A hybrid inspection system of the present invention is an inspection system including a first inspection device (1) for inspecting a sample (11) based on X-ray measurement data obtained by irradiating the sample (11) with X-rays, and a second inspection device (2) for inspecting the sample (11) by a measuring method using no X-rays. The X-ray measurement data obtained by the first inspection device or an analysis result of the X-ray measurement data is output to the second inspection device (2). In the second inspection device (2), the structure of the sample (11) is analyzed by using the X-ray measurement data input from the first inspection device (1) or the analysis result of the X-ray measurement data.

A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.

An information processing system includes an input unit that receives a structure distribution of a sample and a first phase distribution of an electron beam, X-ray, light or neutron beam transmitted through the sample, a processing unit that computes a second phase distribution based on the structure distribution and computes an electromagnetic field component of the sample based on the first phase distribution and the second phase distribution, and an output unit that outputs the electromagnetic field component.

An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a low-pass filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.

The present disclosure relates to detection systems and methods. One illustrative detection system may include a distributed radiation source having a plurality of radiation source focus points, which irradiate an object under detection, wherein the plurality of radiation source focus points are divided into a certain number of groups, and a primary collimator that limits rays of each of the radiation source focus points such that the rays emit into an XRD detection device. An XRD detection device may include a plurality of XRD detectors that are divided into the same number of groups as the radiation source focus points, wherein XRD detectors in a same group are arranged to be separated by XRD detectors in other groups, and rays of each of the radiation source focus points are received by XRD detectors having the same group number as the group number of the radiation source focus point.

An x-ray spectrometer system includes an x-ray source, an x-ray optical system, a mount, and an x-ray spectrometer. The x-ray optical system is configured to receive, focus, and spectrally filter x-rays from the x-ray source to form an x-ray beam having a spectrum that is attenuated in an energy range above a predetermined energy and having a focus at a predetermined focal plane.

An x-ray inspection device includes an x-ray irradiation unit that irradiates an object for inspection with an x-ray; a sensor that detects an electric signal corresponding to a back-scattered x-ray reflected off the object for inspection; a measurement unit that measures the object for inspection with reference to the electric signal output by the sensor; and a heavy metal plate having a pinhole that allows the back-scattered x-ray to pass therethrough, the pinhole forming an image of the back-scattered x-ray on the sensor.

An analysis apparatus, an analysis method, and an analysis program by which even unskilled ones can perform quantitative analysis of a composition of high-performance cement with high precision. An analysis apparatus 100 for performing quantitative analysis of components of cement, includes: a content percentage conversion unit 120 for converting content percentages of major elements of a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; a scale factor estimation unit 140 for estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained in the conversion; and a Rietveld analysis unit 150 for performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the initial values of scale factors previously been estimated to calculate content percentages of respective phases of the cement sample.

A method and apparatus for estimating a heating value of a biological material. The method includes irradiating of the biological material with X-ray radiation of at least two different energy levels, measuring of an amount of radiation transmitted through the biological material at these energy levels, and measuring fluorescent radiation emitted by the biological material when irradiated at these energy levels. A final estimate of the heating value is then determined based on a preliminary estimate of the heating value of the biological material based on the measured transmitted radiation and a correction value based on the fluorescent radiation.

A system for inspecting an object includes a turntable on which the object may be placed. The turntable rotates the object about a first rotation axis. The system also includes an X-ray source to generate an X-ray beam in a plane to intersect with the object. The system also includes an X-ray detector that can detect at least a portion of the X-ray beam transmitted through the object during rotation and generate image data based on the detected X-ray beam. Also included is a controller that can: generate an image of the object based on the image data; determine, based on a suspect item identified in the image of the object, a second rotation axis at an angle from the first axis; cause a tilt of the turntable so that it is perpendicular to the second axis; and initiate a subsequent rotation of the object about the second axis.