There is provided a method for measuring the PDL of a DUT as a function of the optical frequency ν within a spectral range, which uses a single wavelength scan over which the input-SOP varies in a continuous manner. The power transmission through the DUT, curve T(ν), is measured during the scan and the PDL is derived from the sideband components of the power transmission curve T(ν) that results from the continuously varying input-SOP. More specifically, the Discrete Fourier Transform (DFT) of the power transmission curve T(ν) is calculated, wherein the DFT shows at least two sidebands. At least two sidebands are extracted and their inverse DFT calculated individually to obtain complex transmissions (ν), =−J . . . J, where J is the number of sidebands on one side. The response vector |m(ν) of the DUT is derived from the complex transmissions (ν) and a matrix determined by the continuous trajectory of the SOP of the input test lightwave; and the PDL of the DUT as a function of ν (PDL curve) is derived therefrom.

A circular polarization filter of a chiral metasurface structure is disclosed including a substrate having a nanograting pattern extending from the substrate, a dielectric layer formed directly on the nanograting pattern, and a plasmonic structure in direct contact with the dielectric layer, where the plasmonic structure may be oriented at a nonzero angle with respect to the nanograting pattern. An integrated polarization filter array is also disclosed including include a linear polarization filter, and a circular polarization filter. Methods of detecting full-stokes polarization using an integrated polarization filter array having both linear and circular polarization filters made from chiral metasurface structures is disclosed. Methods of using a Mueller matrix to evaluate polarization response of any optical device or system is also disclosed.

A circular polarization filter of a chiral metasurface structure is disclosed including a substrate having a nanograting pattern extending from the substrate, a dielectric layer formed directly on the nanograting pattern, and a plasmonic structure in direct contact with the dielectric layer, where the plasmonic structure may be oriented at a nonzero angle with respect to the nanograting pattern. An integrated polarization filter array is also disclosed including include a linear polarization filter, and a circular polarization filter. Methods of detecting full-stokes polarization using an integrated polarization filter array having both linear and circular polarization filters made from chiral metasurface structures is disclosed. Methods of using a Mueller matrix to evaluate polarization response of any optical device or system is also disclosed.

A simulator and test method of polarization transmission in sea fog belong to the technical field of polarization transmission characteristics. The simulator comprises an emitting device, a receiving device, a main box body, an automatic light alignment system, a water fog layer calibration system, a salt fog layer calibration system, and an aerosol layer calibration system. In accordance with the present disclosure, the automatic alignment of polarized light and a relatively stable sea fog environment are simulated in an indoor environment, the accuracy of indoor simulation is improved, the conformity between measured data and a theoretical simulation result is superior to 80%, and a reliable technical support is provided for the sea surface detection.

A simulator and test method of polarization transmission in sea fog belong to the technical field of polarization transmission characteristics. The simulator comprises an emitting device, a receiving device, a main box body, an automatic light alignment system, a water fog layer calibration system, a salt fog layer calibration system, and an aerosol layer calibration system. In accordance with the present disclosure, the automatic alignment of polarized light and a relatively stable sea fog environment are simulated in an indoor environment, the accuracy of indoor simulation is improved, the conformity between measured data and a theoretical simulation result is superior to 80%, and a reliable technical support is provided for the sea surface detection.

This relates to sensor systems, detectors, imagers, and readout integrated circuits (ROICs) configured to selectively detect one or more frequencies or polarizations of light, capable of operating with a wide dynamic range, or any combination thereof. In some examples, the detector can include one or more light absorbers; the patterns and/or properties of a light absorber can be configured based on the desired measurement wavelength range and/or polarization direction. In some examples, the detector can comprise a plurality of at least partially overlapping light absorbers for enhanced dynamic range detection. In some examples, the detector can be capable of electrostatic tuning for one or more flux levels by varying the response time or sensitivity to account for various flux levels. In some examples, the ROIC can be capable of dynamically adjusting at least one of the frame rate integrating capacitance, and power of the illumination source.

This relates to sensor systems, detectors, imagers, and readout integrated circuits (ROICs) configured to selectively detect one or more frequencies or polarizations of light, capable of operating with a wide dynamic range, or any combination thereof. In some examples, the detector can include one or more light absorbers; the patterns and/or properties of a light absorber can be configured based on the desired measurement wavelength range and/or polarization direction. In some examples, the detector can comprise a plurality of at least partially overlapping light absorbers for enhanced dynamic range detection. In some examples, the detector can be capable of electrostatic tuning for one or more flux levels by varying the response time or sensitivity to account for various flux levels. In some examples, the ROIC can be capable of dynamically adjusting at least one of the frame rate integrating capacitance, and power of the illumination source.

Existing Mueller Matrix polarization techniques that rely only on polarization properties are insufficient for accurate characterization of transparent objects. Embodiments of the present disclosure provide a method and system for Mueller Matrix polarimetric characterization of transparent object using optical properties along with the polarization properties to accurately characterize the transparent object. The polarization properties of are derived from a decomposed Mueller matrix element. Additionally, the method derives the optical properties by further subjecting the decomposed Mueller matrix element to Fresnel’s law-based analysis and a reverse Monte Carlo analysis to extract optical properties such as a material refractive index and a material attenuation index. Optical properties vary with changes in the material property caused due to several factors such as manufacturing defect, aberration, inclusion of an impurity such as bubble or dust etc. Thus, considering the optical properties along with the polarization properties enables enhanced, accurate characterization of the transparent object.

Existing Mueller Matrix polarization techniques that rely only on polarization properties are insufficient for accurate characterization of transparent objects. Embodiments of the present disclosure provide a method and system for Mueller Matrix polarimetric characterization of transparent object using optical properties along with the polarization properties to accurately characterize the transparent object. The polarization properties of are derived from a decomposed Mueller matrix element. Additionally, the method derives the optical properties by further subjecting the decomposed Mueller matrix element to Fresnel’s law-based analysis and a reverse Monte Carlo analysis to extract optical properties such as a material refractive index and a material attenuation index. Optical properties vary with changes in the material property caused due to several factors such as manufacturing defect, aberration, inclusion of an impurity such as bubble or dust etc. Thus, considering the optical properties along with the polarization properties enables enhanced, accurate characterization of the transparent object.

System Stage, and Optical Hall Effect (OHE) system method for evaluating such as free charge carrier effective mass, concentration, mobility and free charge carrier type in a sample utilizing a permanent magnet at room temperature.