A method of predicting the gravity-free shape of a glass sheet and a method of managing the quality of a glass sheet based on the gravity-free shape of the glass sheet. The initial shape of a glass sheet is determined. When the glass sheet is flattened, values of stress at a plurality of locations in the glass sheet are obtained. A shape that the glass sheet will have when the flattened glass sheet is deformed such that the values of stress are zero is predicted as a stress-induced shape and a gravity-free shape of the glass sheet is predicted by combining the initial shape and the stress-induced shape. Quality management is performed on glass sheets based on gravity-free shapes thereof predicted using the method of predicting the gravity-free shape of a glass sheet.

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

A meta projector includes an edge emitting device configured to emit light through a side surface thereof, a meta-structure layer spaced apart from the upper surface of the edge emitting device that includes a plurality of nanostructures having a sub-wavelength shape dimension smaller than a wavelength of the light emitted from the edge emitting device, and a path changing member configured to change a path of the light emitted from the edge emitting device so as to direct the path toward the meta-structure layer. The meta projector may thus be configured to emit a light pattern of structured light, based on directing the light emitted from the edge emitting device through the meta-structure layer, while having a relatively compact device size.

This invention concerns improvements in the inspection, assessment and re-working of manufactured components such as nozzle guide vanes (NGVs) and blades, in particular by improving the comparison of the component with nominal data. Dimensional data of a physical component is obtained and used to create a virtual digitized model of the component which is aligned with a nominal CAD model of the component in a virtual space. The correspondence is assessed and used to adjust weightings of different regions of the digitized model to improve the alignment. This process is repeated within the digital space until either conformance is reached or it is determined that this is not possible.

This invention concerns improvements in the inspection, assessment and re-working of manufactured components such as nozzle guide vanes (NGVs) and blades, in particular by improving the comparison of the component with nominal data. Dimensional data of a physical component is obtained and used to create a virtual digitized model of the component which is aligned with a nominal CAD model of the component in a virtual space. The correspondence is assessed and used to adjust weightings of different regions of the digitized model to improve the alignment. This process is repeated within the digital space until either conformance is reached or it is determined that this is not possible.

In some example embodiments, there may be provided a metasurface for edge detection. The metasurface may include a nano or subwavelength surface structure configured to provide an output having optical separation to enable detection of at least one edge of an object being illuminated, wherein the optical separation is based on a phase profile configured on the nano or subwavelength surface structure of the metasurface.

In some example embodiments, there may be provided a metasurface for edge detection. The metasurface may include a nano or subwavelength surface structure configured to provide an output having optical separation to enable detection of at least one edge of an object being illuminated, wherein the optical separation is based on a phase profile configured on the nano or subwavelength surface structure of the metasurface.

Systems and methods for reducing interference between multiple infra-red depth cameras are described. In an embodiment, the system comprises multiple infra-red sources, each of which projects a structured light pattern into the environment. A controller is used to control the sources in order to reduce the interference caused by overlapping light patterns. Various methods are described including: cycling between the different sources, where the cycle used may be fixed or may change dynamically based on the scene detected using the cameras; setting the wavelength of each source so that overlapping patterns are at different wavelengths; moving source-camera pairs in independent motion patterns; and adjusting the shape of the projected light patterns to minimize overlap. These methods may also be combined in any way. In another embodiment, the system comprises a single source and a mirror system is used to cast the projected structured light pattern around the environment.

Systems and methods for reducing interference between multiple infra-red depth cameras are described. In an embodiment, the system comprises multiple infra-red sources, each of which projects a structured light pattern into the environment. A controller is used to control the sources in order to reduce the interference caused by overlapping light patterns. Various methods are described including: cycling between the different sources, where the cycle used may be fixed or may change dynamically based on the scene detected using the cameras; setting the wavelength of each source so that overlapping patterns are at different wavelengths; moving source-camera pairs in independent motion patterns; and adjusting the shape of the projected light patterns to minimize overlap. These methods may also be combined in any way. In another embodiment, the system comprises a single source and a mirror system is used to cast the projected structured light pattern around the environment.

A surface shape measuring apparatus for measuring a specular surface includes an illuminator configured to illuminate the specular surface with a first light pattern, an imaging device configured to capture an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface, and a processing apparatus configured to acquire a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and to output information related to a surface shape of the specular surface acquired from the positional deviation amount.