G01N2223/30

X-RAY COMPUTED TOMOGRAPHY APPARATUS WITH SCANNER FUNCTION
20210030382 · 2021-02-04 ·

An X-ray computed tomography apparatus with a scanner function includes a vertical frame, a patient support arm provided below the vertical frame, a horizontal support arm extending horizontally from a top portion of the vertical frame, a rotary arm drive unit provided at an end of the horizontal support arm, a horizontal rotation arm provided horizontally below the rotary arm drive unit to rotate 360 degrees, a general CT imaging X-ray source provided at one end of the horizontal rotation arm, and an X-ray detector provided at the other end of the horizontal rotation arm to face the general CT imaging X-ray source. A micro CT imaging X-ray source is provided on the vertical frame, a rotary table for seating and rotating an object to be imaged is provided above the patient support arm, and the X-ray detector is composed of a common X-ray detector.

X-ray imaging system

An X-ray imaging system includes: an X-ray Talbot imaging device that has an object table, an X-ray source, a plurality of gratings, and an X-ray detector, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to acquire a moir image necessary for generation of a reconstructed image of the object; and a tester that is installed on the object table, holds the object, and loads a tensile load or a compressive load on the object, wherein the X-ray Talbot imaging device includes a hardware processor that causes a series of imaging to be performed to acquire the moir image, the tester includes: a base part; and a chuck, and an operation of the chuck is automatically controllable by the hardware processor in conjunction with the X-ray Talbot imaging device.

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRYSTALLOGRAPHY

A single-piece hybrid droplet generator and nozzle component for serial crystallography. The single-piece hybrid droplet generator component including an internally-formed droplet-generation channel, an internally-formed sample channel, a nozzle, and a pair of electrode chambers. The droplet-generation channel extends from a first fluid inlet opening to the nozzle. The sample channel extends from a second fluid inlet opening to the droplet-generation channel and joins the droplet-generation channel at a junction. The nozzle is configured to eject a stream of segmented aqueous droplets in a carrier fluid from the droplet-generation channel through a nozzle opening of the single-piece component. The pair of electrode chambers are positioned adjacent to the droplet-generation channel near the junction between the droplet-generation channel and the sample channel. The timing of sample droplets in the stream of fluid ejected through the nozzle is controlled by applying a triggering signal to electrodes positioned in the electrode chambers of the single-piece component.

RADIATION IMAGING APPARATUS WITH IMPROVED IMPACT RESISTANCE

A radiation imaging apparatus includes an internal unit having a radiation detector arranged to convert a radiation that is passed through a subject into electric signals. A base plate is arranged to support the radiation detector. A case having a rectangular parallelepiped shape is arranged to accommodate the internal unit. A fitting member is interposed between an inner wall of the case and an end portion of the internal unit, and fitted to the inner wall of the case and the end portion of the internal unit in a planar view as seen from an incident direction of the radiation.

Composite structure bondline inspection
10801973 · 2020-10-13 · ·

An X-ray inspection system is presented. The X-ray inspection system comprises an X-ray source, an X-ray scintillator, a light detector, a first objective lens, and a second objective lens. The first objective lens is positioned between the X-ray scintillator and the light detector. The second objective lens is positioned between the first objective lens and the light detector.

X-RAY SCANNING SYSTEM AND METHOD

Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate ghosted radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.

SYSTEM AND METHOD FOR CABINET X-RAY SYSTEMS WITH STATIONARY X-RAY SOURCE ARRAY

The present disclosure relates to the field of a cabinet x-ray incorporating a stationary x-ray source array, and an x-ray detector, for the production of organic and non-organic images. Stationary x-ray digital cabinet tomosynthesis systems and related methods are disclosed. According to one aspect, the subject matter described herein can include an x-ray tomosynthesis system having a plurality of stationary field emission x-ray sources configured to irradiate a location for positioning an object to be imaged with x-ray beams to generate projection images of the object. An x-ray detector can be configured to detect the projection images of the object. A projection image reconstruction function can be configured to reconstruct tomography images of the object based on the projection images of the object. In the preferred embodiment, the x-ray source or sources are statically affixed in a range from about 350 to and including about 10.

Advanced X-ray emission spectrometers

Spectroscopy systems require a crystal having specific properties for analyzing a spectrum of a sample, which is typically performed for measuring the presence of one element at a time. A two-dimensional (2D) crystal mount for performing simultaneous spectroscopy measurements includes a crystal holder having multiple rows of crystal mounts. Each crystal mount is positioned and orientated to physically support a crystal at a fixed position and fixed orientation relative to an optical axis. A sample provides radiation to analyzer crystals disposed in the crystal mounts, and a detector may detect radiation reflected from the analyzer crystals, for performing multiple simultaneous spectroscopy measurements.

COMPOSITE STRUCTURE BONDLINE INSPECTION
20200110045 · 2020-04-09 ·

An X-ray inspection system is presented. The X-ray inspection system comprises an X-ray source, an X-ray scintillator, a light detector, a first objective lens, and a second objective lens. The first objective lens is positioned between the X-ray scintillator and the light detector. The second objective lens is positioned between the first objective lens and the light detector.

PROTECTION DEVICE FOR AN AREA DETECTOR
20200096458 · 2020-03-26 · ·

A protection device (100) and a method for protecting an area detector (200) against collision with an object (10). The protection device (100) is designed to be mountable on the area detector (200) and includes a mounting frame (120) configured to be mounted on the area detector (200) to be protected, wherein the mounting frame (120) is designed to at least partially cover a perimeter rim surface of the area detector (200) to be protected; a first sensor unit arranged on the mounting frame (120) and a light curtain (147, 148) configured to detect and signal a potential collision of the object (10) is provided at an inner area of the area detector (200) surrounded by the mounting frame. A second sensor unit is arranged on the mounting frame (120) and included at least one sensor configured to detect and signal a potential collision of the object (10) at a perimeter rim area of the area detector (200). Further provided is an X-ray detector system and X-ray analysis system including the protection device (100).