A scanning ferromagnetic resonance (FMR) measurement system is disclosed with a radio frequency (RF) probe and one or two magnetic poles mounted on a holder plate and enable a perpendicular-to-plane or in-plane magnetic field, respectively, at test locations. While the RF probe tip contacts a magnetic film on a whole wafer under test (WUT), a plurality of microwave frequencies (f.sub.R) is sequentially transmitted through the probe tip. Simultaneously, a magnetic field (H.sub.R) is applied to the contacted region thereby causing a FMR condition in the magnetic film for each pair of (H.sub.R, f.sub.R) values. RF output signals are transmitted through or reflected from the magnetic film to a RF diode and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening for a sub-mm area. The WUT is moved to preprogrammed locations to enable multiple FMR measurements at each test location.

A scanning ferromagnetic resonance (FMR) measurement system is disclosed with a radio frequency (RF) probe and one or two magnetic poles mounted on a holder plate and enable a perpendicular-to-plane or in-plane magnetic field, respectively, at test locations. While the RF probe tip contacts a magnetic film on a whole wafer under test (WUT), a plurality of microwave frequencies (f.sub.R) is sequentially transmitted through the probe tip. Simultaneously, a magnetic field (H.sub.R) is applied to the contacted region thereby causing a FMR condition in the magnetic film for each pair of (H.sub.R, f.sub.R) values. RF output signals are transmitted through or reflected from the magnetic film to a RF diode and converted to voltage signals which a controller uses to determine effective anisotropy field, linewidth, damping coefficient, and/or inhomogeneous broadening for a sub-mm area. The WUT is moved to preprogrammed locations to enable multiple FMR measurements at each test location.

A magnetometry apparatus includes an array of magnetometer pixels. Each magnetometer pixel includes an electron spin defect body including a plurality of lattice point defects, and a microwave field transmitter operable to apply a microwave field to the electron spin defect body. The apparatus may also include an optical source configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect bodies from a ground state to an excited state, and a photodetector arranged to receive photoluminescence of a second wavelength emitted from a first electron spin defect body of a first magnetometer pixel of the array of magnetometer pixels. The second wavelength is different from the first wavelength.

A magnetometry apparatus includes an array of magnetometer pixels. Each magnetometer pixel includes an electron spin defect body including a plurality of lattice point defects, and a microwave field transmitter operable to apply a microwave field to the electron spin defect body. The apparatus may also include an optical source configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect bodies from a ground state to an excited state, and a photodetector arranged to receive photoluminescence of a second wavelength emitted from a first electron spin defect body of a first magnetometer pixel of the array of magnetometer pixels. The second wavelength is different from the first wavelength.

In order to improve the measurement sensitivity in measurement using a color center as a sensor, a sensor element (1) has a color center in a diamond crystal structure, wherein the electron spin state of the color center is a dressed state.

In order to improve the measurement sensitivity in measurement using a color center as a sensor, a sensor element (1) has a color center in a diamond crystal structure, wherein the electron spin state of the color center is a dressed state.

An Electron Paramagnetic resonance (EPR) system and method allows the measurement paramagnetic characteristics of materials in real-time, such as heavy oil, hydrocarbons, asphaltenes, heptane, vanadium, resins, drilling fluid, mud, wax deposits or the like. The EPR systems and methods discussed herein are low cost, small and light weight, making them usable in flow-assurance or logging applications. The EPR sensor is capable of measuring paramagnetic properties of materials from a distance of several inches. In some embodiments, a window will be used to separate the EPR sensor from the materials in a pipeline or wellbore. Since the sensor does need to be in direct contact with the materials, it can operate at a lower temperature or pressure. In other embodiments, the EPR sensor may be placed in the materials.

An Electron Paramagnetic resonance (EPR) system and method allows the measurement paramagnetic characteristics of materials in real-time, such as heavy oil, hydrocarbons, asphaltenes, heptane, vanadium, resins, drilling fluid, mud, wax deposits or the like. The EPR systems and methods discussed herein are low cost, small and light weight, making them usable in flow-assurance or logging applications. The EPR sensor is capable of measuring paramagnetic properties of materials from a distance of several inches. In some embodiments, a window will be used to separate the EPR sensor from the materials in a pipeline or wellbore. Since the sensor does need to be in direct contact with the materials, it can operate at a lower temperature or pressure. In other embodiments, the EPR sensor may be placed in the materials.

A magnetometer includes an electron spin defect body including a plurality of lattice point defects. A microwave field transmitter is operable to apply a microwave field to the electron spin defect body. An optical source is configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect body from a ground state to an excited state. A first optical fiber has an input end optically coupled to the optical source and an output end. The output end is attached to a first face of the electron spin defect body and is arranged to direct the input light into the first face of the electron spin defect body. A second optical fiber has an output end and an input end. A photodetector is optically coupled to the output end of the second optical fiber.

A magnetometer includes an electron spin defect body including a plurality of lattice point defects. A microwave field transmitter is operable to apply a microwave field to the electron spin defect body. An optical source is configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect body from a ground state to an excited state. A first optical fiber has an input end optically coupled to the optical source and an output end. The output end is attached to a first face of the electron spin defect body and is arranged to direct the input light into the first face of the electron spin defect body. A second optical fiber has an output end and an input end. A photodetector is optically coupled to the output end of the second optical fiber.