Disclosed are an optical gradation system and method. The optical gradation system comprises: a first device configured to emit broad-spectrum linearly polarized light in a first polarization direction; a second device provided with at least one first region for splitting lights of different wavelengths mixed in the broad-spectrum linearly polarized light incident by the first device into emergent lights in different polarization directions without changing a beam propagation path; a third device configured to filter out linearly polarized light in a second polarization direction from the emergent lights from the second device in different polarization directions; and, a rotator configured to drive at least one of the first device, the second device and the third device to rotate, wherein the first device, the second device and the third device are arranged coaxially.

Disclosed are an optical gradation system and method. The optical gradation system comprises: a first device configured to emit broad-spectrum linearly polarized light in a first polarization direction; a second device provided with at least one first region for splitting lights of different wavelengths mixed in the broad-spectrum linearly polarized light incident by the first device into emergent lights in different polarization directions without changing a beam propagation path; a third device configured to filter out linearly polarized light in a second polarization direction from the emergent lights from the second device in different polarization directions; and, a rotator configured to drive at least one of the first device, the second device and the third device to rotate, wherein the first device, the second device and the third device are arranged coaxially.

The present disclosure relates to a measuring system for measuring a light source in a polarization-independent manner, having a camera comprising a plurality of image sensors arranged in the form of a matrix, and a microscope optics, and to a method for measuring the light sources in a polarization-independent manner. The aim is to make it possible to measure the light output of the light source in an improved, simple and largely polarization-independent manner while maintaining the spatial resolution in the microscopic range. To that end, the present disclosure proposes that a linear polarizer is associated with each of the image sensors, wherein the linear polarizers are arranged in the form of a matrix in front of the image sensors and two or more, preferably four, polarizers form a matrix block, wherein the transmission directions of adjacent linear polarizers within a matrix block are rotated relative to one another, preferably by 45° or by 90°. In the method according to the present disclosure, the measurement signals of the image sensors that are associated with the polarizers of the same matrix block are converted into light output measured values in order to obtain the desired polarization independence.

A single-shot Mueller matrix polarimeter (1700), MMP, comprising: a polarization state generator (1706), PSG, arranged to receive a source optical field (1704) and provide a probe field (1708) having a plurality of spatial portions, each portion having a different polarization state; a polarization state analyser (1718), PSA, arranged to receive a modified probe field (1716) resulting from interaction of the probe field generated by the PSG with a sample under investigation, and further arranged to apply, to each of a corresponding plurality of spatial portions of the modified probe field, a plurality of retardances and a plurality of fast axis orientations; and a detector (1720) arranged to detect an output (1722) of the PSA.

A single-shot Mueller matrix polarimeter (1700), MMP, comprising: a polarization state generator (1706), PSG, arranged to receive a source optical field (1704) and provide a probe field (1708) having a plurality of spatial portions, each portion having a different polarization state; a polarization state analyser (1718), PSA, arranged to receive a modified probe field (1716) resulting from interaction of the probe field generated by the PSG with a sample under investigation, and further arranged to apply, to each of a corresponding plurality of spatial portions of the modified probe field, a plurality of retardances and a plurality of fast axis orientations; and a detector (1720) arranged to detect an output (1722) of the PSA.

An ellipsometer includes a first separation unit configured to separate a first reflected light into two reflected lights, a first polarizing optical element configured to separate each of the two reflected lights into two linearly polarized lights, a first interference device configured to form an interference fringe by allowing components of the two linearly polarized lights to interfere with each other, a second separation unit configured to separate a second reflected light into two reflected lights, a second polarizing optical element configured to separate each of the two reflected lights into two linearly polarized lights, and a second interference device configured to form an interference fringe by allowing components of the two linearly polarized lights to interfere with each other.

The invention is directed to an arrangement for detecting the intensity distribution of components of the electromagnetic field in beams of radiation. The object of the invention is met, according to the invention, in that a high-resolution two-dimensional intensity sensor array and a field vector detector array comprising different regions with individual detector structures for two transverse and longitudinal field vector components E.sub.x, E.sub.y, E.sub.z are combined, wherein the detector structures are formed as nanostructures, metallic jacket-shaped tips with different apices, for utilization of localized plasmon resonance (LPR) of the individual detector structures and localized surface plasmons (LSP) excited through LPR for a polarization selection of the field distribution according to field vector components E.sub.x, E.sub.y, E.sub.z and transmission thereof to associated sensor elements by means of surface plasmon polaritons (SPP) and wave guiding (WGM).

Metasurface polarization convertors permit conversion of an input linear polarization to right- or left-handed circular polarization based on the orientation of the input linear polarization, over a broad bandwidth and with high efficiency. The reflected circular polarizations can be used to evaluate samples for circular dichroism. A THz time-domain detection provides a time domain terahertz signal that is Fourier transformed to produce a THz circular dichroism spectrum.

Metasurface polarization convertors permit conversion of an input linear polarization to right- or left-handed circular polarization based on the orientation of the input linear polarization, over a broad bandwidth and with high efficiency. The reflected circular polarizations can be used to evaluate samples for circular dichroism. A THz time-domain detection provides a time domain terahertz signal that is Fourier transformed to produce a THz circular dichroism spectrum.

An optical metrology device uses a multi-wavelength beam of light that has azimuthally varying polarization states and/or phase states, referred to as a vortex beam. The metrology device focuses the vortex beam on a sample under test over a large range of angles of incidence. The metrology device may detect an image of the vortex beam reflected from the sample and measure the polarization state of the return light as function of the angle of incidence and the azimuth angle, which may be further measured at a plurality of different wavelengths. The vortex beam includes azimuthally varying polarization states, thereby enabling measurement of all desired polarization states without requiring the use of moving optical components. The polarization state information detected over multiple angles of incidence and wavelengths provides data with which an accurate determination of one or more characteristics of a sample may be determined.