There are provided an optical-fiber connector endface inspection microscope system and a method for inspecting an endface of an optical-fiber connector. The inspection microscope device is releasably connectable to an adapter tip configured to interface with the optical-fiber connector to inspect the endface thereof. The adapter tip is one among a plurality of adapter tip types adapted to inspect respective types of optical-fiber connectors. The optical-fiber connector endface inspection microscope system comprises a tip detection system adapted to recognize the type of the adapter tip among the plurality of adapter tip types; and is configured to analyze inspection images to produce an inspection result for the endface, at least partly based on a fiber type corresponding to the recognized adapter tip and/or other information read by the tip detection system.

An eyeglasses lens evaluation device includes a fixation point setting part to set a fixation point on an evaluation target space and set a line of sight passing position on eyeglasses lenses when a wearer wears the eyeglasses lenses and looks at the fixation point, an apparent position calculating part to calculate an apparent position of each of a plurality of evaluation points set on the evaluation target space in a state where the wearer wears the eyeglasses lenses and fixates the wearer's eyes on the fixation point via the line of sight passing positions, a difference calculating part to calculate, for each of the plurality of evaluation points, a difference between the apparent position and a reference position, and an evaluation index calculating part to calculate an evaluation index by taking statics of the difference for each of the plurality of evaluation points calculated by difference calculating part.

A method of manufacturing a polymer film includes melting a resin, extruding the melted resin through a die to produce a polymer film, shaping the polymer film, cooling the polymer film, capturing an image of a test pattern through the polymer film, calculating a modulation transfer function value from the image, and adjusting a process parameter of the melting, the extruding, the shaping, or the cooling based on the calculated modulation transfer function value.

An apparatus for evaluating focus, including (a) a stage configured to hold a specimen; and (b) an optical train including a radiation source, calibration optic, objective and detector, the optical train forming a first path wherein radiation from the radiation source is directed to the calibration optic and then a first portion of the radiation is directed to the detector, thereby forming a first image on the detector, wherein a second portion of the radiation follows a second path from the calibration optic then through the objective to the specimen, wherein the optical train forms a third path wherein radiation reflected from the specimen is transmitted through the objective, then to the detector, thereby forming a second image on the detector, and wherein the radiation that forms the first image is astigmatic.

Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.

Methods, apparatus, and systems for mitigating pinhole defects in optical devices such as electrochromic windows. One method mitigates a pinhole defect in an electrochromic device by identifying the site of the pinhole defect and obscuring the pinhole to make it less visually discernible. In some cases, the pinhole defect may be the result of mitigating a short-related defect

Disclosed is a spatial property measurement device or color implementation property of a holographic image. According to an aspect of the present embodiment, a spatial property measurement device or color implementation property of a holographic image reproduced by a holographic display device is provided.

Systems and methods for evaluating an optical device include a pattern source that provides a pattern suitable for use in the evaluating the optical device. The optical device images the pattern to provide an image. The optical device has an optical device and an image sensor, with an associated image sensor plane. An image analysis system determines, from the image, a tip and a tilt for a component of the optical device relative to the image sensor plane that maximizes a depth of focus for the optical device.

A method and a device for the reduction of margins of the light image of a headline, and the headline incorporating the device, is provided, having a reflective diaphragm which is adapted to be shifted in a light axis direction within adjustment limits of a longitudinal position. The margins of the light image can be detected by an optical colour-sensitive photometric sensor, and colour characteristics of the light image margins can be evaluated by identifying a current position of the reflective diaphragm. The reflective diaphragm can then be fixed in the longitudinal position corresponding to selected colour characteristics of the light image margins. The reflective diaphragm can also be adapted to be shifted in a direction perpendicular to the light axis direction.

A camera metrology apparatus including a base section, a drive section with independent drive axes, and an actuation platform having a camera mount, with a predetermined camera mount interface for a camera, and a camera stimulation source mount, with a predetermined stimulation source mount interface, and being coupled to one of the drive axes to generate relative motion between each interface effecting metrology measurement of the camera, wherein the actuation platform has a selectable configuration between different predetermined platform configurations, each with different predetermined mounting location characteristics changing a predetermined mounting location of the camera mount interface or stimulation source mount interface and effecting a different predetermined metrology measurement characteristic, and the camera mount and the camera stimulation source mount are arranged to define a repeatable relative position between the camera mount interface and stimulation source mount interface in each platform configuration and effect free selection between each platform configuration.