Patent classifications
G01N2201/02
Optical system and assay chip for probing, detecting and analyzing molecules
Apparatus and methods for analyzing single molecule and performing nucleic acid sequencing. An apparatus can include an assay chip that includes multiple pixels with sample wells configured to receive a sample, which, when excited, emits emission energy; at least one element for directing the emission energy in a particular direction; and a light path along which the emission energy travels from the sample well toward a sensor. The apparatus also includes an instrument that interfaces with the assay chip. The instrument includes an excitation light source for exciting the sample in each sample well; a plurality of sensors corresponding the sample wells. Each sensor may detect emission energy from a sample in a respective sample well. The instrument includes at least one optical element that directs the emission energy from each sample well towards a respective sensor of the plurality of sensors.
A CARTRIDGE COMPRISING A CHANNEL FOR A FLUID SAMPLE, AN ASSEMBLY COMPRISING THE CARTRIDGE AND A METHOD OF ALIGNING AN OPTICAL DEVICE WITH THE CHANNEL OF THE CARTRIDGE
According to the present invention there is provided a cartridge (1) comprising a channel (1a) along which a sample fluid can flow; one or more elements (3, 4) which are configured to manipulate light in a predefined manner, and wherein said one or more elements (3, 4) are located in a predefined position relative to the channel (1a). There is further provided an assembly which comprises said cartridge (1) and an optical device (5) which can emit light; and a method of aligning the optical device (5) over the channel (1a) of the cartridge (1) using said one or more elements (3, 4) so that when the optical device (5) emits light it will be incident on any sample fluid provided in the channel (1).
DETECTION DEVICE AND DETECTION METHOD
A detection apparatus and a detection method. The detection apparatus includes: a main body, a detection assembly, and a detection object receiving portion. The detection assembly includes: a signal transmitter, configured to transmit detection signals; a signal receiver, configured to receive at least part of the detection signals transmitted by the signal transmitter; and a detection connection portion, connected to the signal transmitter and the signal receiver and causing the signal transmitter and the signal receiver to be spaced from each other by the detection connection portion. The detection object receiving portion is configured to receive a detection object. The detection object receiving portion and the detection assembly are relatively movably arranged on the main body so as to allow the detection object received by the detection object receiving portion to be located in a transmission path of the detection signals between the signal transmitter and the signal receiver.
OPTICAL INSPECTION DEVICE AND METHOD
The optical inspection device is used for inspecting a planar object surface for the presence of particles and/or defects. A light source supplies light to the planar object surface of the object at a grazing angle. An image sensor receives light due to scattering from particles and defects on the object surface. The optical axis of the objective is at non-zero angles with the normal to the planar object surface and a direction or directions of specular reflection of the light from the light source by the planar object surface. A detection surface of the image detection device and the optical axis of the objective is in a Scheimpflug configuration. The light source and image sensor are located outside a space extending perpendicularly from the planar object surface, on opposite sides of that space. The image sensor comprises an objective and an image detection device. The device may further comprise a microscope or spectrometer to access the object surface through said space.
OBSERVATION DEVICE
An observation device captures images at focal positions inside a sample container with an optical system that includes an objective lens; an objective lens actuator; an irradiation unit; a reflection light intensity detector; a focus controller that positions the focal point of the objective lens on a reflection surface imparting a peak in the reflected light intensity; and a counting unit. The focus control unit drives the objective lens actuator and positions the focal point on a reflection surface when a peak is detected in the reflected light intensity; and the counting unit counts the reflection surface when the focus control unit has positioned the focal point on the reflection surface. The computation unit determines whether or not the focal point is positioned at the focal position, and causes the optical system to capture images if the focal point is positioned at the focal position.
Fast thermo-optical particle characterisation
The present invention relates to a method and an apparatus for a fast thermo-optical characterisation of particles. In particular, the present invention relates to a method and a device to measure the stability of (bio)molecules, the interaction of molecules, in particular biomolecules, with, e.g. further (bio)molecules, particularly modified (bio)molecules, particles, beads, and/or the determination of the length/size (e.g. hydrodynamic radius) of individual (bio)molecules, particles, beads and/or the determination of length/size (e.g. hydrodynamic radius).
System for combined imaging and scatterometry metrology
Metrology targets, design files, and design and production methods thereof are provided. The targets comprise two or more parallel periodic structures at respective layers, wherein a predetermined offset is introduced between the periodic structures, for example, opposite offsets at different parts of a target. Quality metrics are designed to estimate the unintentional overlay from measurements of a same metrology parameter by two or more alternative measurement algorithms. Target parameters are configured to enable both imaging and scatterometry measurements and enhance the metrology measurements by the use of both methods on the same targets. Imaging and scatterometry target parts may share elements or have common element dimensions. Imaging and scatterometry target parts may be combined into a single target area or may be integrated into a hybrid target using a specified geometric arrangement.
DETECTION AND CHARACTERIZATION OF DEFECTS IN PHARMACEUTICAL CYLINDRICAL CONTAINERS
Apparatuses and methods for inspecting a pharmaceutical cylindrical containers are provided. The apparatus includes a support device, a light emitting unit, and a light receiving unit. The support device supports the pharmaceutical cylindrical container and rotates the cylindrical pharmaceutical container around a longitudinal axis. The light emitting unit has a light source that illuminates the pharmaceutical cylindrical container with a detection beam while the support device rotates the pharmaceutical cylindrical container. The light receiving unit has a camera that acquires polarization information of the detection beam.
Inspection system for manufactured components
An inspection system includes a base plate, an array of fixtures, a plurality of light sources, and a drive mechanism. Each fixture has a first portion rotatably secured to the base plate and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base plate. The drive mechanism is configured to rotate the first portions of each fixture about each respective yaw axis and to rotate the second portions of each fixture about each respective pitch axis to adjust yaw and pitch angles of each light source, respectively.
Sensor substrate and method of producing the sensor substrate
The present disclosure provides a sensor substrate that detects an analyte of a low concentration with high sensitivity and high reliability. The sensor substrate according to the present disclosure a first substrate having first microprotrusions provided on the surface thereof and covered by a metal film, an adhesive film disposed on the surface of the first substrate and having a slit, and a second substrate that is transparent, disposed on the adhesive film, and having a first through hole and a second through hole, wherein each of the first through hole and the second through hole is in communication with the slit, and the first microprotrusions overlap the slit in a plan view.