The present invention relates to an antireflection film being capable of realizing high scratch resistance and antifouling property while simultaneously having low reflectivity and high light transmittance, and further being capable of enhancing screen sharpness of a display device.

The present invention relates to an antireflection film being capable of realizing high scratch resistance and antifouling property while simultaneously having low reflectivity and high light transmittance, and further being capable of enhancing screen sharpness of a display device, and a method for preparing the antireflection film.

The present invention relates to an antireflection film being capable of realizing high scratch resistance and antifouling property while simultaneously having low reflectivity and high light transmittance, and further being capable of enhancing screen sharpness of a display device, and a method for preparing the antireflection film.

Disclosed are an optical gradation system and method. The optical gradation system comprises: a first device configured to emit broad-spectrum linearly polarized light in a first polarization direction; a second device provided with at least one first region for splitting lights of different wavelengths mixed in the broad-spectrum linearly polarized light incident by the first device into emergent lights in different polarization directions without changing a beam propagation path; a third device configured to filter out linearly polarized light in a second polarization direction from the emergent lights from the second device in different polarization directions; and, a rotator configured to drive at least one of the first device, the second device and the third device to rotate, wherein the first device, the second device and the third device are arranged coaxially.

Disclosed are an optical gradation system and method. The optical gradation system comprises: a first device configured to emit broad-spectrum linearly polarized light in a first polarization direction; a second device provided with at least one first region for splitting lights of different wavelengths mixed in the broad-spectrum linearly polarized light incident by the first device into emergent lights in different polarization directions without changing a beam propagation path; a third device configured to filter out linearly polarized light in a second polarization direction from the emergent lights from the second device in different polarization directions; and, a rotator configured to drive at least one of the first device, the second device and the third device to rotate, wherein the first device, the second device and the third device are arranged coaxially.

Certain examples are directed to methods for detection of anomalies in semiconductor thin-film materials, such as strains, defects and the like, that may precipitate defects in semiconductor processing steps and may adversely impact device and system-level functionality, processing, and yields. Certain methods use filtering optics to provide a set of filter-separated light beams respectively associated with different polarization states of polarized light directed towards a semiconductor-related material sample, and providing a set of sample-characterizing response data based on factors such as sets of polarization-state values, different wavelengths associated with the polarization states, and/or light-incidence angles characterizing separation of the different polarization states. Based on these factors, the types and severities of such anomalies may be analyzed and the related defects remedied.

Certain examples are directed to methods for detection of anomalies in semiconductor thin-film materials, such as strains, defects and the like, that may precipitate defects in semiconductor processing steps and may adversely impact device and system-level functionality, processing, and yields. Certain methods use filtering optics to provide a set of filter-separated light beams respectively associated with different polarization states of polarized light directed towards a semiconductor-related material sample, and providing a set of sample-characterizing response data based on factors such as sets of polarization-state values, different wavelengths associated with the polarization states, and/or light-incidence angles characterizing separation of the different polarization states. Based on these factors, the types and severities of such anomalies may be analyzed and the related defects remedied.

A device for determining a polarization state of an electromagnetic wave includes a power splitter that splits an electromagnetic input wave into at least three partial waves; and at least three polarization converters for changing the polarization state of the partial waves. One of the polarization converters is associated with one of the three partial waves. The device includes an output coupler to which the partial waves are supplied after passing through the respective polarization converter and which includes at least three outputs. The output coupler is configured and the polarization converters are arranged and configured such that output waves exiting from the outputs of the output coupler have an intensity that each is dependent on one of the Stokes parameters of the input wave.

The present invention relates to an antireflection film being capable of realizing high scratch resistance and antifouling property while simultaneously having low reflectivity and high light transmittance, and further being capable of enhancing screen sharpness of a display device.

The present invention relates to an antireflection film being capable of realizing high scratch resistance and antifouling property while simultaneously having low reflectivity and high light transmittance, and further being capable of enhancing screen sharpness of a display device.