Methods and devices are disclosed for the imaging of a biological sample from all rotational perspectives in three-dimensional space and with multiple imaging modalities. A biological sample is positioned on an imaging stage that is capable of full 360-degree rotation in at least one of two orthogonal axes. Positioned about the stage are imaging modules enabling the recording of a series of images in multiple modalities, including reflected visible light, fluorescence, X-ray, ultrasound, and optical coherence tomography. A computer can use the images to construct three-dimensional models of the sample and to render images of the sample conveying information from one or more imaging channels. The rendered images can be displayed for an operator who can manipulate the images to present additional information or viewing angles of the sample. The image manipulation can be with touch gestures entered using a sterilizable or disposable touch pen.

The presence of chlorine and nitrogen are determined and measured using a non-invasive portable neutron-generating and gamma ray detecting system(s). Portable devices of the present invention can also be used to detect chlorine and/or nitrogen-containing underground objects rapidly and on-site. Devices and systems described herein can be operated remotely and pre-programmed with search patterns, guided by an operator remotely, or programmed to home in on high-chlorine and/or nitrogen concentration areas.

The presence of chlorine and nitrogen are determined and measured using a non-invasive portable neutron-generating and gamma ray detecting system(s). Portable devices of the present invention can also be used to detect chlorine and/or nitrogen-containing underground objects rapidly and on-site. Devices and systems described herein can be operated remotely and pre-programmed with search patterns, guided by an operator remotely, or programmed to home in on high-chlorine and/or nitrogen concentration areas.

An X-ray fluorescence analyzer is provided with: a sample stage on which a sample subjected to an analysis is mounted; an X-ray source configured to irradiate the sample with primary X-rays; a detector configured to detect fluorescent X-rays emitted from the sample irradiated with the primary X-rays; an imaging unit configured to capture an image of a predetermined field-of-view area on the sample stage; a display unit configured to display the field-of-view area of the image captured by the imaging unit; and a pointer irradiation unit configured to irradiate the sample stage with a visible light at an irradiation position within an area that is outside the field-of-view area and near the field-of-view area.

A fluorescent X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit while maintaining a state in which an input element of the input unit is held, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.

Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle ψ.sub.1 to the surface of the sample and measuring a measured intensity I.sub.d(θ.sub.fl) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle ψ.sub.2 corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.

Disclosed is an attachable spacer applied to the front base plate of a hand-held and self-contained XRF testing device that holds the face plate at a forwards tilt towards a test sample, and ensures that only the top rim of the face plate ever touches a test sample. The resulting triangular gap minimizes contact between the front plate window and the test surface, prevents the transfer of heat to the XRF testing device's circuitry, and locks in a fixed distance between the face plate of the XRF testing device and the sample being tested.

A correlative evaluation of a sample (104) using a combined x-ray computed tomography (CT) and x-ray fluorescence (XRF) system and the method for analyzing a sample (104) using x-ray CT and XRF is disclosed. The CT/XRF system (10) includes an x-ray CT subsystem (100) for acquisition of volume information and a confocal XRF subsystem (102) for characterization of elemental composition information. Geometrical calibration is carried out between the XRF subsystem (102) and the X-ray CT subsystem (100) such that a region of interest defined during X-ray CT acquisition can be retrieved by the XRF subsystem (102) for a subsequent XRF acquisition. The system (10) combines the sub-micrometer spatial resolution 3-D imaging capability of x-ray CT with the elemental composition analysis of confocal XRF to provide 3-D elemental composition analysis of a sample (104) with ppm level sensitivity. This is applicable to many scientific research and industrial applications, a prime example of which is the elemental identification of precious metal grains in crushed and ground ores and floatation tailings in the mining industry.

Apparatus includes an X-ray source 10, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detector 14 again for measuring X-ray fluorescence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).