A space seeker motion test system comprises a rough vacuum chamber including a space seeker holding fixture, a space chamber including a target to be imaged by a space seeker disposed in the space seeker holding fixture, a bellows coupling the space seeker holding fixture to the space chamber, a gate valve providing selective fluidic communication between the space seeker holding fixture and an internal volume of the space chamber through the bellows, a first vacuum pump configured to maintain the rough vacuum chamber at a rough vacuum, and a second vacuum pump configured to maintain the space chamber at high vacuum.

A test instrument is operable to test optical components of a fiber optic network. The test instrument includes a laser having a back-facet monitor. The test instrument measures a performance parameter of an optical component being tested based on optical power of the laser measured by the back-facet monitor. The performance parameter is determined based on optical power measurements that account for drift of the laser.

Methods, systems, and apparatus for a stray-light testing apparatus. In one aspect, the apparatus includes an optical assembly including a spatially extended light source and one or more optical elements arranged to direct light from the spatially extended light source along an optical path, a moveable frame supporting the optical assembly including one or more adjustable alignment features for guiding positioning of the stray-light testing apparatus relative to an onboard camera on a vehicle, and a shrouding mechanism attached to the frame and positioned on the frame such that, when the stray-light testing apparatus is aligned relative to the onboard camera on the vehicle and the optical path of the optical assembly is within the field of view of the onboard camera, ambient light exposure for the onboard camera is below a threshold.

In some implementations, a device may obtain responsivity data for segments of a fiber optic cable. The device may receive, from a sensor device, vibration data associated with the fiber optic cable, the vibration data being produced by a vibration source in or on soil associated with the fiber optic cable. The device may normalize, based on the responsivity data, the vibration data. The device may determine, based on the normalized vibration data, a distance of the vibration source from the fiber optic cable. The device may perform one or more actions based on the distance satisfying a distance threshold.

An MCF according to the disclosure has a structure preventing deterioration in quality of optical transmission signals. The MCF comprises cores, a common cladding, and a coating. Any of the cores has a coating leakage loss of 0.01 dB/km or more at a wavelength within a wavelength range of from 850 nm to 1700 nm. The coating includes a leaked light propagation suppressive coating layer having a first optical property or a second optical property to light with a wavelength within a wavelength range of from 850 nm to 1700 nm or from 1260 nm to 1625 nm. The first optical property is defined by, as an attenuation index of the light, an absorbance per 1 μm thickness being 0.1 dB or more. The second optical property is defined by a product of absorbance per 1 μm thickness and a thickness being 0.1 dB or more.

Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.

An optical power detection system comprises a sensor and a reader. The sensor is configured to detect light in the cladding of an optical fiber. The sensor is positioned both within a ferrule of the optical fiber and proximate the cladding. The sensor is additionally configured to produce an output signal representative of the detected light. The reader is electrically coupled to the sensor and is configured to receive the sensor output signal. The reader is additionally configured to operation on the output signal to produce a corresponding visual and/or audible indication of the optical power in the optical fiber.

A receiving apparatus and method for determining transmission characteristics of an optical waveguide in which the receiving apparatus includes a waveguide interface for receiving a mixed light beam having a plurality of modes from a multi-mode optical waveguide and for receiving a blended shifted light beam from the multimode optical waveguide, wherein the mixed light beam has an associated phase for each mode of the plurality of modes, and wherein the mixed shifted light beam has an associated shifted phase for each mode of the plurality of modes; and one or more processors for determining mode information for the intermixed light beam and shifted mode information for the intermixed shifted light beam using a trained neural network and for determining, for each mode of the plurality of modes, the respective associated phase using the intermixed shifted light beam.

A structure for, and method of, forming a first optoelectronic circuitry that generates an optical signal, a second optoelectronic circuitry that receives an optical signal, and a loopback waveguide that connects the output from the first optoelectronic circuitry to the second optoelectronic circuitry on an interposer substrate are described. The connected circuits, together comprising a photonic integrated circuit, are electrically tested using electrical signals that are provided via probing contact pads on the PIC die. Electrical activation of the optoelectrical sending devices and the subsequent detection and measurement of the optical signals in the receiving devices, in embodiments, provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

A method of testing a photonics die at the wafer level includes providing a sacrificial waveguide and a grating coupler at least partially in a scribe line between dies of a wafer, performing one or more tests on the dies of the wafer via the sacrificial waveguide and grating coupler in the scribe line, and removing the sacrificial waveguide during separation of the dies of the wafer.