Patent classifications
G01B11/24
MOUNTING SYSTEM FOR OPTICAL ELEMENT OF INTRAORAL SCANNER
A scanner for scanning a dental site comprises a base, a detector mounted to the base, and an optical element to redirect light reflected off of the dental site towards the detector along a detection axis in a first direction. Two or more flexures couple the optical element to the base, wherein the two or more flexures maintain an alignment of the optical element to the detector with changes in temperature.
LIGHT EMITTING APPARATUS AND INFORMATION PROCESSING APPARATUS
A light emitting apparatus includes a substrate and light emitting elements including at least one light emitting element that is provided, on the substrate, in each region of plural regions and that emits irradiation light toward a target object, the regions including a first region and a second region and being isolated from each other to be arranged one-dimensionally or two-dimensionally. In the plural regions, an irradiation light amount of at least one light emitting element provided in the first region that is a region located at an end in an arrangement direction is larger than an irradiation light amount of at least one light emitting element provided in the second region that is a region located at a place other than the end in the arrangement direction.
LIGHT EMITTING APPARATUS AND INFORMATION PROCESSING APPARATUS
A light emitting apparatus includes a substrate and light emitting elements including at least one light emitting element that is provided, on the substrate, in each region of plural regions and that emits irradiation light toward a target object, the regions including a first region and a second region and being isolated from each other to be arranged one-dimensionally or two-dimensionally. In the plural regions, an irradiation light amount of at least one light emitting element provided in the first region that is a region located at an end in an arrangement direction is larger than an irradiation light amount of at least one light emitting element provided in the second region that is a region located at a place other than the end in the arrangement direction.
ELECTRONIC DEVICE
An electronic device includes at least one optical lens assembly. The optical lens assembly includes four lens elements, and the four lens elements are, in order from an outside to an inside, a first lens element, a second lens element, a third lens element and a fourth lens element. The first lens element has an outside surface being convex in a paraxial region thereof. The second lens element has an inside surface being convex in a paraxial region thereof. The fourth lens element has an inside surface being concave in a paraxial region thereof, wherein at least one of an outside surface and the inside surface of the fourth lens element includes at least one critical point in an off-axis region thereof.
METROLOGY METHOD AND SYSTEM FOR CRITICAL DIMENSIONS BASED ON DISPERSION RELATION IN MOMENTUM SPACE
Embodiments of the present disclosure relate to a metrology method and system for critical dimensions based on a dispersion relation in momentum space. The method comprises: establishing, in accordance with parameters of incident light and a modeled geometric topography of the target to be measured, a simulation dataset associated with a dispersion curve of the target to be measured in momentum space; training a neural-network-based prediction model based on the simulation dataset; obtaining, based on an actual measurement of the target to be measured by incident light, a dispersion relation pattern of the target to be measured in momentum space, wherein the dispersion relation pattern at least indicates a dispersion curve associated with the critical dimensions of the target to be measured; extracting, based on the dispersion relation pattern, features related to the dispersion curve from the dispersion relation pattern via the trained prediction model, to determine an estimated value associated with at least one critical dimension of the target to be measured. According to the method disclosed herein, at least one critical dimension is measured in a more efficient, economical and accurate way.
FILLING RATE MEASUREMENT METHOD, INFORMATION PROCESSING DEVICE, AND RECORDING MEDIUM
A filling rate measurement method includes: obtaining a space three-dimensional model generated by measuring a storage through an opening of the storage using a range sensor facing the storage; obtaining a storage three-dimensional model that is a three-dimensional model of the storage; extracting a target part that is a part of a measurement target in the space three-dimensional model; identifying a line segment indicating a shape of the opening on a two-dimensional image of the opening which is generated; estimating a target three-dimensional model that is a three-dimensional model of the measurement target based on the target part and a three-dimensional coordinate system with respect to the position of the opening on a three-dimensional space identified based on the position of the range sensor, the specific direction, and the shape of the opening; and calculating a filling rate of the measurement target with respect to the storage space.
Measurement apparatus
A measurement apparatus according to an embodiment of the present technology includes a light source, a filling portion, and a detector. The light source emits illumination light. The filling portion includes a first surface portion and a second surface portion which are provided on an optical path of the illumination light and are opposite to each other, the filling portion enabling a cavity between the first and second surface portions to be filled with liquid including a cell. The detector detects an interference fringe of the illumination light passing through the cavity, the interference fringe being caused by the liquid including the cell.
INSPECTION OF REFLECTIVE SURFACES BASED ON IMAGE CORRELATION
A system for inspecting a reflective surface includes a first imaging assembly configured to take a first image of the reflective surface, the first image including depth information, a second imaging assembly configured to take a second image of the reflective surface, the second image including contrast information, and a processor configured to acquire the first image and the second image. The processor is configured to perform: estimating a depth profile of the surface based on the depth information, correlating the depth profile with the second image, and identifying a feature of the reflective surface based on the correlation.
Hub for device navigation with optical shape sensed guidewire
A hub for an optical shape sensing reference includes a hub body (606) configured to receive an elongated flexible instrument (622) with a shape sensing system coupled to the flexible instrument within a path formed in the hub body. A profile (630) is formed in the hub body in the path to impart a hub template configured to distinguish a portion of the elongated flexible instrument within the hub in shape sensing data. An attachment mechanism (616) is formed on the hub body to detachably connect the hub body to a deployable instrument such that a change in a position of the hub body indicates a corresponding change in the deployable device.
Hub for device navigation with optical shape sensed guidewire
A hub for an optical shape sensing reference includes a hub body (606) configured to receive an elongated flexible instrument (622) with a shape sensing system coupled to the flexible instrument within a path formed in the hub body. A profile (630) is formed in the hub body in the path to impart a hub template configured to distinguish a portion of the elongated flexible instrument within the hub in shape sensing data. An attachment mechanism (616) is formed on the hub body to detachably connect the hub body to a deployable instrument such that a change in a position of the hub body indicates a corresponding change in the deployable device.