Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.

A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.

A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.

Apparatus and techniques presented combine the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the phase feedback from second resonant drive frequency operates in FM mode. In particular the first or second frequency may be used to measure the loss tangent, a dimensionless parameter which measures the ratio of energy dissipated to energy stored in a cycle of deformation.

A method for interrogating a surface of a sample bathed in electrolyte solution using SICM, comprising: controlling the potential between first and second electrodes bathed in the electrolyte solution to induce an ion current in the electrolyte solution, a submerged portion of the first electrode being contained within a micropipette and the second electrode being external to the micropipette; recording the ion current whilst controlling the micropipette to move with respect to a stage supporting the sample; and determining, from the ion current and calibration data, the surface height profile of the sample. Said potential can be controlled according to a spread spectrum modulated signal. Said micropipette motion can be according to an AC mode pattern having a modulation frequency greater than a resonant frequency of an assembly of the micropipette, first electrode and a first piezoelectric actuator configured to control z-axis motion of said micropipette.

A method for interrogating a surface of a sample bathed in electrolyte solution using SICM, comprising: controlling the potential between first and second electrodes bathed in the electrolyte solution to induce an ion current in the electrolyte solution, a submerged portion of the first electrode being contained within a micropipette and the second electrode being external to the micropipette; recording the ion current whilst controlling the micropipette to move with respect to a stage supporting the sample; and determining, from the ion current and calibration data, the surface height profile of the sample. Said potential can be controlled according to a spread spectrum modulated signal. Said micropipette motion can be according to an AC mode pattern having a modulation frequency greater than a resonant frequency of an assembly of the micropipette, first electrode and a first piezoelectric actuator configured to control z-axis motion of said micropipette.

The control device (100) controls the deflection amount (D2), which is the pressing amount, to a deflection amount (D1), which is a target value (DT), based on the set value (DS1, DS2) of the pressing amount when pressing the cantilever (12) against the sample (S) when measuring the force curve, and changing the set value (DS1) to the set value (DS2) based on the deflection amount (D3), which is differential data indicating the difference between the deflection amount (D1), which is the target value (DT), and the deflection amount (D), which is the actual pressing amount, in a previously performed force curve measurement when measuring the force curve.

The control device (100) controls the deflection amount (D2), which is the pressing amount, to a deflection amount (D1), which is a target value (DT), based on the set value (DS1, DS2) of the pressing amount when pressing the cantilever (12) against the sample (S) when measuring the force curve, and changing the set value (DS1) to the set value (DS2) based on the deflection amount (D3), which is differential data indicating the difference between the deflection amount (D1), which is the target value (DT), and the deflection amount (D), which is the actual pressing amount, in a previously performed force curve measurement when measuring the force curve.

A system is presented for use in Scanning Probe Microscope (SPM) including: a stage for carrying a sample; a head for mounting thereon an AFM cantilever or an STM probe, and a rotation motor associated with the stage or head to perform controllable rotation of one of them with respect to the other to provide desired orientation alignment between them. Also, a probe is provided for conducting measurements on a sample, comprising: a tip having core with apex covered by a layer arrangement having a support layer of vdW material and an active layer, which is 2D material of not more than 10 monolayers coupled by vdW forces and is placed on the support layer to be further away from the core; and an outer exposed layer. The layer arrangement upon contacting a planar surface forms a contact area with a linear dimension of at least 10 nm.

A system is presented for use in Scanning Probe Microscope (SPM) including: a stage for carrying a sample; a head for mounting thereon an AFM cantilever or an STM probe, and a rotation motor associated with the stage or head to perform controllable rotation of one of them with respect to the other to provide desired orientation alignment between them. Also, a probe is provided for conducting measurements on a sample, comprising: a tip having core with apex covered by a layer arrangement having a support layer of vdW material and an active layer, which is 2D material of not more than 10 monolayers coupled by vdW forces and is placed on the support layer to be further away from the core; and an outer exposed layer. The layer arrangement upon contacting a planar surface forms a contact area with a linear dimension of at least 10 nm.