Examples of a monolithic phosphor composite for measuring a parameter of an object are disclosed. The ceramic metal oxide phosphor composite is used in an optical device for measuring the parameter of the measuring object. The device comprises a fiber optic probe with a light guide, a light source operatively coupled to the fiber optic probe to provide excitation light into the light guide, a monolithic ceramic metal oxide phosphor composite functionally coupled to a tip of the fiber optic probe, a sensor operatively coupled to the fiber optic probe to detect the emitted light and a processing unit functionally coupled to the sensor to process the emitted light. The monolithic ceramic metal oxide phosphor composite can be embedded in a notch made into the object or can be adhered to a surface of the object with a binder. When the monolithic ceramic metal oxide phosphor composite is illuminated with the excitation light it emits light in a wavelength different from the excitation light and a change in emission intensity at a single wavelength or the change in intensity ratio of two or more wavelengths, a shift in emission wavelength peak or a decay time of the phosphor luminescence is a function of the measuring parameter.

A white LED lamp including: a conductive portion; a light emitting diode chip mounted on the conductive portion, for emitting a primary light having a peak wavelength of 360 nm to 420 nm; a transparent resin layer including a first hardened transparent resin, for sealing the light emitting diode chip; and a phosphor layer covering the transparent resin layer, the phosphor layer being formed by dispersing a phosphor powder into a second hardened transparent resin, and the phosphor powder receiving the primary light and radiating a secondary light having a wavelength longer than that of the primary light. An energy of the primary light contained in the radiated secondary light is 0.4 mW/lm or less.

A phosphor of an embodiment has a composition represented by a composition formula: Na.sub.xRM.sub.yS.sub.zO.sub.a, where R represents at least one element selected from the group consisting of Y, La, Gd, and Lu, M represents at least one element selected from the group consisting of Bi, Ce, Eu, and Pr, x is an atomic ratio satisfying 0.93<x<1.07, y is an atomic ratio satisfying 0.00002<y<0.01, z is an atomic ratio satisfying 1.9<z<2.1, and a is an atomic ratio satisfying 0.001<a<0.05.

Examples of a monolithic phosphor composite for measuring a parameter of an object are disclosed. The composite comprises a thermographic phosphor and a metal oxide material that are dried and calcinated at high temperatures to form a ceramic metal oxide phosphor composite. The ceramic metal oxide phosphor composite is used in an optical device for measuring the parameter of the measuring object. The device comprises a fiber optic probe with a light guide, a light source operatively coupled to the fiber optic probe to provide excitation light into the light guide, a monolithic ceramic metal oxide phosphor composite functionally coupled to a tip of the fiber optic probe, a sensor operatively coupled to the fiber optic probe to detect the emitted light and a processing unit functionally coupled to the sensor to process the emitted light. When the monolithic ceramic metal oxide phosphor composite is illuminated with the excitation light it emits light in a wavelength different from the excitation light and a change in emission intensity at a single wavelength or the change in intensity ratio of two or more wavelengths, a shift in emission wavelength peak or a decay time of the phosphor luminescence is a function of the measuring parameter.

A dispersion of particles is provided that each contain at least one ferromagnetic domain and at least one phosphor domain having a stimulation wavelength, a glow persistence of at least 5 seconds and a visible wavelength emission. A polymeric resin that is transmissive of the stimulation wavelength and the visible wavelength emission coats the ferromagnetic and phosphor domains to define each particle size. A method of non-destructively inspecting a test article applies a dispersion of these particles to a surface of the test article. A magnetic field is then induced including the test article. The surface of the test article is exposed to incident energy adapted to stimulate phosphorescence of the dispersion of particles. With the incident energy exposure ceased, the position of the dispersion of particles on the surface of the test article is imaged. An inspection system for non-destructively inspecting a test article is also provided.

A scintillator panel includes at least one light emitting layer and at least one non-light emitting layer laminated, wherein the light emitting layer contains phosphor particles, and when the thickness of the light emitting layer is represented by A, a relationship among a cumulative 50% particle diameter D.sub.50 of the phosphor particles based on volume average, a cumulative 90% particle diameter D.sub.90 of the phosphor particles based on volume average, and the thickness A satisfies,
D.sub.50<A and D.sub.90<2A.

A light emitting device includes: a first white light source which includes N pieces of first white light emitting diodes and emits a first white light; and a second white light source which includes M pieces of second white light emitting diodes and a first resistance element electrically connected in series to the second white light emitting diodes and having a first resistance value, is electrically connected in parallel to the first white light source, and emits a second white light, the light emitting device emitting a mixed white light of the first white light and the second white light. The drive voltage of the first white light source is higher than a drive voltage of the second white light source, and a color temperature of the mixed white light is higher as a total luminous flux of the mixed white light is higher.

A light emitting device includes: a first white light source which includes N pieces of first white light emitting diodes and emits a first white light; and a second white light source which includes M pieces of second white light emitting diodes and a first resistance element electrically connected in series to the second white light emitting diodes and having a first resistance value, is electrically connected in parallel to the first white light source, and emits a second white light, the light emitting device emitting a mixed white light of the first white light and the second white light. The drive voltage of the first white light source is higher than a drive voltage of the second white light source, and a color temperature of the mixed white light is higher as a total luminous flux of the mixed white light is higher.

An enhanced vision system includes an image intensifier that includes a phosphor screen. The phosphor screen includes a thin-film phosphor layer deposited, patterned, transferred, or otherwise disposed on the substrate using a thin-film deposition technique. A conductive layer is deposited across at least a portion of the phosphor layer. The relatively smooth morphology of the phosphor layer beneficially permits the use of a relatively thin conductive layer. The use of a relatively thin conductive layer advantageously reduces the operating voltage between an electron multiplier and the phosphor screen. A secondary electron emitter may be disposed across at least a portion of the conductive layer.

An enhanced vision system includes an image intensifier that includes a phosphor screen. The phosphor screen includes a thin-film phosphor layer deposited, patterned, transferred, or otherwise disposed on the substrate using a thin-film deposition technique. A conductive layer is deposited across at least a portion of the phosphor layer. The relatively smooth morphology of the phosphor layer beneficially permits the use of a relatively thin conductive layer. The use of a relatively thin conductive layer advantageously reduces the operating voltage between an electron multiplier and the phosphor screen. A secondary electron emitter may be disposed across at least a portion of the conductive layer.