A solid state lamp includes a connector and a bulb portion with multiple strips.

A solid state lamp includes a connector and a bulb portion with multiple strips.

A solid state lamp includes a connector and a bulb portion with multiple strips.

Examples disclosed herein relate to a method and apparatus for inspecting lamp dimensions. The method includes determining an actual measurement of a lamp. The lamp is configured to heat a substrate in a substrate processing apparatus. A window is generated, the window having a width and a height. The window is based upon a target measurement of the lamp. The method further includes generating a deviation based upon a difference between an image of the actual measurement and the window. The deviation is compared to a first threshold. The lamp is rejected if the deviation is outside the first threshold.

A solid state lamp includes a connector and a bulb portion with multiple strips.

A solid state lamp includes a connector and a bulb portion with multiple strips.

Support structures and lighting systems including the support structure and a lighting device are described. A support structure includes an inner housing portion, an outer housing portion and connection members. The inner housing portion is transparent and has at least one portion shaped to conform to the lighting device. The outer housing portion includes at least a bottom wall, a first side wall and a second side wall, each having reflective inner surfaces, to form a container. The connection members are transparent and mechanically connected between the inner housing portion and the outer housing portion to support the inner housing portion and divide a region of the container between the inner housing portion and the outer housing portion into first cavities, each enclosed by at least one of the bottom wall, the first side wall or the second side wall and at least one of the connection members.

Examples disclosed herein relate to a method and apparatus for inspecting lamp dimensions. The method includes determining an actual measurement of a lamp. The lamp is configured to heat a substrate in a substrate processing apparatus. A window is generated, the window having a width and a height. The window is based upon a target measurement of the lamp. The method further includes generating a deviation based upon a difference between an image of the actual measurement and the window. The deviation is compared to a first threshold. The lamp is rejected if the deviation is outside the first threshold.

A solid state lamp includes a connector and a bulb portion with multiple strips.

A solid state lamp includes a connector and a bulb portion with multiple strips.