Patent classifications
G01K11/30
Temperature dependent x-ray fluorescence
A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.
Temperature dependent x-ray fluorescence
A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.
Acoustical lens and ultrasound transducer probe
An acoustical lens (20) for an ultrasound probe (14) is disclosed. The acoustical lens comprises an inner surface (26) for facing an emission surface (46) of an ultrasound transducer (40) and for receiving ultrasound waves from the ultrasound transducer. The acoustical lens further comprises an outer surface (24) for emitting the ultrasound waves received at the inner surface, wherein the inner surface is formed as a convexly curved surface and wherein at least one recess (34) is associated to an edge of the inner surface for capturing mold material.
Predicting temperature response
After the temperature response to a single period of heating (SAR segment) is determined, temperature increases for an arbitrary timecourse of heating is determined based upon a convolution of the temperature response curve for a sequence of different SAR segments.
Predicting temperature response
After the temperature response to a single period of heating (SAR segment) is determined, temperature increases for an arbitrary timecourse of heating is determined based upon a convolution of the temperature response curve for a sequence of different SAR segments.
Temperature determination using radiation diffraction
A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.
Temperature determination using radiation diffraction
A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.
TEMPERATURE MEASUREMENT SENSOR USING MATERIAL WITH A TEMPERATURE DEPENDENT NEUTRON CAPTURE CROSS SECTION
A temperature measurement sensor for use in a nuclear reactor is described and includes a first neutron detector member and a second neutron detector member wherein the first neutron detector member outputs a first current signal and the second neutron detector member outputs a second current signal. An electrical connection between the first and second signals produces a net current that is the difference in current between the first and second signals. The difference is proportional to changes in temperature.
SENSOR ASSEMBLY AND PHYSICAL QUANTITY MEASURING DEVICE
A sensor assembly includes: a sensor module including a cylindrical portion into which a measurement target fluid is introduced and a diaphragm including a first surface in contact with the measurement target fluid and a second surface provided with a detector; a joint provided with a pressure introduction port for introducing the measurement target fluid to the sensor module; a cylindrical base member surrounding the sensor module; an electronic circuit attached to the base member to receive a detection signal outputted by the detector; and a temperature sensor electrically connected with the electronic circuit. The temperature sensor includes a temperature detector for detecting temperature, and a lead wire electrically connecting the temperature detector and the electronic circuit. The base member is provided with a receiver for receiving the temperature detector and the lead wire.
TEMPERATURE DETERMINATION USING RADIATION DIFFRACTION
A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.