Patent classifications
G01L1/12
METHOD AND MATERIAL THAT COMPRISES A COMBINATION OF A RUBBER MATRIX AND A PLURALITY OF MICROWIRES MADE OF FERROMAGNETIC MATERIAL, FOR MEASURING INTERNAL STRESS IN A TIRE
The present invention is related, but is not restricted, to the field of the study or analysis of materials by determining the chemical or physical properties thereof, in particular the field of the investigation or analysis of materials by using electromagnetic waves, specifically providing a method from measuring internal stress in tires, using a ferromagnetic material.
The invention provides a method for measuring internal stress in a tire, characterized in that it comprises: incorporating into the tire a material that is a combination of a rubber matrix and a plurality of microwires made of a ferromagnetic material; irradiating said tire with electromagnetic waves by means of a transmitting antenna; receiving an electromagnetic wave absorption response from said tire by means of a receiving antenna; and determining the internal stress of the tire by means of a processor operatively connected to said receiving antenna, on the basis of the electromagnetic wave absorption response. The invention further provides a material for measuring the internal stress in a tire, characterized in that it is a combination of a rubber matrix and a plurality of microwires made of a ferromagnetic material.
Stress-induced magnetic field signal acquisition method and stress measurement method based thereon
A method for stress-induced magnetic field signal acquisition and stress measurement is disclosed. The method can include the following steps: a1, conducting AC magnetization on a to-be-tested structure by using an AC magnetic field with preset frequencies and strengths, and acquiring the excitation magnetic field signals in at least one cycle; a2, subtracting the excitation magnetic field signals in at least one cycle of a stress-free sample having the same material as the to-be-tested structure from the excitation magnetic field signals acquired in step a1 to obtain a stress-induced magnetic field signals of the to-be-tested structure; a3, quantitatively assessing the stresses in the to-be-tested structure by comparing the mean values of the stress-induced magnetic field signals acquired in step a2 with the pre-calibrated relationship of stresses and the mean values of the stress-induced magnetic field signals for the material of the to-be-tested structure.
Stress-induced magnetic field signal acquisition method and stress measurement method based thereon
A method for stress-induced magnetic field signal acquisition and stress measurement is disclosed. The method can include the following steps: a1, conducting AC magnetization on a to-be-tested structure by using an AC magnetic field with preset frequencies and strengths, and acquiring the excitation magnetic field signals in at least one cycle; a2, subtracting the excitation magnetic field signals in at least one cycle of a stress-free sample having the same material as the to-be-tested structure from the excitation magnetic field signals acquired in step a1 to obtain a stress-induced magnetic field signals of the to-be-tested structure; a3, quantitatively assessing the stresses in the to-be-tested structure by comparing the mean values of the stress-induced magnetic field signals acquired in step a2 with the pre-calibrated relationship of stresses and the mean values of the stress-induced magnetic field signals for the material of the to-be-tested structure.
DEVICE, SYSTEM AND METHOD FOR ACQUIRING FORCE INFORMATION BASED ON BIONIC STRUCTURE
Provided are a device, a system and a method for acquiring a force information based on a bionic structure, including: a force information acquisition layer and a magnetic field signal acquisition chip; wherein a permanent magnet is embedded in the force information acquisition layer; wherein the force information acquisition layer has an elastic structure configured to generate a deformation corresponding to a first force information of a force after being subjected to the force, so that the permanent magnet moves with the deformation to generate a magnetic field signal corresponding to the force information; wherein the magnetic field signal acquisition chip is arranged in parallel with the force information acquisition layer, and is configured to acquire the magnetic field signal and convert the magnetic field signal into an electrical signal.
SURGICAL ROBOTIC SYSTEMS
A surgical robotic system includes a plurality of magneto sensors for measuring a torque, axial force, angle, position, or speed of various driven members in the surgical robotic system.
Stress distribution measurement device and stress distribution measurement method
A stress distribution measurement device includes: a first magnetostrictive sensor and a second magnetostrictive sensor each including an excitation coil that excites AC magnetism in a measurement target using alternating current, and a detection coil to which alternating current is induced due to the AC magnetism flowing in the measurement target; an excitation circuit that applies a first excitation voltage to the excitation coil of the first magnetostrictive sensor and applies a second excitation voltage to the excitation coil of the second magnetostrictive sensor, the second excitation voltage having a phase or a waveform different from the first excitation voltage; and a detection circuit that includes a first detector that performs synchronous detection of current flowing in the detection coil of the first magnetostrictive sensor based on the first excitation voltage and a second detector that performs synchronous detection of current flowing in the detection coil of the second magnetostrictive sensor based on the second excitation voltage.
MEASURING METHOD AND SEMICONDUCTOR STRUCTURE FORMING METHOD
A measuring method is provided. A probe and a first sensor are disposed over a jig including a bar protruding from the jig. The probe is moved until a first surface of the probe is laterally aligned with a second surface of the bar facing the jig. A first distance between the second surface of the bar and the first sensor is obtained by the first sensor. The probe and the first sensor are disposed over a magnetron. Magnetic field intensities at different elevations above the magnetron are measured by the probe. A method for forming a semiconductor structure is also provided.
MEASURING METHOD AND SEMICONDUCTOR STRUCTURE FORMING METHOD
A measuring method is provided. A probe and a first sensor are disposed over a jig including a bar protruding from the jig. The probe is moved until a first surface of the probe is laterally aligned with a second surface of the bar facing the jig. A first distance between the second surface of the bar and the first sensor is obtained by the first sensor. The probe and the first sensor are disposed over a magnetron. Magnetic field intensities at different elevations above the magnetron are measured by the probe. A method for forming a semiconductor structure is also provided.
SENSOR APPARATUS FOR A COMPRESSION GARMENT
A sensor apparatus includes a sensor device (2), for attaching to an outer surface of a compression garment (1), and a controller. The sensor device (2) comprises a first mounting point (70), attached to a first point on the garment (1), and a second mounting point (45), attached to a second point on the garment (1). The sensor device (2) senses displacement between the first (70) and second mounting points (45). The controller processes information representative of the sensed displacement to estimate a pressure exerted by the compression garment (1) on a wearer of the garment (1).
SENSOR APPARATUS FOR A COMPRESSION GARMENT
A sensor apparatus includes a sensor device (2), for attaching to an outer surface of a compression garment (1), and a controller. The sensor device (2) comprises a first mounting point (70), attached to a first point on the garment (1), and a second mounting point (45), attached to a second point on the garment (1). The sensor device (2) senses displacement between the first (70) and second mounting points (45). The controller processes information representative of the sensed displacement to estimate a pressure exerted by the compression garment (1) on a wearer of the garment (1).