Patent classifications
C07C309/17
SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
A salt represented by formula (1), an acid generator, a resin, and a resist composition including the same.
##STR00001##
wherein R.sup.1 to R.sup.3 each represent a hydroxy group, etc.; R.sup.4 to R.sup.9 each represent a halogen atom, etc.; R.sup.10 represents an acid-labile group; A.sup.1 to A.sup.3 each represent a hydrocarbon group; m1 represents an integer of 1 to 5, m2, m3, m8 and m9 represent an integer of 0 to 5, m4 to m7 represent an integer of 0 to 4, 1≤m1+m7≤5, 0≤m2+m8≤5, 0≤m3+m9≤5; Q.sup.b1 and Q.sup.b2 each represent a hydrogen atom, etc.; L.sup.b1 represents a saturated hydrocarbon group; Y.sup.b1 represents a single bond or an alicyclic hydrocarbon group; R.sup.bb1 represents a hydrogen atom, etc.; X.sup.10 represents a single bond, etc.; and L.sup.10 represents a single bond or a hydrocarbon group.
SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
A salt represented by formula (1), an acid generator, a resin, and a resist composition including the same.
##STR00001##
wherein R.sup.1 to R.sup.3 each represent a hydroxy group, etc.; R.sup.4 to R.sup.9 each represent a halogen atom, etc.; R.sup.10 represents an acid-labile group; A.sup.1 to A.sup.3 each represent a hydrocarbon group; m1 represents an integer of 1 to 5, m2, m3, m8 and m9 represent an integer of 0 to 5, m4 to m7 represent an integer of 0 to 4, 1≤m1+m7≤5, 0≤m2+m8≤5, 0≤m3+m9≤5; Q.sup.b1 and Q.sup.b2 each represent a hydrogen atom, etc.; L.sup.b1 represents a saturated hydrocarbon group; Y.sup.b1 represents a single bond or an alicyclic hydrocarbon group; R.sup.bb1 represents a hydrogen atom, etc.; X.sup.10 represents a single bond, etc.; and L.sup.10 represents a single bond or a hydrocarbon group.
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
An actinic ray-sensitive or radiation-sensitive resin composition includes a compound represented by General Formula (I) and an acid-decomposable resin.
M.sub.1.sup.+A.sup.−-L-B.sup.−M.sub.2.sup.+ (I)
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
An actinic ray-sensitive or radiation-sensitive resin composition includes a compound represented by General Formula (I) and an acid-decomposable resin.
M.sub.1.sup.+A.sup.−-L-B.sup.−M.sub.2.sup.+ (I)
Resist composition, method of forming resist pattern, compound, and acid generator
A resist composition containing a compound represented by the general formula (bd1-1), (bd1-2) or (bd1-3); in the formula, Rx.sup.1 to Rx.sup.4 represent a hydrocarbon group or a hydrogen atom or may be mutually bonded to form a ring structure; Ry.sup.1 to Ry.sup.2 represent a hydrocarbon group or a hydrogen atom or may be mutually bonded to form a ring structure, Rz.sup.1 to Rz.sup.4 represent a hydrocarbon group or a hydrogen atom or may be mutually bonded to form a ring structure. At least one of Rx.sup.1 to Rx.sup.4, Ry.sup.1 to Ry.sup.2 and Rz.sup.1 to Rz.sup.4 has an anion group, M.sub.1.sup.m+ represents a sulfonium cation having a sulfonyl group, R.sup.001 to R.sup.003 each independently represent a monovalent organic group; provided that at least one of R.sup.001 to R.sup.003 is an organic group having an acid dissociable group; and M.sub.3.sup.m+ represents an m-valent organic cation having an electron-withdrawing group. ##STR00001##
SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
A salt represented by formula (I), an acid generator and a resist composition:
##STR00001##
wherein R.sup.1, R.sup.2 and R.sup.3 each represent a hydroxy group, —O—R.sup.10, —O—CO—O—R.sup.10 or —O-L.sup.1-CO—O—R.sup.10, L.sup.1 represents an alkanediyl group, R.sup.4, R.sup.5, R.sup.6, R.sup.7, R.sup.8 and R.sup.9 each represent a halogen atom, an alkyl fluoride group or a hydrocarbon group, R.sup.10 represents an acid-labile group, X.sup.1, X.sup.2 and X.sup.3 each independently represent an oxygen atom or a sulfur atom, m1 is an integer of 1 to 5, m2, m3, m8 and m9 represent an integer of 0 to 5, m4, m5, m6 and m7 represent an integer of 0 to 4, in which 1≤m1+m7≤5, 0≤m2+m8≤5, 0≤m3+m9≤5, and AI.sup.− represents an organic anion.
ANTI-STAINING AGENT
The present invention is an anti-staining agent containing, (a) a sulfosuccinic acid branched alkyl ester in which the branched alkyl group is a branched alkyl group with 8 or more and 13 or less carbons [hereinafter referred to as component (a)]. Further, the present invention is an anti-staining method including bringing a treatment liquid into contact with an object to be treated, the treatment liquid containing component (a).
ANTI-STAINING AGENT
The present invention is an anti-staining agent containing, (a) a sulfosuccinic acid branched alkyl ester in which the branched alkyl group is a branched alkyl group with 8 or more and 13 or less carbons [hereinafter referred to as component (a)]. Further, the present invention is an anti-staining method including bringing a treatment liquid into contact with an object to be treated, the treatment liquid containing component (a).
Process for producing surfactant having two head groups and a single tail group per molecule
A process for producing a surfactant having two head groups and a single tail group per molecule, including steps of: producing a compound of Formula (1) from ethanol and carbon disulfide; producing a compound of Formula (2) from a carboxylic acid and bromine; producing a compound of Formula (3) from the compound of Formula (2) and methanol; producing a compound of Formula (4) from the compound of Formula (1) and the compound of Formula (3); and producing a compound of Formula (5) from the compound of Formula (4) by a direct oxidation process or by a peracid oxidation process. The surfactant produced by the process has lower critical micelle concentration and enables a lower surface tension of a liquid as compared with prior surfactants with two head groups per molecule, thereby enabling the amount of surfactant required and thus the cost to be substantially reduced.
Process for producing surfactant having two head groups and a single tail group per molecule
A process for producing a surfactant having two head groups and a single tail group per molecule, including steps of: producing a compound of Formula (1) from ethanol and carbon disulfide; producing a compound of Formula (2) from a carboxylic acid and bromine; producing a compound of Formula (3) from the compound of Formula (2) and methanol; producing a compound of Formula (4) from the compound of Formula (1) and the compound of Formula (3); and producing a compound of Formula (5) from the compound of Formula (4) by a direct oxidation process or by a peracid oxidation process. The surfactant produced by the process has lower critical micelle concentration and enables a lower surface tension of a liquid as compared with prior surfactants with two head groups per molecule, thereby enabling the amount of surfactant required and thus the cost to be substantially reduced.