Methods and apparatuses for quantitatively measuring strain in an optical fiber. An optical source comprising an optical beam generator and a pulse generator receives instructions from a controller and generates a pulsed optical beam in response to those instructions. The pulsed optical beam is directed into an optical fiber to generate a reflected beam from scattering centers within the optical fiber. A detector records a plurality of frames of data generated by the reflected beam, and the controller tracks an evolution of a speckle pattern carried by the reflected beam from the plurality of frames and calculates a strain induced in a section of the optical fiber from the evolution of the speckle pattern.

A method for determining the refractive index profile of a preform when the RIP is not substantially step-index like. (a) The preform deflection function is measured and transformed into a measured RIP. (b) A RI level and radius are assumed for the preform layer being evaluated and a compensation level RIP is calculated. (c) A theoretical deflection function is generated corresponding to the assumed RI level and radius and the generated data are transformed into a fitting RIP. (d) The fitting RIP is compared to the measured RIP and the comparison is evaluated against a predetermined accuracy level for the preform layer being evaluated. (e) Steps (b) and (c) are repeated iteratively until the predetermined accuracy level has been achieved. Steps (b) through (e) are repeated for each preform layer that needs to be compensated. Finally, a measurement artifact compensated refractive index profile is calculated for the preform.

A method of categorizing single mode optical fibers, the method including determining one or more fiber properties of an optical fiber, the optical fiber being a single mode optical fiber at an operating wavelength of about 1310 nm. The method further including calculating a peak bandwidth wavelength of the optical fiber based on the one or more fiber properties, comparing the calculated peak bandwidth wavelength with a target peak bandwidth wavelength and based on the comparison, determining if the optical fiber meets a target modal bandwidth.

A mode control system and method for controlling an output mode of a broadband radiation source including a photonic crystal fiber (PCF). The mode control system includes at least one detection unit configured to measure one or more parameters of radiation emitted from the broadband radiation source to generate measurement data, and a processing unit configured to evaluate mode purity of the radiation emitted from the broadband radiation source, from the measurement data. Based on the evaluation, the mode control system is configured to generate a control signal for optimization of one or more pump coupling conditions of the broadband radiation source. The one or more pump coupling conditions relate to the coupling of a pump laser beam with respect to a fiber core of the photonic crystal fiber.

An optical device with an optical transmitter circuit and an optical receiver circuit integrated on a substrate has at least one of a first oblique waveguide extending obliquely with respect to an edge of the substrate at or near an incident port for introducing a light emitted from a light source to the optical device, a second oblique waveguide extending obliquely with respect to the edge of the substrate at or near a signal receiving port optically connected to the optical receiver circuit, and a third oblique waveguide extending obliquely with respect to the edge of the substrate at or near a signal transmission port optically connected to the optical transmitter circuit.

Various implementations of fiber optic inspection tools with integrated cleaning mechanisms are disclosed. The fiber optic inspection and cleaning tool includes a housing, a cleaning system and an imaging system. The cleaning system includes a pay-off reel, a take-up reel, a spindle and a cleaning tape that travels off the pay-off reel, around the spindle, and onto the take-up reel. The imaging system includes a camera and a light source. The camera, spindle, and cleaning tape are aligned along a visual axis. The pay-off reel, take-up reel, camera and light source are all located within the housing.

A structure for, and method of, forming a first optoelectronic circuitry that generates an optical signal, a second optoelectronic circuitry that receives an optical signal, and a loopback waveguide that connects the output from the first optoelectronic circuitry to the second optoelectronic circuitry on an interposer substrate are described. The connected circuits, together comprising a photonic integrated circuit, are electrically tested using electrical signals that are provided via probing contact pads on the PIC die. Electrical activation of the optoelectrical sending devices and the subsequent detection and measurement of the optical signals in the receiving devices, in embodiments, provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

A method for determining if a graded-index glass optical multimode fiber has a refractive index profile that will compensate modal dispersion with chromatic dispersion when used in an optical channel having a multimode vertical cavity surface emitting laser has at least two weighting functions. The functions are used to compute the relative mode group delays over two radial offset regions within the core of the optical fiber. The peak group delay of the of the higher-order fiber mode distribution is less than the peak group delay of the lower-order mode distribution.

An optical power detection system comprises a sensor and a reader. The sensor is configured to detect light in the cladding of an optical fiber. The sensor is positioned both within a ferrule of the optical fiber and proximate the cladding. The sensor is additionally configured to produce an output signal representative of the detected light. The reader is electrically coupled to the sensor and is configured to receive the sensor output signal. The reader is additionally configured to operation on the output signal to produce a corresponding visual and/or audible indication of the optical power in the optical fiber.

An optical probe package structure is provided, used in a test environment for testing a plurality of optical chips on a wafer, including: a main body, an optical fiber, an optical fiber positioning area, a mode field conversion waveguide structure, and an optical waveguide. Wherein, the mode field conversion waveguide structure is used to convert the propagation field of the optical signal, and the optical signal transmitted by the mode field conversion waveguide structure enters the optical waveguide. The optical waveguide has an emitting end, and the emitting end is provided with a facet, the facet has a facet angle, and the facet angle makes the optical signal after field conversion mode field conversion to produce total reflection and output along a second direction. The optical signal after total reflection enters the optical chips. Thereby, an optical probe package structure that can test before wafer cutting and polishing is provided.