A method for detecting at least one characteristic parameter of a closure element (12) closing an opening. By means of a handling device (10), a movement is imposed on the closure element (12), wherein at least the interacting force between the closure element and the handing device during the movement is determined by means of a first sensor (20) integrated in the handling device, and position changes of the closure element during the movement sequence are detected by means of a second sensor (26).

A device for determining an angle between two workpiece surfaces, comprising a transmitter for producing a light beam, a continuously rotating directional rotor for emitting the produced light beam in a rotating emission direction perpendicular to an axis of rotation of the directional rotor, a receiver for receiving a reflected light beam when the emitted light beam is reflected antiparallel to the emission direction by one of the two workpiece surfaces, an emission angle sensor unit for determining emission angles of the emitted light beam at which the receiver receives the reflected light beam, a calibrating unit for determining at least calibration parameters, a memory unit for storing the calibration parameters and an error model, and an evaluation unit configured to determine the angle as a function of the determined emission angles of the light beam emitted by the directional rotor, the stored calibration parameters and the stored error model.

A device for determining an angle between two workpiece surfaces, comprising a transmitter for producing a light beam, a continuously rotating directional rotor for emitting the produced light beam in a rotating emission direction perpendicular to an axis of rotation of the directional rotor, a receiver for receiving a reflected light beam when the emitted light beam is reflected antiparallel to the emission direction by one of the two workpiece surfaces, an emission angle sensor unit for determining emission angles of the emitted light beam at which the receiver receives the reflected light beam, a calibrating unit for determining at least calibration parameters, a memory unit for storing the calibration parameters and an error model, and an evaluation unit configured to determine the angle as a function of the determined emission angles of the light beam emitted by the directional rotor, the stored calibration parameters and the stored error model.

A device for measuring an angular inclination and angular inclination fluctuations of an electromagnetic radiation beam is adapted to detect the incidence angular inclination and the relative fluctuations with respect to a nominal axis of propagation of the beam, in a desired detection plane including the nominal propagation axis. A system and a method for measuring an angular inclination and angular inclination fluctuations of an electromagnetic radiation beam uses the device for measuring an angular inclination and angular inclination fluctuations of an electromagnetic radiation beam. A method measures a spatial shift of a focused laser beam, at the focusing point, with respect to a reference optical axis.

A method for estimating an effective length of a first vehicle segment of a vehicle combination, the vehicle combination comprising a towing vehicle which is connected to the first vehicle segment via a first articulation joint and a perception sensor mounted on one of the towing vehicle and the first vehicle segment and arranged to obtain an image of the other one of the towing vehicle and the first vehicle segment; the method comprising identifying that the vehicle combination is provided in a first steady vehicle state, identifying that a turning and driving manoeuvre is initiated, identifying when the vehicle combination reaches a second steady vehicle state, determining a time period required for driving the vehicle combination from the first steady vehicle state to the second steady vehicle state, and estimating the effective length by use of the time period, the specific angular change, and the specific speed.

A method for estimating an effective length of a first vehicle segment of a vehicle combination, the vehicle combination comprising a towing vehicle which is connected to the first vehicle segment via a first articulation joint and a perception sensor mounted on one of the towing vehicle and the first vehicle segment and arranged to obtain an image of the other one of the towing vehicle and the first vehicle segment; the method comprising identifying that the vehicle combination is provided in a first steady vehicle state, identifying that a turning and driving manoeuvre is initiated, identifying when the vehicle combination reaches a second steady vehicle state, determining a time period required for driving the vehicle combination from the first steady vehicle state to the second steady vehicle state, and estimating the effective length by use of the time period, the specific angular change, and the specific speed.

A position determination device, including a main body, a first laser emitter disposed on at least a portion of the main body to emit a first laser beam pointing in a first direction, a second laser emitter hingedly disposed on at least a portion of the main body to emit a second laser beam pointing in the first direction, such that the first laser emitter and the second laser emitter determine at least one of a size of a conduit, an angle to install the conduit, a distance of the first laser emitter to a wall, and a distance of the second laser emitter to the wall, and a conduit attachment unit removably connected to at least a portion of the main body to connect the main body to the conduit.

A position determination device, including a main body, a first laser emitter disposed on at least a portion of the main body to emit a first laser beam pointing in a first direction, a second laser emitter hingedly disposed on at least a portion of the main body to emit a second laser beam pointing in the first direction, such that the first laser emitter and the second laser emitter determine at least one of a size of a conduit, an angle to install the conduit, a distance of the first laser emitter to a wall, and a distance of the second laser emitter to the wall, and a conduit attachment unit removably connected to at least a portion of the main body to connect the main body to the conduit.

Methods and systems for characterizing dimensions and material properties of semiconductor devices by transmission small angle x-ray scatterometry (TSAXS) systems having relatively small tool footprint are described herein. The methods and systems described herein enable Q space resolution adequate for metrology of semiconductor structures with reduced optical path length. In general, the x-ray beam is focused closer to the wafer surface for relatively small targets and closer to the detector for relatively large targets. In some embodiments, a high resolution detector with small point spread function (PSF) is employed to mitigate detector PSF limits on achievable Q resolution. In some embodiments, the detector locates an incident photon with sub-pixel accuracy by determining the centroid of a cloud of electrons stimulated by the photon conversion event. In some embodiments, the detector resolves one or more x-ray photon energies in addition to location of incidence.

Methods and systems for characterizing dimensions and material properties of semiconductor devices by transmission small angle x-ray scatterometry (TSAXS) systems having relatively small tool footprint are described herein. The methods and systems described herein enable Q space resolution adequate for metrology of semiconductor structures with reduced optical path length. In general, the x-ray beam is focused closer to the wafer surface for relatively small targets and closer to the detector for relatively large targets. In some embodiments, a high resolution detector with small point spread function (PSF) is employed to mitigate detector PSF limits on achievable Q resolution. In some embodiments, the detector locates an incident photon with sub-pixel accuracy by determining the centroid of a cloud of electrons stimulated by the photon conversion event. In some embodiments, the detector resolves one or more x-ray photon energies in addition to location of incidence.