A sensor includes a radio frequency interrogator, a responsive patch, a radio frequency resonance detector, and a transmission line. The radio frequency interrogator is configured to produce an electromagnetic interrogation pulse having a first frequency. The responsive patch includes a substrate and a resonant layer disposed on a surface of the substrate. The substrate includes a polymer. The resonant layer includes an electrically conductive nanomaterial. The resonant layer is configured to resonate at the first frequency in response to receiving the electromagnetic interrogation pulse. The radio frequency resonance detector is configured to detect a resonating response of the responsive patch. The transmission line couples the responsive patch to the radio frequency resonance detector. The transmission line is configured to transmit the resonating response of the responsive patch to the radio frequency resonance detector.

A sensor includes a radio frequency interrogator, a responsive patch, a radio frequency resonance detector, and a transmission line. The radio frequency interrogator is configured to produce an electromagnetic interrogation pulse having a first frequency. The responsive patch includes a substrate and a resonant layer disposed on a surface of the substrate. The substrate includes a polymer. The resonant layer includes an electrically conductive nanomaterial. The resonant layer is configured to resonate at the first frequency in response to receiving the electromagnetic interrogation pulse. The radio frequency resonance detector is configured to detect a resonating response of the responsive patch. The transmission line couples the responsive patch to the radio frequency resonance detector. The transmission line is configured to transmit the resonating response of the responsive patch to the radio frequency resonance detector.

Methods and systems for multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing system are provided. A radio frequency (RF) signal is pulsed within a processing chamber in accordance with a set of RF pulsing parameters. Sensor data is received from one or more sensors that indicates a multi-level RF pulse waveform detected within the processing chamber based on the RF signal pulsing. One or more peaks are identified in the detected multi-level RF pulse waveform. Each identified peak corresponds to at least one RF signal pulse of the RF signal pulsing within the processing chamber. A determination is made, based on the identified one or more peaks, whether the detected multi-level RF pulse waveform corresponds to the target multi-level RF pulse waveform. An indication of whether the detected multi-level RF pulse waveform corresponds to the target multi-level RF pulse waveform is provided to a client device.

Methods and systems for multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing system are provided. A radio frequency (RF) signal is pulsed within a processing chamber in accordance with a set of RF pulsing parameters. Sensor data is received from one or more sensors that indicates a multi-level RF pulse waveform detected within the processing chamber based on the RF signal pulsing. One or more peaks are identified in the detected multi-level RF pulse waveform. Each identified peak corresponds to at least one RF signal pulse of the RF signal pulsing within the processing chamber. A determination is made, based on the identified one or more peaks, whether the detected multi-level RF pulse waveform corresponds to the target multi-level RF pulse waveform. An indication of whether the detected multi-level RF pulse waveform corresponds to the target multi-level RF pulse waveform is provided to a client device.

A flight imaging system and a method suitable where an unmanned flying object equipped with a visible camera and millimeter-wave radar is used, and a structure imaged by the visible camera and millimeter-wave radar mounted on the unmanned flying object are provided. A drone constituting the flight imaging system is equipped with a visible camera and a millimeter-wave radar. A processor of the drone performs control of the visible camera to capture a visible image of a surface layer of the structure, and control the millimeter-wave radar to transmit a millimeter wave toward the structure and receive a reflected wave of the millimeter wave from the structure, in a case of imaging the structure. During flight of the drone, the altitude of the drone is measured by an altitude meter mounted on the drone, altitude information indicating the measured altitude is acquired, and is used, in flying the drone.

Systems, device and methods are provided for measuring parameters of a medium such as the dielectric properties of a medium including a plurality of layers, using an array of sensors. The array includes at least two transducers and at least one transceiver attached to the at least two transducers, the at least one transceiver being configured to transmit at least one signal toward the medium and receive a plurality of signals affected by the medium; a data acquisition unit and at least one processor unit, configured to: process the affected plurality of signals to yield a plurality of transfer functions wherein each of the plurality of transfer functions including the medium response between two transducers of the at least two transducers as function of frequency or time; process the plurality of transfer functions to yield a plurality of statistical measures, and process the statistical measures to calculate the medium parameters.

Systems, device and methods are provided for measuring parameters of a medium such as the dielectric properties of a medium including a plurality of layers, using an array of sensors. The array includes at least two transducers and at least one transceiver attached to the at least two transducers, the at least one transceiver being configured to transmit at least one signal toward the medium and receive a plurality of signals affected by the medium; a data acquisition unit and at least one processor unit, configured to: process the affected plurality of signals to yield a plurality of transfer functions wherein each of the plurality of transfer functions including the medium response between two transducers of the at least two transducers as function of frequency or time; process the plurality of transfer functions to yield a plurality of statistical measures, and process the statistical measures to calculate the medium parameters.

Provided are a structure inspection method and a structure inspection system capable of efficiently inspecting structure and predicting deterioration with high accuracy. The structure inspection method includes: acquiring information on a location having internal damage within an inspection target region; and imaging the inspection target region with a visible light camera a plurality of times while shifting an imaging location, wherein a location except for the location having the internal damage is imaged with first pixel resolution and the location having internal damage is imaged with second pixel resolution higher than the first pixel resolution. Damage appearing on a surface of the structure is detected on the basis of a visible light image captured by the visible light camera. Information on the location having internal damage within the inspection target region is acquired by capturing an image that visualizes an internal state of the inspection target region.

Provided are a structure inspection method and a structure inspection system capable of efficiently inspecting structure and predicting deterioration with high accuracy. The structure inspection method includes: acquiring information on a location having internal damage within an inspection target region; and imaging the inspection target region with a visible light camera a plurality of times while shifting an imaging location, wherein a location except for the location having the internal damage is imaged with first pixel resolution and the location having internal damage is imaged with second pixel resolution higher than the first pixel resolution. Damage appearing on a surface of the structure is detected on the basis of a visible light image captured by the visible light camera. Information on the location having internal damage within the inspection target region is acquired by capturing an image that visualizes an internal state of the inspection target region.

Systems and methods for tracking the location of a non-destructive inspection (NDI) scanner using images of a target object acquired by the NDI scanner. The system includes a frame, an NDI scanner supported by the frame, a system configured to enable motorized movement of the frame, and a computer system communicatively coupled to receive sensor data from the NDI scanner and track the location of the NDI scanner. The NDI scanner includes a two-dimensional (2-D) array of sensors. Subsurface depth sensor data is repeatedly (recurrently, continually) acquired by and output from the 2-D sensor array while at different locations on a surface of the target object. The resulting 2-D scan image sequence is fed into an image processing and feature point comparison module that is configured to track the location of the scanner relative to the target object using virtual features visible in the acquired scan images.