along a second direction. Based on the displacement information along the first direction and the displacement information along the second direction, the grating assembly is further configured to determine coordinate information of the movable pick-up platform.

A semiconductor substrate includes a semiconductor base substrate. An alignment structure is formed on a surface of the semiconductor base substrate. An epitaxial layer is deposited on the surface of the semiconductor base substrate. The alignment structure includes an area of the surface of the semiconductor base substrate that is formed as a groove pattern. Grooves of the groove pattern are aligned with a specific crystallographic direction of the semiconductor base substrate. The specific crystallographic direction provides for a slower epitaxial growth rate on such a groove-patterned base substrate surface area compared to epitaxial growth on a surface of the semiconductor base substrate adjacent to the groove-patterned area.

A semiconductor structure including a substrate and protection structures is provided. The substrate includes a die region. The die region includes corner regions. The protection structures are located in the corner region. Each of the protection structures has a square top-view pattern. The square top-view patterns located in the same corner region have various sizes.

A semiconductor package includes a first semiconductor chip, a sealing layer molding the first semiconductor chip, and an upper connection structure on the sealing layer, wherein the upper connection structure includes an insulating layer. The insulating layer includes marking patterns defined by a first region and a second region, the first region being at at least a portion of the insulating layer and having a first light transmittance value, the second region being at at least a portion of the first region and having a second light transmittance value different from the first light transmittance value.

A semiconductor package includes a package substrate, a first chip group including at least one first chip spaced apart from the package substrate in a first direction perpendicular to a surface of the package substrate, a second chip group including at least one second chip disposed between the package substrate and the first chip group, a first molding film that surrounds the first chip group, a second molding film that surrounds the second chip group, and an alignment post that penetrates the first molding film and contacts the second molding film. The second molding film covers a surface of an end portion of the alignment post facing the package substrate.

Methods, systems, and devices for identification marking cavity filling for semiconductor packages are described. A semiconductor device may be formed to be relatively less susceptible to surface failures, including failure initiated by stress risers associated with identification markings. For example, a mold compound material may be formed over one or more semiconductor dies of the semiconductor device. One or more identification markings may be formed in the mold compound material based on forming one or more cavities into a surface of the material. A second material may be formed in the one or more cavities and may fill each of the cavities. The second material may be a crack-resistant material. The second material may be formed through one or more apertures of a stencil, or the second material may be formed by applying the second material over an entirety of the surface of the semiconductor device.

Apparatus and methods for determining wafer characters are disclosed. In one example, an apparatus is disclosed. The apparatus includes: a processing tool configured to process a semiconductor wafer; a device configured to read an optical character disposed on the semiconductor wafer while the semiconductor wafer is located at the apparatus for wafer fabrication; and a controller configured to determine whether the optical character matches a predetermined character corresponding to the semiconductor wafer based on the optical character read in real-time at the apparatus.

Apparatus and methods for determining wafer characters are disclosed. In one example, an apparatus is disclosed. The apparatus includes: a processing tool configured to process a semiconductor wafer; a device configured to read an optical character disposed on the semiconductor wafer while the semiconductor wafer is located at the apparatus for wafer fabrication; and a controller configured to determine whether the optical character matches a predetermined character corresponding to the semiconductor wafer based on the optical character read in real-time at the apparatus.