A controlling system is provided for operating an examination system configured for microscopic examination of a sample. The examination system includes a microscope, an incubation environment conditioning unit connected to the microscope, and a user interface. The examination system provides an incubation mode in which a sample chamber is incubated by supplying an incubation atmosphere generated by the incubation environment conditioning unit. The controlling system is configured to receive a target setpoint of at least one examination parameter upon user input via the user interface, select, based on the received at least one target setpoint, predefined adjustment setpoints for at least one incubation environment parameter of the incubation mode and for at least one microscope parameter, and operate the incubation environment conditioning unit and the microscope based on the selected adjustment setpoints.

One aspect relates to a bioreactor and/or mixing container that includes an outer wall and a spectroscopy cell arranged in and/or on the outer wall. The spectroscopy cell includes a first optical area and a second optical area arranged opposite the first optical area. The first optical area and the second optical area can be set at at least two different distances from one another. A specimen-receiving area is located between the first optical area and the second optical area.

One aspect relates to a bioreactor and/or mixing container that includes an outer wall and a spectroscopy cell arranged in and/or on the outer wall. The spectroscopy cell includes a first optical area and a second optical area arranged opposite the first optical area. The first optical area and the second optical area can be set at at least two different distances from one another. A specimen-receiving area is located between the first optical area and the second optical area.

An inspection system includes a base, an array of fixtures, and a plurality of sensors or light sources. Each fixture has a first portion rotatably secured to the base and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each sensor or light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base.

An inspection system includes a base, an array of fixtures, and a plurality of sensors or light sources. Each fixture has a first portion rotatably secured to the base and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each sensor or light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base.

A rotating seal-type liquid testing apparatus includes a lower cup component, an upper cup body, a top cover and a testing element. The lower cup component includes a lower cup body, a high liquid baffle, a low liquid baffle and a water-absorbing sealing plug. The low liquid baffle and the high liquid baffle divide a bottom of an inner cavity of the lower cup body into a reaction region and a cut-off region. An edge of a bottom surface of the inner cavity of the lower cup body is provided with a vent hole, and the vent hole is positioned in the cut-off region. The upper cup body is disposed in the lower cup body, a bottom surface of an inner cavity of the upper cup body is provided with a liquid outlet, and the liquid outlet is connected to the reaction region in the lower cup body.

Provided are an automatic analyzer and an optical measurement method for correcting a variation in the multiplication factor of a photoelectric element with high accuracy. The automatic analyzer comprises: a photoelectric element which generates electrons by light and outputs a current signal; a voltage application unit which applies a voltage to the photoelectric element; and a processing unit which corrects a variation in the multiplication factor of the photoelectric element, wherein the photoelectric element outputs a pulse signal as the current signal, and the processing unit corrects the variation in the multiplication factor on the basis of the pulse area of the pulse signal.

Provided are an automatic analyzer and an optical measurement method for correcting a variation in the multiplication factor of a photoelectric element with high accuracy. The automatic analyzer comprises: a photoelectric element which generates electrons by light and outputs a current signal; a voltage application unit which applies a voltage to the photoelectric element; and a processing unit which corrects a variation in the multiplication factor of the photoelectric element, wherein the photoelectric element outputs a pulse signal as the current signal, and the processing unit corrects the variation in the multiplication factor on the basis of the pulse area of the pulse signal.

A method and device for detecting pyrethroid pesticide residues in crops. Reaction membrane is arranged on a bottom plate and provided with a check-up line and a quality control line; a first mounting block and a second mounting block are arranged on the bottom plate; a first slide is arranged in the first mounting block, a second slide is arranged in the second mounting block; a sample pad and a bonding pad are arranged in the first slide; a water absorption pad is arranged in the second slide; a liquid inlet provided with a pipe is formed in the first mounting block, a pressing hole provided with a press block is formed in the second mounting block; protrusions are respectively formed on the pipe and the press block; sliding grooves are formed in the liquid inlet and the pressing hole; and first springs are arranged between the protrusions and the sliding grooves.

A detection method based on laser-induced breakdown spectroscopy enhanced by a two-dimensional plasma grating includes: generating a femtosecond laser pulse by a femtosecond laser, and splitting the femtosecond laser pulse into three sub-pulses by a beam splitting unit; focusing the three sub-pulses separately by a focusing unit to allow focused sub-pulses to be overlapped at an intersection in space, wherein before reaching the intersection, the three sub-pulses form two planes; synchronizing the three sub-pulses in a time domain by adjusting optical paths of the three sub-pulses in such a way that they have the same optical length and the three sub-pulses arrive at the intersection in space simultaneously and form the two-dimensional plasma grating; and exciting a sample on a stage based on the two-dimensional plasma grating to generate a plasma cluster, and acquiring a spectrum of the sample.