A scanning system for scanning an object, and a corresponding bracket and method are described. The system has a scanning chamber in which the object to be scanned is received. The system also has a displacement assembly which displaces the object along a displacement path passing at least partially through the scanning chamber. The system also includes a source for emitting electromagnetic (EM) radiation or X-rays against the object within the scanning chamber such that at least some of the EM radiation passes through the object. The source is angled relative to the displacement path at an angle in a range between about 5 to about 8 and about 22 to about 30. Finally, the system may also have detectors arranged around the scanning chamber which detect the EM radiation which passes through the object. The system, bracket, and method allow for the production of representative three-dimensional views of the object.

An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to an inspection target surface of the inspection target object, an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X ray generation portion and totally reflected by the inspection target surface, and an adjustment mechanism configured to adjust a relative position between the inspection target surface and the X-ray detector.

A method for calibrating an imaging device comprising a photon counting detector (PCD), the method comprising: providing (i) an X-ray source configured to emit an X-ray beam, (ii) a first detector array configured to be in alignment with the X-ray beam, wherein the first detector array comprises a plurality of energy integrating detectors (EID) for detecting the X-ray beam emitted by the X-ray source, and (iii) a second detector array configured to be in alignment with the X-ray beam, wherein the second detector array comprises a plurality of photo counting detectors (PCD) for detecting the X-ray beam emitted by the X-ray source; detecting an X-ray beam passed through an object to be scanned with the plurality of energy integrating detectors (EID); recording the X-ray beam passed through the object to be scanned and detected by the plurality of energy integrating detectors (EID) as a first data set; detecting an X-ray beam passed through the object to be scanned with the plurality of photo counting detectors (PCD); recording the X-ray beam passed through the object to be scanned and detected by the plurality of photo counting detectors (PCD) as a second data set; generating a mathematical model from the first data set and the second data set so as to derive an attenuation factor; and applying the attenuation factor to the second data set to calibrate the imaging device.

An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques are provided. The x-ray imaging system may include a detector to generate a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector, a plurality of x-ray sources arranged to emit x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector, and a processing unit to receive the signal indicating the intensity of x-rays incident upon the pixel of the detector and generate an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.

An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection target object, and a plurality of X-ray detectors, wherein each of the plurality of X-ray detectors detects X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

The disclosure provides a scanning imaging system for security inspection of an object and an imaging method thereof, the system comprising: a conveying unit configured for bringing the object to move along a conveying direction; a plurality of radiographic sources at one side of the conveying unit, being arranged successively in a direction vertical to a plane, in which the conveying unit is located, and configured for alternately emitting ray beams to form a scanning area; a linear detector array at the other side of the conveying unit, being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; an imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources.

A ray scanning apparatus for a luggage conveying system. The apparatus includes: a conveying device for conveying an object under inspection to pass through a scanning area of the ray scanning apparatus; and a plurality of scanning beam planes disposed on a plurality of scanning planes arranging in a conveying direction of the object under inspection, each scanning beam plane includes a ray source module and a detector assembly which are arranged opposite to each other, and the ray source module includes a plurality of ray source points for emitting ray beams, wherein the ray source modules of the plurality of scanning beam planes are arranged on lower, left, and right sides of the scanning area respectively.

A system for radiographic inspection includes a line source that emits a fan shaped beam of x-rays and a linear x-ray detector that detects the fan shaped beam of x-rays. The system further includes a first movable platform that positions the line source to emit the fan shaped beam of x-rays towards the linear x-ray detector. A second movable platform positions the linear x-ray detector to detect the fan shaped beam of x-rays after transmission through the structure or component being inspected. Synchronized movement of the first movable platform and the second movable platform significantly reduces the time of inspection while the fan shaped beam of x-rays minimizes health risks. The system further includes a first filter that blocks x-rays below a first energy threshold, and a second filter that blocks x-rays below a second energy threshold. The filters provide the system the ability to inspect structures and components formed of multiple types of materials, for example, foreign object debris.

A radiation inspection system includes: a single ray source having a plurality of accelerating tubes, and the plurality of accelerating tubes respectively generate a plurality of rays having different energies, and beam exit directions of the plurality of accelerating tubes comprise at least two different beam exit directions; a plurality of detectors configured to detect a signal when rays emitted by the single ray source act on the inspected object; and a processor in communication connection with the single ray source and configured to respectively control the plurality of accelerating tubes. A radiation inspection method is also provided.

An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.