G01B11/22

INSPECTION OF REFLECTIVE SURFACES BASED ON IMAGE CORRELATION
20230214988 · 2023-07-06 ·

A system for inspecting a reflective surface includes a first imaging assembly configured to take a first image of the reflective surface, the first image including depth information, a second imaging assembly configured to take a second image of the reflective surface, the second image including contrast information, and a processor configured to acquire the first image and the second image. The processor is configured to perform: estimating a depth profile of the surface based on the depth information, correlating the depth profile with the second image, and identifying a feature of the reflective surface based on the correlation.

WAFER LEVEL OPTICS FOR STRUCTURED LIGHT GENERATION
20230216269 · 2023-07-06 ·

Embodiments of the present disclosure relate to a projector that is structured to be incorporated into a small form factor electronic device. In some embodiments, the projector is integrated in a depth camera assembly used for eye tracking and/or determining depth of objects in a local area. The projector includes a vertical cavity surface emitting laser (VCSEL) array and a substrate coupled to the VCSEL array. The VCSEL array is a bottom emitting VCSEL array formed with one or more VCSELs. The substrate includes a plurality of optical features to generate one or more SL patterns from the lights that are emitted from the VCSELs.

WAFER LEVEL OPTICS FOR STRUCTURED LIGHT GENERATION
20230216269 · 2023-07-06 ·

Embodiments of the present disclosure relate to a projector that is structured to be incorporated into a small form factor electronic device. In some embodiments, the projector is integrated in a depth camera assembly used for eye tracking and/or determining depth of objects in a local area. The projector includes a vertical cavity surface emitting laser (VCSEL) array and a substrate coupled to the VCSEL array. The VCSEL array is a bottom emitting VCSEL array formed with one or more VCSELs. The substrate includes a plurality of optical features to generate one or more SL patterns from the lights that are emitted from the VCSELs.

Hand-held tire scanner

A hand-held device for obtaining a three-dimensional topological surface profile of a tire, the device comprising: a base comprising an aperture; a light source arranged in use to generate an elongate pattern of light, and to project said pattern through the aperture onto a rolling surface of the tire; a detector arranged to image a region of the rolling surface of the tire; a plurality of pairs of guide wheels mounted on respective axles mounted on the base, wherein the guide wheels on adjacent axles are linked by gears; and a rotary encoder arranged to generate a signal corresponding to rotation of an axle.

Hand-held tire scanner

A hand-held device for obtaining a three-dimensional topological surface profile of a tire, the device comprising: a base comprising an aperture; a light source arranged in use to generate an elongate pattern of light, and to project said pattern through the aperture onto a rolling surface of the tire; a detector arranged to image a region of the rolling surface of the tire; a plurality of pairs of guide wheels mounted on respective axles mounted on the base, wherein the guide wheels on adjacent axles are linked by gears; and a rotary encoder arranged to generate a signal corresponding to rotation of an axle.

Tracking cementing plug position during cementing operations

Aspects of the subject technology relate to systems and methods for determining positions of cementing plugs during a cementing process. Systems and methods are provided for determining a length of an optical fiber line deployed into a wellbore for a cementing process, measuring signal intensity data as a function of distance from the optical fiber line, the optical fiber line being attached to a lower cementing plug and an upper cementing plug, the upper cementing plug being attached to the optical fiber line by an attenuation assembly, generating signal intensity profiles based on the signal intensity data as a function of a round trip delay of a light signal in the optical fiber line, and determining positions of the lower cementing plug and the upper cementing plug based on the signal intensity profiles of the optical fiber line.

Tracking cementing plug position during cementing operations

Aspects of the subject technology relate to systems and methods for determining positions of cementing plugs during a cementing process. Systems and methods are provided for determining a length of an optical fiber line deployed into a wellbore for a cementing process, measuring signal intensity data as a function of distance from the optical fiber line, the optical fiber line being attached to a lower cementing plug and an upper cementing plug, the upper cementing plug being attached to the optical fiber line by an attenuation assembly, generating signal intensity profiles based on the signal intensity data as a function of a round trip delay of a light signal in the optical fiber line, and determining positions of the lower cementing plug and the upper cementing plug based on the signal intensity profiles of the optical fiber line.

Measuring Device and Method of Determining a Depth of Field of an Optical Setup
20230003512 · 2023-01-05 ·

The present invention relates to a measuring device (10) and a method for determining a depth of field of an optical structure (100). In this case, the measuring device comprises a device body (12) with a measuring axis (14), the device body (12) being formed such that, in a measuring position, it can be placed in a stationary manner on a deposit plane of the optical structure such that the measuring axis (14) of the device body (12) coincides with an optical axis of the optical structure, wherein the device body (12) has a measurement scale (18) arranged along a scale line (16) such that the scale line (16) encloses with the direction of the measuring axis (14) a scale angle φ greater than 0° and less than 90° and the measurement scale (18) can be optically detected in the measuring position of the device body (12) by the optical structure (100) for determining the depth of field.

Measuring Device and Method of Determining a Depth of Field of an Optical Setup
20230003512 · 2023-01-05 ·

The present invention relates to a measuring device (10) and a method for determining a depth of field of an optical structure (100). In this case, the measuring device comprises a device body (12) with a measuring axis (14), the device body (12) being formed such that, in a measuring position, it can be placed in a stationary manner on a deposit plane of the optical structure such that the measuring axis (14) of the device body (12) coincides with an optical axis of the optical structure, wherein the device body (12) has a measurement scale (18) arranged along a scale line (16) such that the scale line (16) encloses with the direction of the measuring axis (14) a scale angle φ greater than 0° and less than 90° and the measurement scale (18) can be optically detected in the measuring position of the device body (12) by the optical structure (100) for determining the depth of field.

Multimodal foreground background segmentation

The subject disclosure is directed towards a framework that is configured to allow different background-foreground segmentation modalities to contribute towards segmentation. In one aspect, pixels are processed based upon RGB background separation, chroma keying, IR background separation, current depth versus background depth and current depth versus threshold background depth modalities. Each modality may contribute as a factor that the framework combines to determine a probability as to whether a pixel is foreground or background. The probabilities are fed into a global segmentation framework to obtain a segmented image.