Provided herein are diffractometer-based global diagnostic systems and uses thereof. The systems may comprise one or more diffraction apparatus operatively coupled to a computer database over a network. The one or more diffraction apparatus may be configured for transfer of data such as pathology lab image data, diffraction pattern data, subject data, or any combination thereof to the computer database over the network. The systems may further comprise one or more computer processors operatively coupled to the one or more diffraction apparatus, which computer processors may be configured to receive the data from the diffraction apparatus, transmit the data to the computer database, and process the data using a data analytics algorithm which may provide a computer-aided diagnostic indicator for the individual subject.

A method includes generating a graphical display based on chemical analysis data. The method also includes receiving input selecting a graphical component of the graphical display. The graphical component corresponds to a chemical or elemental constituent represented in the chemical analysis data. The method also includes receiving a specimen identifier indicating a specimen that was analyzed to generate the chemical analysis data. The method further includes generating a search query based on the specimen identifier and based on a constituent identifier of the chemical or elemental constituent and performing a search based on the search query to identify potential sources of the chemical or elemental constituent.

The present disclosure relates to methodologies, systems and apparatus for generating lithium ion battery materials. Starting materials are combined to form a homogeneous precursor solution including lithium, and a droplet maker is used to generate droplets of the precursor solution having controlled size. These droplets are introduced into a microwave generated plasma, where micron or sub-micron scale lithium-containing particles are formed. These lithium-containing particles are collected and formed into a slurry to form lithium ion battery materials.

A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.

A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.

Apparatus and methods are described for the automated transfer and storage of transmission electron microscope (TEM) and scanning/transmission electron microscope (STEM) lamella samples throughout a semiconductor manufacturing facility using existing automation infrastructure such as a Front Opening Unified Pod (FOUP). Also provided are wafer facsimiles corresponding to outer dimensions of semiconductor, data storage or solar cell wafers, wherein the facsimiles adapted to store, carry and/or provide a testing platform for testing of samples taken from semiconductor, data storage or solar cell wafers.

A measurement chamber (2) of an x-ray spectrometer (1) comprising a goniometer (3) for analyzing x-ray fluorescence radiation from a measuring sample (4) comprises an entrance opening for the entry of x-ray fluorescence radiation into the measurement chamber, a first goniometer arm (5) for holding and adjusting an analyzer crystal (5a), and a second goniometer arm (6) for holding and adjusting an x-ray detector (6a, 6b), wherein the measurement chamber is sealed in a vacuum-tight manner and the entrance opening for the x-ray fluorescence radiation is sealed in a vacuum-tight manner by way of a window (7). The measurement chamber is distinguished in that it contains a bearing block (8) for receiving and holding both goniometer arms in a concentric and rotatable manner, said goniometer arms each being mechanically adjustable by means of a plezo-motor (15, 16), which is securely connected to the bearing block or a drive plate (9′, 9″) of the respective goniometer arm, and in that the measurement chamber contains all mechanical components of the goniometer. This allows the provision of a more compact, lighter and more stable x-ray spectrometer comprising a rotatable goniorneter, which causes as little heat influx, into the overall system as possible. At the same time, the mechanical stability requirements in respect of the measurement chamber are minimized in order to reduce costs and weight.

According to an aspect of the present invention, provided is an information processing apparatus comprising a memory configured to store a program; and a processor configured to execute a program so as to output a parameter result in relation to a thin film by inputting a profile result in relation to an intensity of X-ray from the thin film to a neural network, wherein the neural network is a neural network that is allowed to machine-learn teacher data using profile data in relation to an intensity of X-ray from a thin film as input data and using parameter data in relation to the thin film as output data.

According to an aspect of the present invention, provided is an information processing apparatus comprising a memory configured to store a program; and a processor configured to execute a program so as to output a parameter result in relation to a thin film by inputting a profile result in relation to an intensity of X-ray from the thin film to a neural network, wherein the neural network is a neural network that is allowed to machine-learn teacher data using profile data in relation to an intensity of X-ray from a thin film as input data and using parameter data in relation to the thin film as output data.

An X-ray backscatter imaging system for precise searching for container hazardous cargo, includes: an X-ray generator configured to irradiate X-rays toward a search target container; and a cylinder-type scattering X-ray detection collimator configured to allow only scattering X-rays generated on a specific layer of the search target container among the X-rays irradiated from the X-ray generator to pass through, and X-rays scattering on a specific layer is measured by adjusting angles of collimators based on a layer to be measured, so that a search for hazardous cargo by layer of the container can be performed precisely.