An elongated bending beam for a swivel bending machine has an approximately C-shaped beam cross section and two bending tools, which are opposite one another relative to a preferably horizontal central plane, and which run facing one another in the longitudinal direction of the bending beam, between which a workpiece portion of a workpiece to be bent can be introduced. An angle-measuring system for contactlessly measuring a bending angle is arranged inside the C-shape beam cross section, with which a bending angle can be measured relative to a reference plane at a workpiece section bent by one of the bending tools. The angle-measuring system also includes a first angle-measuring unit arranged below the central plane and having a first measuring region positioned substantially above the central plane, and a second angle-measuring unit arranged above the central plane and having a second measuring region positioned substantially below the central plane.

An elongated bending beam for a swivel bending machine has an approximately C-shaped beam cross section and two bending tools, which are opposite one another relative to a preferably horizontal central plane, and which run facing one another in the longitudinal direction of the bending beam, between which a workpiece portion of a workpiece to be bent can be introduced. An angle-measuring system for contactlessly measuring a bending angle is arranged inside the C-shape beam cross section, with which a bending angle can be measured relative to a reference plane at a workpiece section bent by one of the bending tools. The angle-measuring system also includes a first angle-measuring unit arranged below the central plane and having a first measuring region positioned substantially above the central plane, and a second angle-measuring unit arranged above the central plane and having a second measuring region positioned substantially below the central plane.

Systems and methods for optically measuring a position of a measurement surface relative to a reference position. The system is a wireless network comprising a centrally located data acquisition computer and a multiplicity of remotely located sensor modules mounted at different locations within wireless communication range of a central receiver. Each sensor module is mounted to a clamp that is made specific to a control surface location and embedded with an RFID tag to denote clamp location. The optical components of the sensor modules are selected to enable indication of the linear position of a measurement surface relative to a reference position and then broadcast the measurement results. The broadcast results are received by the central receiver and processed by the data acquisition computer, which hosts human interface software that displays measurement data.

Systems and methods for optically measuring a position of a measurement surface relative to a reference position. The system is a wireless network comprising a centrally located data acquisition computer and a multiplicity of remotely located sensor modules mounted at different locations within wireless communication range of a central receiver. Each sensor module is mounted to a clamp that is made specific to a control surface location and embedded with an RFID tag to denote clamp location. The optical components of the sensor modules are selected to enable indication of the linear position of a measurement surface relative to a reference position and then broadcast the measurement results. The broadcast results are received by the central receiver and processed by the data acquisition computer, which hosts human interface software that displays measurement data.

A digital slope meter includes: a shaft extended in a longitudinal direction thereof and having a rolling groove formed on top thereof in the longitudinal direction thereof to allow a golf ball placed thereon to be moved down therealong, when the rear side thereof is tilted up in a state where the front side there is located on a green, and to then roll on the green from a discharging end formed at the front end thereof; and a measuring module located on the shaft to measure a moving distance and an isolated angle of the golf ball rolling on the green from the discharging end when the rear side of the shaft is tilted up.

A digital slope meter includes: a shaft extended in a longitudinal direction thereof and having a rolling groove formed on top thereof in the longitudinal direction thereof to allow a golf ball placed thereon to be moved down therealong, when the rear side thereof is tilted up in a state where the front side there is located on a green, and to then roll on the green from a discharging end formed at the front end thereof; and a measuring module located on the shaft to measure a moving distance and an isolated angle of the golf ball rolling on the green from the discharging end when the rear side of the shaft is tilted up.

The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes a first light source configured to irradiate first pattern lights to the object, first image sensors configured to capture first reflected lights generated by reflecting the first pattern lights from the object, a second light source configured to sequentially irradiate second pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the second pattern lights, a second image sensor configured to capture second reflected lights generated by reflecting the second pattern lights from the partial region, and a processor configured to determine the first three-dimensional shape of the object based on the first reflected lights and the second reflected lights.

An overlay metrology system may include an overlay metrology tool suitable for measurement of an overlay target on a sample, the overlay target including one or more grating structures with patterned features distributed along one or more measurement directions. The overlay metrology tool may include an objective lens and an illumination pathway to illuminate the overlay target with two or more oblique illumination lobes distributed among one or more illumination distributions such that, for each of the measurement directions, diffraction orders of the one or more illumination distributions by the overlay target that are collected by the objective lens exclusively include a 0-order diffraction lobe and a single first-order diffraction lobe from at least one of the two or more illumination lobes. The overlay metrology tool may further include at least one detector to image the sample and a controller to generate overlay measurements based on the images.

An overlay metrology system may include an overlay metrology tool suitable for measurement of an overlay target on a sample, the overlay target including one or more grating structures with patterned features distributed along one or more measurement directions. The overlay metrology tool may include an objective lens and an illumination pathway to illuminate the overlay target with two or more oblique illumination lobes distributed among one or more illumination distributions such that, for each of the measurement directions, diffraction orders of the one or more illumination distributions by the overlay target that are collected by the objective lens exclusively include a 0-order diffraction lobe and a single first-order diffraction lobe from at least one of the two or more illumination lobes. The overlay metrology tool may further include at least one detector to image the sample and a controller to generate overlay measurements based on the images.

The invention provides a laser scanner, which comprises a light source unit, a light receiving unit, a distance measuring unit, an angle measuring unit, a telescope unit capable of rotating in a horizontal direction and a vertical direction, a rotation driving unit, a directional angle detector, and a control arithmetic unit, wherein the light source unit is an MOPA type and has an oscillator control circuit, a main oscillator, and an optical amplifier, wherein the oscillator control circuit has a repetition frequency setting component, a pulse peak output setting component, a pulse width setting component and an amplification factor calculating component and oscillates the main oscillator corresponding to a measured distance, and wherein the amplification factor calculating component calculates an amplification factor based on a repetition frequency, a pulse peak output, and a pulse width and amplifies the optical amplifier based on a calculated amplification factor.