A system for determining the reflectance of a reflector of a lamp of a motor vehicle. The system comprises a light source designed to emit a predetermined light beam to illuminate the reflecting surface of the reflector, imaging capturing apparatus that is arranged so as to capture a series of images) containing the illuminated reflecting surface of the reflector, a processing device that is configured so as to digitally remove a first component (LS2) associated with a first photometric quantity of the light source from the images) so as to determine a second component (associated with the first actual photometric quantity of the reflector to determine the reflectance of the reflector based on second component.

A control system to control the quality of at least one reflector body of a lamp of a motor vehicle, comprising a light source, which is designed to emit a first light beam to irradiate the reflecting surface of the reflector body; an image capturing apparatus, which is arranged so as to capture a series of images) containing the irradiated reflecting surface of the reflector body; a processing device, which is configured so as to process the images), in order to determine the actual reflectance of the reflector body, and so as to determine a quality condition of the reflector body to be validated based on the actual reflectance.

An apparatus and a method measure a reflectivity and/or transmittivity of an optical surface. The apparatus includes a pulsed coherent white light source for generating pulsed coherent white light, wherein the apparatus is adapted to irradiate the optical surface with at least a part of the generated pulsed coherent white light.

A method and a device for characterizing the surface shape of an optical element. In the method, in at least one interferogram measurement carried out by an interferometric test arrangement, a test wave reflected at the optical element is caused to be superimposed with a reference wave not reflected at the optical element. In this case, the figure of the optical element is determined on the basis of at least two interferogram measurements using electromagnetic radiation having in each case linear input polarization or in each case circular input polarization, wherein the input polarizations for the two interferogram measurements differ from one another.

An arrangement monitors an optical element. The arrangement includes: a light source configured to emit radiation onto a surface of the optical element; a detector configured to detect the radiation that has been at least partially reflected at the surface of the optical element; and a holder for the optical element, in which the light source and the detector are integrated. The holder has a cooling region through which a cooling liquid is configured to flow, the cooling region being in contact with the optical element. The holder has a reservoir, through which a beam path between the light source and the detector extends. The reservoir is configured to receive the cooling liquid leaking out at the optical element in case of a leakage.

A particle detection device includes: a first light source to emit first irradiation light; a first light-collection member; a second light-collection member facing the first reflection surface; a second light source to emit second irradiation light; and a first light-reception element. When the first light source emits the first irradiation light, the first light-reception element detects, as the first incident light, scattered light generated when a particle existing at a detection position in a target space is irradiated with the first irradiation light. When the second light source emits the second irradiation light, the first light-reception element detects, as the first incident light, a light ray of the second irradiation light that is reflected by the first reflection surface and a light ray of the second irradiation light that is reflected by both the first reflection surface and the second reflection surface.

Disclosed is a device and a method for measuring Fabry-Parot (FP) transmittance curve by using a whispering gallery mode laser source. The device includes: a seed laser, a first polarizer, a second polarizer, a spectroscope, a beam reduction system, a lens, and Polydimethylsiloxane (PDMS) microfluidic chip arranged in sequence.

A method for measuring a surface shape of an optical element, wherein the optical element has a main body with a substrate and a reflective surface, and wherein at least one cooling channel for receiving a coolant is formed in the substrate, comprising: a) recording a cooling channel pressure, b) recording a measurement environment pressure, c) determining a pressure difference based on the cooling channel pressure and the measurement environment pressure, d) comparing the pressure difference with a predetermined target pressure difference, e) monitoring for a deviation between the pressure difference and the target pressure difference, wherein, if a deviation greater than a predetermined limit value is detected, the cooling channel pressure is adapted in such a way that the deviation becomes less than or equal to the predetermined limit value, and f) measuring the surface shape if the deviation is less than or equal to the predetermined limit value.

Disclosed is a device and a method for measuring Fabry-Parot (FP) transmittance curve by using a whispering gallery mode laser source. The device includes: a seed laser, a first polarizer, a second polarizer, a spectroscope, a beam reduction system, a lens, and Polydimethylsiloxane (PDMS) microfluidic chip arranged in sequence.

An analytic tool for supporting alignment of an optical component in preparation for an interferometric test and performance of such a test. Apparatus and methods involve employment of the datum features on the optical component and/or metrology frame supporting such component. The metrology frame may include a secondary set of holograms (provided for use with a conventional system already employing a primary hologram that forms the testing optical wavefront). The conventional primary hologram is preferably substituted with a set of primary holograms (contained in the same, unitary or spatially-complementary housing sets) that perform different but complementary functions and that facilitate the alignment of the metrology frame with or without the tested optical component.