Patent classifications
G01J4/04
POLARIZATION-FLUCTUATION ESTIMATING DEVICE AND POLARIZATION-FLUCTUATION ESTIMATING METHOD
In order to estimate a polarization fluctuation speed with high accuracy independently of the quality of a received signal, a polarization-fluctuation estimating device according to the present invention includes: a polarization de-multiplexing unit that generates a single-polarization optical signal from an input polarization-multiplexed optical signal; a photoelectric converting unit that converts the generated optical signal into an electrical signal; and an estimation unit that estimates the polarization fluctuation speed of the polarization-multiplexed optical signal in accordance with the electrical signal.
POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
Provided is a polarization measuring device including a stage on which a measurement target is provided, a light source assembly configured to emit incident light, a first polarimeter configured to polarize the incident light, a second polarimeter configured to polarize reflected light reflected from the measurement target that is irradiated by the incident light, a filter assembly configured to remove noise from the reflected light, and a detector configured to receive the reflected light and measure an intensity of the reflected light and a phase of the reflected light.
CHIRAL HETEROSTRUCTURES
The present disclosure relates to a composition that includes a first layer having a first molecule that includes a metal and a halogen, a second layer that includes the first molecule, and a third layer that includes a chiral molecule, where the third layer is positioned between the first layer and the second layer, and the first layer, the second layer, and the third layer form a crystalline structure.
CHIRAL HETEROSTRUCTURES
The present disclosure relates to a composition that includes a first layer having a first molecule that includes a metal and a halogen, a second layer that includes the first molecule, and a third layer that includes a chiral molecule, where the third layer is positioned between the first layer and the second layer, and the first layer, the second layer, and the third layer form a crystalline structure.
Image processing device and image processing method
A polarized image acquisition section 11a acquires a polarized image of a target object having one or more polarization directions. A polarization parameter acquisition section 12-1 calculates the average brightness α of a polarization model on the basis of a non-polarized image subjected to sensitivity correction. Further, the polarization parameter acquisition section 12-1 calculates the amplitude β of the polarization model on the basis of the calculated average brightness α, pre-stored information regarding the zenith angle θ of the normal line of the target object, a refractive index r, and reflectance property information indicative of whether a subject is diffuse reflection or specular reflection. A polarization model detection section 13-1 is able to detect the polarization properties of the target object through the use of an image polarized in one or more polarization directions, by calculating the phase ϕ of the polarization model on the basis of a polarized image of the target object having one or more polarization directions, the average brightness α, and the amplitude β of the polarization model.
APPARATUS AND METHOD FOR ESTIMATING A PHASE RETARDER AND METHOD OF MANUFACTURING THE PHASE RETARDER USING THE SAME
Disclosed herein an apparatus and method for estimating a phase retarder and method of manufacturing the phase retarder using the same. The apparatus includes: a polarization element configured to output an incident light as a linear polarization and to make the linear polarization incident onto a phase retarder to be tested; a polarization image acquisition module equipped with a plurality of polarized pixels receiving an emitting light that is output from the phase retarder, on which the linear polarization is incident, and configured to obtain a polarization image based on the emitting light that is modulated in the polarized pixels; and a processor configured to evaluate quality of the phase retarder based on uniformity of a brightness value between polarized pixels of the polarization image. The polarized pixels modulate the emitting light based on a plurality of transmission angles and detects the modulated emitting light.
LENS DEVICE AND IMAGING APPARATUS
A lens device and an imaging apparatus that can emit illumination light coaxial with a lens optical system are proposed herein. A lens device includes an optical system that includes a first lens and a second lens forming an optical image of a subject; a first optical member that includes a frame that includes a plurality of aperture regions, a plurality of optical filters that include two or more optical filters transmitting lights having at least some wavelength ranges different from each other, and a plurality of polarizing filters that have different polarization directions; and a second optical member that is provided outside the optical system and closer to a subject side than the first optical member and emits illumination light, which is incident from the outside of the optical system, to the subject side via the optical system.
LENS DEVICE, IMAGING APPARATUS, AND IMAGING METHOD
There are provided a lens device, an imaging apparatus, and an imaging method that suppress the occurrence of overexposure by dimming or blocking totally reflected light. The lens device (100) includes: an optical system (100A); a wavelength polarizing filter unit (130) that is disposed at a pupil position of the optical system (100A) or near the pupil position and includes a plurality of aperture regions, a plurality of optical filters that are disposed in the plurality of aperture regions and include two or more optical filters transmitting lights having a part of wavelength ranges different from each other, and a plurality of first polarizing filters that are disposed in the plurality of aperture regions and are at least two first polarizing filters having polarization directions different from each other; and a first circularly polarizing optical element (101) that is provided between a subject and the wavelength polarizing filter unit.
LIGHT SOURCE INTENSITY CONTROL SYSTEMS AND METHODS FOR IMPROVED LIGHT SCATTERING POLARIMETRY MEASUREMENTS
Systems and methods of performing a stress measurement of a chemically strengthened glass using a light-scattering polarimetry system include adjusting the intensity of a light beam from a light source in an illumination system using a rotatable half-wave plate and a first polarizer operably disposed between the light source and a rotating light diffuser that has a rotation time t.sub.R. The first polarizer is aligned with a second polarizer in a downstream optical compensator to have matching polarization directions by rotating the rotatable half-wave plate to a position where the exposure time t.sub.E falls within an exposure range t.sub.R≤t.sub.E. The method also includes performing an exposure using the exposure time t.sub.E to obtain the stress measurement. One or both of the half-wave plate and first polarizer can be tilted to avoid deleterious back-reflected light from entering the light source.
Sensing device
A sensing device includes a sensor, a reflective polarizer disposed on the sensor, a dye-doped polymeric layer disposed on the reflective polarizer, and a patterned liquid crystal polymer layer disposed on the dye-doped polymeric layer.