A system and method for identifying test bars formed during a selective laser sintering build. A part cake is formed during a selective laser sintering build. The part cake comprises parts formed from a powder by selective laser sintering and unsintered powder around the formed parts. The parts include test bars for performing material testing. Each test bar includes a plurality of indentations in a first grip section and a second grip section. The plurality of indentations are arranged in a information providing pattern that is adapted to be readable after the test part is removed from the part cake.

A system and method for identifying test bars formed during a selective laser sintering build. A part cake is formed during a selective laser sintering build. The part cake comprises parts formed from a powder by selective laser sintering and unsintered powder around the formed parts. The parts include test bars for performing material testing. Each test bar includes a plurality of indentations in a first grip section and a second grip section. The plurality of indentations are arranged in a information providing pattern that is adapted to be readable after the test part is removed from the part cake.

The present invention provides a method for evaluating a semiconductor wafer concerning a breaking strength of a notch portion of the semiconductor wafer, comprising: applying a load to a notch portion of the semiconductor wafer to be evaluated toward the center of the wafer such that the notch portion of the semiconductor wafer is broken; and evaluating the breaking strength of the notch portion. The present invention provides a method and an apparatus for evaluating a semiconductor wafer that can evaluate the breaking strength of a notch portion of a semiconductor wafer with higher precision and higher sensitivity.

The present invention provides a method for evaluating a semiconductor wafer concerning a breaking strength of a notch portion of the semiconductor wafer, comprising: applying a load to a notch portion of the semiconductor wafer to be evaluated toward the center of the wafer such that the notch portion of the semiconductor wafer is broken; and evaluating the breaking strength of the notch portion. The present invention provides a method and an apparatus for evaluating a semiconductor wafer that can evaluate the breaking strength of a notch portion of a semiconductor wafer with higher precision and higher sensitivity.

A universal materials testing machine is disclosed. In one embodiment, the machine comprises a plurality of grips holding a circular material specimen sheet; the grips being capable of pulling the material specimen radially outward. Each grip is connected to a force measurement sensor such as a load cell. The grip and the load cell assembly is connected to a linear actuator assembly. The linear actuator assembly comprises a motor connected to an arm that can move along a straight line. The actuator pulls or pushes the load cell and grip assembly. A camera module captures images of the specimen while being stretched or released. A data processing system gathers camera module images along with force measurements from the load cells. An analysis module running on the data processing unit computes stress and strain measurements and fits them to user selectable material model.

A universal materials testing machine is disclosed. In one embodiment, the machine comprises a plurality of grips holding a circular material specimen sheet; the grips being capable of pulling the material specimen radially outward. Each grip is connected to a force measurement sensor such as a load cell. The grip and the load cell assembly is connected to a linear actuator assembly. The linear actuator assembly comprises a motor connected to an arm that can move along a straight line. The actuator pulls or pushes the load cell and grip assembly. A camera module captures images of the specimen while being stretched or released. A data processing system gathers camera module images along with force measurements from the load cells. An analysis module running on the data processing unit computes stress and strain measurements and fits them to user selectable material model.

A portable shear testing device includes a shear force unit that has two elongated jaw members that are positioned adjacent to each other. One of the jaw members can be moved away from the other, stationary jaw member. One of the jaw members is moved by a pivotally mounted lever that laterally moves a load transfer block connected to the jaw member. A digital load cell is positioned between the lever and the load transfer block and a threaded knob is rotated to press against the lever.

A portable shear testing device includes a shear force unit that has two elongated jaw members that are positioned adjacent to each other. One of the jaw members can be moved away from the other, stationary jaw member. One of the jaw members is moved by a pivotally mounted lever that laterally moves a load transfer block connected to the jaw member. A digital load cell is positioned between the lever and the load transfer block and a threaded knob is rotated to press against the lever.

A test device suitable for acceleratory oblique water entry of a wedge has a frame, a water tank placed below the frame, an accelerator installed above the frame, an obliquing device connected to the frame, a wedge connected to the obliuqing device and an observation system. The frame is provided with vertical slide rails and a transverse slide rail. The accelerator mainly includes an air cylinder and an air compressor. The wedge is a flexible wedge or a rigid wedge. The observation system includes a pressure sensor, a strain sensor, a velocity sensor, an acceleration sensor and a particle image velocimetry device. The repeatability of the test process can be ensured by controlling the output pressure of the air cylinder.

A test device suitable for acceleratory oblique water entry of a wedge has a frame, a water tank placed below the frame, an accelerator installed above the frame, an obliquing device connected to the frame, a wedge connected to the obliuqing device and an observation system. The frame is provided with vertical slide rails and a transverse slide rail. The accelerator mainly includes an air cylinder and an air compressor. The wedge is a flexible wedge or a rigid wedge. The observation system includes a pressure sensor, a strain sensor, a velocity sensor, an acceleration sensor and a particle image velocimetry device. The repeatability of the test process can be ensured by controlling the output pressure of the air cylinder.